Srikanth Venkataraman

2008
39	EE	Srikanth Venkataraman, Nagesh Tamarapalli: DFM / DFT / SiliconDebug / Diagnosis. VLSI Design 2008: 5-6
38	EE	King Leong Lee, Nadir Z. Basturkmen, Srikanth Venkataraman: Diagnosis of Scan Clock Failures. VTS 2008: 67-72
2007
37	EE	Srikanth Venkataraman, Ruchir Puri, Steve Griffith, Ankush Oberai, Robert Madge, Greg Yeric, Walter Ng, Yervant Zorian: Making Manufacturing Work For You. DAC 2007: 107-108
36	EE	Srikanth Venkataraman: DFM, DFY, Debug and Diagnosis: The Loop to Ensure Yield. ISQED 2007: 5
35	EE	Srikanth Venkataraman, Nagesh Nagapalli, Lech Józwiak: Quality Driven Manufacturing and SOC Designs. ISQED 2007: 5
34	EE	Vishnu C. Vimjam, Enamul Amyeen, Ruifeng Guo, Srikanth Venkataraman, Michael S. Hsiao, Kai Yang: Using Scan-Dump Values to Improve Functional-Diagnosis Methodology. VTS 2007: 231-238
33	EE	Irith Pomeranz, Sudhakar M. Reddy, Srikanth Venkataraman: z-Diagnosis: A Framework for Diagnostic Fault Simulation and Test Generation Utilizing Subsets of Outputs. IEEE Trans. on CAD of Integrated Circuits and Systems 26(9): 1700-1712 (2007)
2006
32	EE	David Abercrombie, Bernd Koenemann, Nagesh Tamarapalli, Srikanth Venkataraman: DFM, DFT, Silicon Debug and Diagnosis - The Loop to Ensure Product Yield. VLSI Design 2006: 14
31	EE	Bharath Seshadri, Xiaoming Yu, Srikanth Venkataraman: Accelerating Diagnostic Fault Simulation Using Z-diagnosis and Concurrent Equivalence Identification. VTS 2006: 380-385
30	EE	Bharath Seshadri, Irith Pomeranz, Srikanth Venkataraman, Enamul Amyeen, Sudhakar M. Reddy: Dominance Based Analysis for Large Volume Production Fail Diagnosis. VTS 2006: 392-399
29	EE	Ruifeng Guo, Subhasish Mitra, Enamul Amyeen, Jinkyu Lee, Srihari Sivaraj, Srikanth Venkataraman: Evaluation of Test Metrics: Stuck-at, Bridge Coverage Estimate and Gate Exhaustive. VTS 2006: 66-71
28	EE	Yu-Shen Yang, Andreas G. Veneris, Paul J. Thadikaran, Srikanth Venkataraman: Extraction error modeling and automated model debugging in high-performance custom designs. IEEE Trans. VLSI Syst. 14(7): 763-776 (2006)
27	EE	Ruifeng Guo, Srikanth Venkataraman: An algorithmic technique for diagnosis of faulty scan chains. IEEE Trans. on CAD of Integrated Circuits and Systems 25(9): 1861-1868 (2006)
2005
26	EE	Yu-Shen Yang, Andreas G. Veneris, Paul J. Thadikaran, Srikanth Venkataraman: Extraction Error Modeling and Automated Model Debugging in High-Performance Low Power Custom Designs. DATE 2005: 996-1001
25	EE	Irith Pomeranz, Srikanth Venkataraman, Sudhakar M. Reddy: Fault Diagnosis and Fault Model Aliasing. ISVLSI 2005: 206-211
2004
24	EE	Irith Pomeranz, Srikanth Venkataraman, Sudhakar M. Reddy, Bharath Seshadri: Z-Sets and Z-Detections: Circuit Characteristics that Simplify Fault Diagnosis. DATE 2004: 68-75
23	EE	Srikanth Venkataraman: Diagnosis meets Physical Failure Analysis: What is needed to succeed?. ITC 2004: 1442
22	EE	Irith Pomeranz, Srikanth Venkataraman, Sudhakar M. Reddy: Z-DFD: Design-for-Diagnosability Based on the Concept of Z-Detection. ITC 2004: 489-497
21	EE	Enamul Amyeen, Srikanth Venkataraman, Ajay Ojha, Sangbong Lee: Evaluation of the Quality of N-Detect Scan ATPG Patterns on a Processor. ITC 2004: 669-678
20	EE	Irith Pomeranz, Srikanth Venkataraman, Sudhakar M. Reddy, Enamul Amyeen: Defect Diagnosis Based on Pattern-Dependent Stuck-At Faults. VLSI Design 2004: 475-480
19	EE	Srikanth Venkataraman, Srihari Sivaraj, Enamul Amyeen, Sangbong Lee, Ajay Ojha, Ruifeng Guo: An Experimental Study of N-Detect Scan ATPG Patterns on a Processor. VTS 2004: 23-30
18	EE	Debashis Nayak, Srikanth Venkataraman, Paul J. Thadikaran: Razor: A Tool for Post-Silicon Scan ATPG Pattern Debug and Its Application. VTS 2004: 97-102
2003
17	EE	Xiaoming Yu, Enamul Amyeen, Srikanth Venkataraman, Ruifeng Guo, Irith Pomeranz: Concurrent Execution of Diagnostic Fault Simulation and Equivalence Identification During Diagnostic Test Generation. VTS 2003: 351-358
2001
16		Ruifeng Guo, Srikanth Venkataraman: A technique for fault diagnosis of defects in scan chains. ITC 2001: 268-277
15	EE	Ramesh C. Tekumalla, Srikanth Venkataraman, Jayabrata Ghosh-Dastidar: On Diagnosing Path Delay Faults in an At-Speed Environment. VTS 2001: 28-33
14	EE	Ismed Hartanto, Srikanth Venkataraman, W. Kent Fuchs, Elizabeth M. Rudnick, Janak H. Patel, Sreejit Chakravarty: Diagnostic simulation of stuck-at faults in sequential circuits using compact lists. ACM Trans. Design Autom. Electr. Syst. 6(4): 471-489 (2001)
13	EE	Srikanth Venkataraman, Scott Brady Drummonds: Poirot: Applications of a Logic Fault Diagnosis Tool. IEEE Design & Test of Computers 18(1): 19-30 (2001)
2000
12		Srikanth Venkataraman, Scott Brady Drummonds: POIROT: a logic fault diagnosis tool and its applications. ITC 2000: 253-262
11	EE	Srikanth Venkataraman, Scott Brady Drummonds: A Technique for Logic Fault Diagnosis of Interconnect Open Defects. VTS 2000: 313-318
1999
10	EE	Andreas G. Veneris, Ibrahim N. Hajj, Srikanth Venkataraman, W. Kent Fuchs: Multiple Design Error Diagnosis and Correction in Digital VLSI Circuits. VTS 1999: 58-63
1998
9	EE	Srikanth Venkataraman, W. Kent Fuchs, Janak H. Patel: Diagnostic Simulation of Sequential Circuits Using Fault Sampling. VLSI Design 1998: 476-481
1997
8	EE	Srikanth Venkataraman, W. Kent Fuchs: A deductive technique for diagnosis of bridging faults. ICCAD 1997: 562-567
7		Srikanth Venkataraman, W. Kent Fuchs: Diagnosis of Bridging Faults in Sequential Circuits Using Adaptive Simulation, State Storage, and Path-Tracing. ITC 1997: 878-886
6	EE	Srikanth Venkataraman, W. Kent Fuchs: Distributed Diagnostic Simulation of Stuck-At Faults in Sequential Circuits. VLSI Design 1997: 381-387
1996
5	EE	Dong Xiang, Srikanth Venkataraman, W. Kent Fuchs, Janak H. Patel: Partial Scan Design Based on Circuit State Information. DAC 1996: 807-812
4	EE	Srikanth Venkataraman, Ismed Hartanto, W. Kent Fuchs: Dynamic diagnosis of sequential circuits based on stuck-at faults. VTS 1996: 198-203
3	EE	Sreejit Chakravarty, Yiming Gong, Srikanth Venkataraman: Diagnostic simulation of stuck-at faults in combinational circuits. J. Electronic Testing 8(1): 87-97 (1996)
1995
2	EE	Srikanth Venkataraman, Ismed Hartanto, W. Kent Fuchs, Elizabeth M. Rudnick, Sreejit Chakravarty, Janak H. Patel: Rapid Diagnostic Fault Simulation of Stuck-at Faults in Sequential Circuits Using Compact Lists. DAC 1995: 133-138
1		Sybille Hellebrand, Janusz Rajski, Steffen Tarnick, Srikanth Venkataraman, Bernard Courtois: Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers. IEEE Trans. Computers 44(2): 223-233 (1995)

Coauthor Index

1	David Abercrombie	[32]
2	Enamul Amyeen	[17] [19] [20] [21] [29] [30] [34]
3	Nadir Z. Basturkmen	[38]
4	Sreejit Chakravarty	[2] [3] [14]
5	Bernard Courtois	[1]
6	Scott Brady Drummonds	[11] [12] [13]
7	W. Kent Fuchs	[2] [4] [5] [6] [7] [8] [9] [10] [14]
8	Jayabrata Ghosh-Dastidar	[15]
9	Yiming Gong	[3]
10	Steve Griffith	[37]
11	Ruifeng Guo	[16] [17] [19] [27] [29] [34]
12	Ibrahim N. Hajj	[10]
13	Ismed Hartanto	[2] [4] [14]
14	Sybille Hellebrand	[1]
15	Michael S. Hsiao	[34]
16	Lech Józwiak	[35]
17	Bernd Koenemann	[32]
18	Jinkyu Lee	[29]
19	King Leong Lee	[38]
20	Sangbong Lee	[19] [21]
21	Robert Madge	[37]
22	Subhasish Mitra	[29]
23	Nagesh Nagapalli	[35]
24	Debashis Nayak	[18]
25	Walter Ng	[37]
26	Ankush Oberai	[37]
27	Ajay Ojha	[19] [21]
28	Janak H. Patel	[2] [5] [9] [14]
29	Irith Pomeranz	[17] [20] [22] [24] [25] [30] [33]
30	Ruchir Puri	[37]
31	Janusz Rajski	[1]
32	Sudhakar M. Reddy	[20] [22] [24] [25] [30] [33]
33	Elizabeth M. Rudnick	[2] [14]
34	Bharath Seshadri	[24] [30] [31]
35	Srihari Sivaraj	[19] [29]
36	Nagesh Tamarapalli	[32] [39]
37	Steffen Tarnick	[1]
38	Ramesh C. Tekumalla	[15]
39	Paul J. Thadikaran	[18] [26] [28]
40	Andreas G. Veneris	[10] [26] [28]
41	Vishnu C. Vimjam	[34]
42	Dong Xiang	[5]
43	Kai Yang	[34]
44	Yu-Shen Yang	[26] [28]
45	Greg Yeric	[37]
46	Xiaoming Yu	[17] [31]
47	Yervant Zorian	[37]

Colors in the list of coauthors