| 2008 |
|---|
| 37 | EE | Bruce C. Kim:
TTTC Newsletter.
IEEE Design & Test of Computers 25(1): 103 (2008) |
| 36 | EE | Bruce C. Kim,
Craig Force:
Guest Editors' Introduction: The Evolution of RFIC Design and Test.
IEEE Design & Test of Computers 25(1): 6-8 (2008) |
| 35 | EE | Bruce C. Kim:
TTTC Newsletter.
IEEE Design & Test of Computers 25(2): 198-199 (2008) |
| 2007 |
|---|
| 34 | EE | Bruce C. Kim:
TTTC Newsletter.
IEEE Design & Test of Computers 24(1): 97 (2007) |
| 33 | EE | Bruce C. Kim:
Test Technology TC Newsletter.
IEEE Design & Test of Computers 24(2): 197 (2007) |
| 32 | EE | Bruce C. Kim:
TTTC Newsletter.
IEEE Design & Test of Computers 24(3): 292 (2007) |
| 31 | EE | Bruce C. Kim:
TTTC Newsletter.
IEEE Design & Test of Computers 24(4): 407 (2007) |
| 30 | EE | Bruce C. Kim:
TTTC Newsletter.
IEEE Design & Test of Computers 24(5): 511 (2007) |
| 29 | EE | Bruce C. Kim:
TTTC Newsletter.
IEEE Design & Test of Computers 24(6): 605 (2007) |
| 28 | EE | Bruce C. Kim:
Test Technology Newsletter.
J. Electronic Testing 23(1): 9-10 (2007) |
| 2006 |
|---|
| 27 | EE | Yervant Zorian,
Bruce C. Kim:
Session Abstract.
VTS 2006: 334-335 |
| 26 | EE | Bruce C. Kim,
Yervant Zorian:
Guest Editors' Introduction: Big Innovations in Small Packages.
IEEE Design & Test of Computers 23(3): 186-187 (2006) |
| 25 | EE | Bruce C. Kim:
Test Technology Technical Council Newsletter.
IEEE Design & Test of Computers 23(3): 250 (2006) |
| 24 | EE | Bruce C. Kim:
Test Technology TC Newsletter.
IEEE Design & Test of Computers 23(4): 320-323 (2006) |
| 23 | EE | Bruce C. Kim:
Test Technology TC Newsletter.
IEEE Design & Test of Computers 23(5): 425 (2006) |
| 22 | EE | Bruce C. Kim:
TTTC Newsletter.
IEEE Design & Test of Computers 23(6): 507 (2006) |
| 21 | EE | Jee-Youl Ryu,
Bruce C. Kim,
Iboun Taimiya Sylla:
A Novel RF Test Scheme Based on a DFT Method.
J. Electronic Testing 22(3): 229-237 (2006) |
| 2005 |
|---|
| 20 | EE | Rahim Kasim,
Bruce C. Kim,
Josef Drobnik:
Advanced Mems for High Power Integrated Distribution Systems.
ICMENS 2005: 247-254 |
| 19 | EE | Bruce C. Kim:
Test Technology Technical Council Newsletter.
J. Electronic Testing 21(2): 113-114 (2005) |
| 18 | EE | Bruce C. Kim:
Test Technology Technical Council Newsletter.
J. Electronic Testing 21(3): 201 (2005) |
| 17 | EE | Bruce C. Kim:
The Newsletter of Test Technology Council of the IEEE Computer Society.
J. Electronic Testing 21(5): 461-462 (2005) |
| 16 | EE | Jee-Youl Ryu,
Bruce C. Kim:
Low-Cost Testing of 5 GHz Low Noise Amplifiers Using New RF BIST Circuit.
J. Electronic Testing 21(6): 571-581 (2005) |
| 15 | EE | Jee-Youl Ryu,
Bruce C. Kim:
Low-cost test technique using a new RF BIST circuit for 4.5-5.5GHz low noise amplifiers.
Microelectronics Journal 36(8): 770-777 (2005) |
| 2003 |
|---|
| 14 | EE | Kranthi K. Pinjala,
Bruce C. Kim:
An Approach for Selection of Test Points for Analog Fault Diagnosis.
DFT 2003: 287-294 |
| 13 | EE | Kee-Keun Lee,
Bruce C. Kim:
RF MEMS Switch for Wireless LAN Applications.
ICMENS 2003: 100-102 |
| 12 | EE | Kee-Keun Lee,
Bruce C. Kim:
MEMS Spring Probe for Next Generation Wafer Level Testing.
ICMENS 2003: 214-217 |
| 11 | EE | Kee-Keun Lee,
Jiping He,
Amarjit Singh,
Bruce C. Kim:
Benzocyclobutene (BCB) Based Intracortical Neural Implant.
ICMENS 2003: 418-422 |
| 10 | EE | Kranthi K. Pinjala,
Bruce C. Kim,
Pramodchandran N. Variyam:
Automatic Diagnostic Program Generation for Mixed Signal Load Board.
ITC 2003: 403-409 |
| 1999 |
|---|
| 9 | | Bruce C. Kim,
Pinshan Jiang,
Se Hyun Park:
A probe scheduling algorithm for MCM substrates.
ITC 1999: 31-37 |
| 8 | EE | Bruce C. Kim,
Krishna Marella:
A Novel Test Methodology for MEMS Magnetic Micromotors.
VTS 1999: 284-289 |
| 1998 |
|---|
| 7 | EE | Bruce C. Kim,
David C. Keezer,
Abhijit Chatterjee:
A high throughput test methodology for MCM substrates.
ITC 1998: 234- |
| 6 | EE | Rongchang Yan,
Bruce C. Kim:
A Novel Routing Algorithm for MCM Substrate Verification Using Single-Ended Prob.
VTS 1998: 266-273 |
| 1996 |
|---|
| 5 | EE | Abhijit Chatterjee,
Bruce C. Kim,
Naveena Nagi:
Low-cost DC built-in self-test of linear analog circuits using checksums.
VLSI Design 1996: 230-233 |
| 4 | EE | Bruce C. Kim,
Abhijit Chatterjee,
Madhavan Swaminathan:
Low-cost diagnosis of defects in MCM substrate interconnections.
VTS 1996: 260-265 |
| 3 | EE | Abhijit Chatterjee,
Bruce C. Kim,
Naveena Nagi:
DC Built-In Self-Test for Linear Analog Circuits.
IEEE Design & Test of Computers 13(2): 26-33 (1996) |
| 1995 |
|---|
| 2 | | Bruce C. Kim,
Abhijit Chatterjee,
Madhavan Swaminathan,
David E. Schimmel:
A Novel Low-Cost Approach to MCM Interconnect Test.
ITC 1995: 184-192 |
| 1994 |
|---|
| 1 | | Paul J. Bond,
Bruce C. Kim,
Christopher A. Lee,
David E. Schimmel:
A Methodology for Generation and Collection of Multiprocessor Traces.
MASCOTS 1994: 417-418 |
