Vyacheslav N. Yarmolik

2007
17	EE	Maciej Brzozowski, Vyacheslav N. Yarmolik: Obfuscation as Intellectual Rights Protection in VHDL Language. CISIM 2007: 337-340
16		Sergei B. Musin, Alexander A. Ivaniuk, Vyacheslav N. Yarmolik: Multiple Errors Detection Technique for RAM. DDECS 2007: 251-254
2002
15	EE	Sybille Hellebrand, Hans-Joachim Wunderlich, Alexander A. Ivaniuk, Yuri V. Klimets, Vyacheslav N. Yarmolik: Efficient Online and Offline Testing of Embedded DRAMs. IEEE Trans. Computers 51(7): 801-809 (2002)
1999
14	EE	Sybille Hellebrand, Hans-Joachim Wunderlich, Vyacheslav N. Yarmolik: Symmetric Transparent BIST for RAMs. DATE 1999: 702-707
13	EE	Vyacheslav N. Yarmolik, I. V. Bykov, Sybille Hellebrand, Hans-Joachim Wunderlich: Transparent Word-Oriented Memory BIST Based on Symmetric March Algorithms. EDCC 1999: 339-350
12	EE	Sybille Hellebrand, Hans-Joachim Wunderlich, Alexander A. Ivaniuk, Yuri V. Klimets, Vyacheslav N. Yarmolik: Error Detecting Refreshment for Embedded DRAMs. VTS 1999: 384-390
1998
11	EE	Vyacheslav N. Yarmolik, Yuri V. Klimets, Serge N. Demidenko: March PS(23N) Test for DRAM Pattern-Sensitive Faults. Asian Test Symposium 1998: 354-
10	EE	Vyacheslav N. Yarmolik, Sybille Hellebrand, Hans-Joachim Wunderlich: Self-Adjusting Output Data Compression: An Efficient BIST Technique for RAMs. DATE 1998: 173-179
9	EE	Serge N. Demidenko, Vincenzo Piuri, Vyacheslav N. Yarmolik, A. Shmidman: BIST Module for Mixed-Signal Circuits. DFT 1998: 349-
1997
8	EE	A. J. van de Goor, Georgi Gaydadjiev, Vyacheslav N. Yarmolik, V. G. Mikitjuk: March LA: a test for linked memory faults. ED&TC 1997: 627
1996
7	EE	A. J. van de Goor, G. N. Gaydadjiev, V. G. Mikitjuk, Vyacheslav N. Yarmolik: March LR: a test for realistic linked faults. VTS 1996: 272-280
6	EE	Mark G. Karpovsky, Vyacheslav N. Yarmolik: Transparent random access memory testing for pattern sensitive faults. J. Electronic Testing 9(3): 251-266 (1996)
1995
5		O. Kebichi, Michael Nicolaidis, Vyacheslav N. Yarmolik: Exact Aliasing Computation for RAM BIST. ITC 1995: 13-22
1994
4		E. P. Kalosha, Vyacheslav N. Yarmolik, Mark G. Karpovsky: Signature Testability of PLA. FPL 1994: 335-337
3		Vyacheslav N. Yarmolik, Michael Nicolaidis, O. Kebichi: Aliasing-free Signature Analysis for RAM BIST. ITC 1994: 368-377
2		Mark G. Karpovsky, Vyacheslav N. Yarmolik: Transparent Memory Testing for Pattern-Sensitive Faults. ITC 1994: 860-869
1	EE	O. Kebichi, Vyacheslav N. Yarmolik, Michael Nicolaidis: Zero aliasing ROM BIST. J. Electronic Testing 5(4): 377-388 (1994)

Coauthor Index

1	Maciej Brzozowski	[17]
2	I. V. Bykov	[13]
3	Serge N. Demidenko	[9] [11]
4	Georgi Gaydadjiev (G. N. Gaydadjiev)	[7] [8]
5	A. J. van de Goor	[7] [8]
6	Sybille Hellebrand	[10] [12] [13] [14] [15]
7	Alexander A. Ivaniuk	[12] [15] [16]
8	E. P. Kalosha	[4]
9	Mark G. Karpovsky	[2] [4] [6]
10	O. Kebichi	[1] [3] [5]
11	Yuri V. Klimets	[11] [12] [15]
12	V. G. Mikitjuk	[7] [8]
13	Sergei B. Musin	[16]
14	Michael Nicolaidis	[1] [3] [5]
15	Vincenzo Piuri	[9]
16	A. Shmidman	[9]
17	Hans-Joachim Wunderlich	[10] [12] [13] [14] [15]

Colors in the list of coauthors