| |
| 2002 | ||
|---|---|---|
| 5 | EE | Antoni Ferré, Joan Figueras: Leakage power bounds in CMOS digital technologies. IEEE Trans. on CAD of Integrated Circuits and Systems 21(6): 731-738 (2002) |
| 2001 | ||
| 4 | EE | Antoni Ferré, Joan Figueras: LEAP: An Accurate Defect-Free IDDQ Estimator. J. Electronic Testing 17(3-4): 267-274 (2001) |
| 1998 | ||
| 3 | EE | Antoni Ferré, Eugeni Isern, Josep Rius, Rosa Rodríguez-Montañés, Joan Figueras: IDDQ testing: state of the art and future trends. Integration 26(1-2): 167-196 (1998) |
| 1997 | ||
| 2 | Antoni Ferré, Joan Figueras: IDDQ Characterization in Submicron CMOS. ITC 1997: 136-145 | |
| 1996 | ||
| 1 | EE | Antoni Ferré, Joan Figueras: On estimating bounds of the quiescent current for I/sub DDQ/ testin. VTS 1996: 106-111 |
| 1 | Joan Figueras | [1] [2] [3] [4] [5] |
| 2 | Eugeni Isern | [3] |
| 3 | Josep Rius | [3] |
| 4 | Rosa Rodríguez-Montañés | [3] |