2008 |
17 | EE | Stefan Spinner,
Ilia Polian,
Piet Engelke,
Bernd Becker,
Martin Keim,
Wu-Tung Cheng:
Automatic Test Pattern Generation for Interconnect Open Defects.
VTS 2008: 181-186 |
2007 |
16 | EE | Huaxing Tang,
Manish Sharma,
Janusz Rajski,
Martin Keim,
Brady Benware:
Analyzing Volume Diagnosis Results with Statistical Learning for Yield Improvement.
European Test Symposium 2007: 145-150 |
15 | EE | Chris Schuermyer,
Jewel Pangilinan,
Jay Jahangiri,
Martin Keim,
Janusz Rajski,
Brady Benware:
Silicon Evaluation of Static Alternative Fault Models.
VTS 2007: 265-270 |
2004 |
14 | EE | Brady Benware,
Cam Lu,
John Van Slyke,
Prabhu Krishnamurthy,
Robert Madge,
Martin Keim,
Mark Kassab,
Janusz Rajski:
Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model.
ITC 2004: 1285-1294 |
2003 |
13 | | Martin Keim,
Rolf Drechsler,
Bernd Becker,
Michael Martin,
Paul Molitor:
Polynomial Formal Verification of Multipliers.
Formal Methods in System Design 22(1): 39-58 (2003) |
2002 |
12 | EE | Ilia Polian,
Martin Keim,
Nicolai Mallig,
Bernd Becker:
Sequential n -Detection Criteria: Keep It Simple.
IOLTW 2002: 189 |
2001 |
11 | EE | Martin Keim,
Nicole Drechsler,
Rolf Drechsler,
Bernd Becker:
Combining GAs and Symbolic Methods for High Quality Tests of Sequential Circuits.
J. Electronic Testing 17(1): 37-51 (2001) |
1999 |
10 | EE | Martin Keim,
Nicole Drechsler,
Bernd Becker:
Combining GAs and Symbolic Methods for High Quality Tests of Sequential Circuits.
ASP-DAC 1999: 315-318 |
9 | EE | Bernd Becker,
Martin Keim,
Rolf Krieger:
Hybrid Fault Simulation for Synchronous Sequential Circuits.
J. Electronic Testing 15(3): 219-238 (1999) |
1998 |
8 | EE | Martin Keim,
Nicole Drechsler,
Rolf Drechsler,
Bernd Becker:
Test Generation for (Sequential) Multi-Valued Logic Networks based on Genetic Algorithm.
ISMVL 1998: 215- |
1997 |
7 | EE | Rolf Drechsler,
Martin Keim,
Bernd Becker:
Fault Simulation in Sequential Multi-Valued Logic Networks.
ISMVL 1997: 145- |
6 | EE | Rolf Drechsler,
Martin Keim,
Bernd Becker:
Sympathy-MV: Fast Exact Minimization of Fixed Polarity Multi-Valued Linear Expressions.
ISMVL 1997: 66- |
5 | EE | Martin Keim,
Michael Martin,
Bernd Becker,
Rolf Drechsler,
Paul Molitor:
Polynomial Formal Verification of Multipliers.
VTS 1997: 150-157 |
4 | EE | Can Ökmen,
Martin Keim,
Rolf Krieger,
Bernd Becker:
On Optimizing BIST-Architecture by Using OBDD-based Approaches and Genetic Algorithms.
VTS 1997: 426-433 |
1996 |
3 | EE | Martin Keim,
Bernd Becker,
Birgitta Stenner:
On the (non-)resetability of synchronous sequential circuits.
VTS 1996: 240-245 |
1995 |
2 | EE | Rolf Krieger,
Bernd Becker,
Martin Keim:
Symbolic Fault Simulation for Sequential Circuits and the Multiple Observation Time Test Strategy.
DAC 1995: 339-344 |
1994 |
1 | | Rolf Krieger,
Bernd Becker,
Martin Keim:
A Hybrid Fault Simulator for Synchronous Sequential Circuits.
ITC 1994: 614-623 |