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Martin Keim

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2008
17EEStefan Spinner, Ilia Polian, Piet Engelke, Bernd Becker, Martin Keim, Wu-Tung Cheng: Automatic Test Pattern Generation for Interconnect Open Defects. VTS 2008: 181-186
2007
16EEHuaxing Tang, Manish Sharma, Janusz Rajski, Martin Keim, Brady Benware: Analyzing Volume Diagnosis Results with Statistical Learning for Yield Improvement. European Test Symposium 2007: 145-150
15EEChris Schuermyer, Jewel Pangilinan, Jay Jahangiri, Martin Keim, Janusz Rajski, Brady Benware: Silicon Evaluation of Static Alternative Fault Models. VTS 2007: 265-270
2004
14EEBrady Benware, Cam Lu, John Van Slyke, Prabhu Krishnamurthy, Robert Madge, Martin Keim, Mark Kassab, Janusz Rajski: Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model. ITC 2004: 1285-1294
2003
13 Martin Keim, Rolf Drechsler, Bernd Becker, Michael Martin, Paul Molitor: Polynomial Formal Verification of Multipliers. Formal Methods in System Design 22(1): 39-58 (2003)
2002
12EEIlia Polian, Martin Keim, Nicolai Mallig, Bernd Becker: Sequential n -Detection Criteria: Keep It Simple. IOLTW 2002: 189
2001
11EEMartin Keim, Nicole Drechsler, Rolf Drechsler, Bernd Becker: Combining GAs and Symbolic Methods for High Quality Tests of Sequential Circuits. J. Electronic Testing 17(1): 37-51 (2001)
1999
10EEMartin Keim, Nicole Drechsler, Bernd Becker: Combining GAs and Symbolic Methods for High Quality Tests of Sequential Circuits. ASP-DAC 1999: 315-318
9EEBernd Becker, Martin Keim, Rolf Krieger: Hybrid Fault Simulation for Synchronous Sequential Circuits. J. Electronic Testing 15(3): 219-238 (1999)
1998
8EEMartin Keim, Nicole Drechsler, Rolf Drechsler, Bernd Becker: Test Generation for (Sequential) Multi-Valued Logic Networks based on Genetic Algorithm. ISMVL 1998: 215-
1997
7EERolf Drechsler, Martin Keim, Bernd Becker: Fault Simulation in Sequential Multi-Valued Logic Networks. ISMVL 1997: 145-
6EERolf Drechsler, Martin Keim, Bernd Becker: Sympathy-MV: Fast Exact Minimization of Fixed Polarity Multi-Valued Linear Expressions. ISMVL 1997: 66-
5EEMartin Keim, Michael Martin, Bernd Becker, Rolf Drechsler, Paul Molitor: Polynomial Formal Verification of Multipliers. VTS 1997: 150-157
4EECan Ökmen, Martin Keim, Rolf Krieger, Bernd Becker: On Optimizing BIST-Architecture by Using OBDD-based Approaches and Genetic Algorithms. VTS 1997: 426-433
1996
3EEMartin Keim, Bernd Becker, Birgitta Stenner: On the (non-)resetability of synchronous sequential circuits. VTS 1996: 240-245
1995
2EERolf Krieger, Bernd Becker, Martin Keim: Symbolic Fault Simulation for Sequential Circuits and the Multiple Observation Time Test Strategy. DAC 1995: 339-344
1994
1 Rolf Krieger, Bernd Becker, Martin Keim: A Hybrid Fault Simulator for Synchronous Sequential Circuits. ITC 1994: 614-623

Coauthor Index

1Bernd Becker [1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [17]
2Brady Benware [14] [15] [16]
3Wu-Tung Cheng [17]
4Nicole Drechsler [8] [10] [11]
5Rolf Drechsler [5] [6] [7] [8] [11] [13]
6Piet Engelke [17]
7Jay Jahangiri [15]
8Mark Kassab [14]
9Rolf Krieger [1] [2] [4] [9]
10Prabhu Krishnamurthy [14]
11Cam Lu [14]
12Robert Madge [14]
13Nicolai Mallig [12]
14Michael Martin [5] [13]
15Paul Molitor [5] [13]
16Can Ökmen [4]
17Jewel Pangilinan [15]
18Ilia Polian [12] [17]
19Janusz Rajski [14] [15] [16]
20Chris Schuermyer [15]
21Manish Sharma [16]
22John Van Slyke [14]
23Stefan Spinner [17]
24Birgitta Stenner [3]
25Huaxing Tang [16]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)