| 2004 |
|---|
| 13 | | Robert C. Aitken,
Fidel Muradali:
From Working Design Flow to Working Chips: Dependencies and Impacts of Methodology Decisions.
DATE 2004: 2 |
| 12 | | Carol Stolicny,
Mustapha Slamani,
Fidel Muradali,
Geir Eide,
Mike Li:
ITC 2003 panels: Part 2.
IEEE Design & Test of Computers 21(3): 175-176 (2004) |
| 2003 |
|---|
| 11 | EE | Fidel Muradali:
Future ATE: Perspectives & Requirements.
ITC 2003: 1297 |
| 10 | EE | Fidel Muradali:
Diagnosis in Modern Design - Just the Tip of the Iceberg.
ITC 2003: 1302 |
| 2002 |
|---|
| 9 | EE | Fidel Muradali:
The Impact of Outsourcing on Test.
ITC 2002: 1216 |
| 8 | EE | Adam Osseiran,
William De Wilkins,
Barry Baril,
Sassan Tabatabaei,
Fidel Muradali,
Ken Posse,
Lee Song:
Analog and Mixed Signal BIST: Too Much, Too Little, Too Late?
VTS 2002: 175-176 |
| 7 | EE | Fidel Muradali,
Mike Ricchetti,
Bart Vermeulen,
Bulent I. Dervisoglu,
Bob Gottlieb,
Bernd Koenemann,
C. J. Clark:
Reducing Time to Volume and Time to Market: Is Silicon Debug and Diagnosis the Answer?
VTS 2002: 445-446 |
| 2001 |
|---|
| 6 | | Chintan Patel,
Fidel Muradali,
James F. Plusquellic:
Power supply transient signal integration circuit.
ITC 2001: 704-712 |
| 2000 |
|---|
| 5 | EE | Fidel Muradali,
André Ivanov:
Do I Need this Tool for My Chips to Work?
VTS 2000: 471-472 |
| 1999 |
|---|
| 4 | | Robert C. Aitken,
Fidel Muradali:
Trends in SLI design and their effect on test.
ITC 1999: 628-637 |
| 3 | | Amy Germida,
Zheng Yan,
James F. Plusquellic,
Fidel Muradali:
Defect detection using power supply transient signal analysis.
ITC 1999: 67-76 |
| 1996 |
|---|
| 2 | EE | Fidel Muradali,
Janusz Rajski:
A self-driven test structure for pseudorandom testing of non-scan sequential circuits.
VTS 1996: 17-25 |
| 1995 |
|---|
| 1 | EE | Fidel Muradali,
Takao Nishida,
Tsuguo Shimizu:
A structure and technique for pseudorandom-based testing of sequential circuits.
J. Electronic Testing 6(1): 107-115 (1995) |
