dblp.uni-trier.dewww.uni-trier.de

Karim Arabi

List of publications from the DBLP Bibliography Server - FAQ
Coauthor Index - Ask others: ACM DL/Guide - CiteSeer - CSB - Google - MSN - Yahoo

2008
27EEXiongfei Meng, Resve A. Saleh, Karim Arabi: Layout of Decoupling Capacitors in IP Blocks for 90-nm CMOS. IEEE Trans. VLSI Syst. 16(11): 1581-1588 (2008)
2007
26EEXiongfei Meng, Karim Arabi, Resve Saleh: A Novel Active Decoupling Capacitor Design in 90nm CMOS. ISCAS 2007: 657-660
25EEKarim Arabi, Resve A. Saleh, Xiongfei Meng: Power Supply Noise in SoCs: Metrics, Management, and Measurement. IEEE Design & Test of Computers 24(3): 236-244 (2007)
2006
24EEXiongfei Meng, Resve A. Saleh, Karim Arabi: Novel Decoupling Capacitor Designs for sub- 90nm CMOS Technology. ISQED 2006: 266-271
2004
23 Mohammad H. Tehranipour, Mehrdad Nourani, Karim Arabi, Ali Afzali-Kusha: Mixed RL-Huffman encoding for power reduction and data compression in scan test. ISCAS (2) 2004: 681-684
2003
22EEBozena Kaminska, Karim Arabi: Mixed Signal DFT: A Concise Overview. ICCAD 2003: 672-680
21EEFrancisco DaSilva, Yervant Zorian, Lee Whetsel, Karim Arabi, Rohit Kapur: Overview of the IEEE P1500 Standard. ITC 2003: 988-997
2002
20EEKarim Arabi: Mixed-Signal BIST: Fact or Fiction. ITC 2002: 1202
19EEKarim Arabi, Klaus-Dieter Hilliges, David C. Keezer, Sassan Tabatabaei: Multi-GigaHertz Testing Challenges and Solutions. VTS 2002: 265-268
18EEKarim Arabi: Logic BIST and Scan Test Techniques for Multiple Identical Blocks. VTS 2002: 60-68
2001
17EEMustapha Slamani, Karim Arabi: Reducing Test Time in the High-Volume Production of Analog Circuits using Efficient Test-Vector Generation and Interpolation Techniques. J. Electronic Testing 17(5): 417-425 (2001)
1998
16EEKarim Arabi, Hassan Ihs, Christian Dufaza, Bozena Kaminska: Digital oscillation-test method for delay and stuck-at fault testing of digital circuits. ITC 1998: 91-100
15EEKarim Arabi, Bozena Kaminska, Mohamad Sawan: On chip testing data converters using static parameters. IEEE Trans. VLSI Syst. 6(3): 409-419 (1998)
14EEKarim Arabi, Bozena Kaminska: Integrated Temperature Sensors for On-Line Thermal Monitoring of Microelectronic Structures. J. Electronic Testing 12(1-2): 93-99 (1998)
1997
13EEKarim Arabi, Bozena Kaminska: Efficient and accurate testing of analog-to-digital converters using oscillation-test method. ED&TC 1997: 348-352
12 Karim Arabi, Bozena Kaminska: Built-In Temperature Sensors for On-line Thermal Monitoring of Microelectronic Structures. ICCD 1997: 462-467
11 Bozena Kaminska, Karim Arabi, I. Bell, José L. Huertas, B. Kim, Adoración Rueda, Mani Soma, Prashant Goteti: Analog and Mixed-Signal Benchmark Circuits-First Release. ITC 1997: 183-190
10 Karim Arabi, Bozena Kaminska: Design and Realization of an Accurate Built-In Current Sensor for On-Line Power Dissipation Measurement and IDDQ Testing. ITC 1997: 578-586
9 Karim Arabi, Bozena Kaminska: Oscillation Built-In Self Test (OBIST) Scheme for Functional and Structural Testing of Analog and Mixed-Signal Integrated Circuits. ITC 1997: 786-795
8EEKarim Arabi, Bozena Kaminska: Parametric and Catastrophic Fault Coverage of Analog Circuits in Oscillation-Test Methodology. VTS 1997: 166-171
7EEKarim Arabi, Bozena Kaminska: Testing analog and mixed-signal integrated circuits using oscillation-test method. IEEE Trans. on CAD of Integrated Circuits and Systems 16(7): 745-753 (1997)
1996
6EEKarim Arabi, Bozena Kaminska, Stephen K. Sunter: Design for testability of integrated operational amplifiers using oscillation-test strategy. ICCD 1996: 40-45
5EEKarim Arabi, Bozena Kaminska: Oscillation-test strategy for analog and mixed-signal integrated circuits. VTS 1996: 476-482
4EEMehdi Ehsanian, Bozena Kaminska, Karim Arabi: A new digital test approach for analog-to-digital converter testing. VTS 1996: 60-65
3EEKarim Arabi, Bozena Kaminska, Janusz Rzeszut: BIST for D/A and A/D Converters. IEEE Design & Test of Computers 13(4): 40-49 (1996)
1995
2 Jieyan Zhu, Mohamad Sawan, Karim Arabi: An Offset Compensated CMOS Current-Feedback Operational-Amplifier. ISCAS 1995: 1552-1555
1994
1EEKarim Arabi, Bozena Kaminska, Janusz Rzeszut: A new built-in self-test approach for digital-to-analog and analog-to-digital converters. ICCAD 1994: 491-494

Coauthor Index

1Ali Afzali-Kusha [23]
2I. Bell [11]
3Francisco DaSilva [21]
4Christian Dufaza [16]
5Mehdi Ehsanian [4]
6Prashant Goteti [11]
7Klaus-Dieter Hilliges [19]
8José Luis Huertas (José L. Huertas) [11]
9Hassan Ihs [16]
10Bozena Kaminska [1] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15] [16] [22]
11Rohit Kapur [21]
12David C. Keezer [19]
13B. Kim [11]
14Xiongfei Meng [24] [25] [26] [27]
15Mehrdad Nourani [23]
16Adoración Rueda [11]
17Janusz Rzeszut [1] [3]
18Resve A. Saleh (Resve Saleh, Res Saleh) [24] [25] [26] [27]
19Mohamad Sawan [2] [15]
20Mustapha Slamani [17]
21Mani Soma [11]
22Stephen K. Sunter [6]
23Sassan Tabatabaei [19]
24Mohammad H. Tehranipour [23]
25Lee Whetsel [21]
26Jieyan Zhu [2]
27Yervant Zorian [21]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)