2008 |
27 | EE | Xiongfei Meng,
Resve A. Saleh,
Karim Arabi:
Layout of Decoupling Capacitors in IP Blocks for 90-nm CMOS.
IEEE Trans. VLSI Syst. 16(11): 1581-1588 (2008) |
2007 |
26 | EE | Xiongfei Meng,
Karim Arabi,
Resve Saleh:
A Novel Active Decoupling Capacitor Design in 90nm CMOS.
ISCAS 2007: 657-660 |
25 | EE | Karim Arabi,
Resve A. Saleh,
Xiongfei Meng:
Power Supply Noise in SoCs: Metrics, Management, and Measurement.
IEEE Design & Test of Computers 24(3): 236-244 (2007) |
2006 |
24 | EE | Xiongfei Meng,
Resve A. Saleh,
Karim Arabi:
Novel Decoupling Capacitor Designs for sub- 90nm CMOS Technology.
ISQED 2006: 266-271 |
2004 |
23 | | Mohammad H. Tehranipour,
Mehrdad Nourani,
Karim Arabi,
Ali Afzali-Kusha:
Mixed RL-Huffman encoding for power reduction and data compression in scan test.
ISCAS (2) 2004: 681-684 |
2003 |
22 | EE | Bozena Kaminska,
Karim Arabi:
Mixed Signal DFT: A Concise Overview.
ICCAD 2003: 672-680 |
21 | EE | Francisco DaSilva,
Yervant Zorian,
Lee Whetsel,
Karim Arabi,
Rohit Kapur:
Overview of the IEEE P1500 Standard.
ITC 2003: 988-997 |
2002 |
20 | EE | Karim Arabi:
Mixed-Signal BIST: Fact or Fiction.
ITC 2002: 1202 |
19 | EE | Karim Arabi,
Klaus-Dieter Hilliges,
David C. Keezer,
Sassan Tabatabaei:
Multi-GigaHertz Testing Challenges and Solutions.
VTS 2002: 265-268 |
18 | EE | Karim Arabi:
Logic BIST and Scan Test Techniques for Multiple Identical Blocks.
VTS 2002: 60-68 |
2001 |
17 | EE | Mustapha Slamani,
Karim Arabi:
Reducing Test Time in the High-Volume Production of Analog Circuits using Efficient Test-Vector Generation and Interpolation Techniques.
J. Electronic Testing 17(5): 417-425 (2001) |
1998 |
16 | EE | Karim Arabi,
Hassan Ihs,
Christian Dufaza,
Bozena Kaminska:
Digital oscillation-test method for delay and stuck-at fault testing of digital circuits.
ITC 1998: 91-100 |
15 | EE | Karim Arabi,
Bozena Kaminska,
Mohamad Sawan:
On chip testing data converters using static parameters.
IEEE Trans. VLSI Syst. 6(3): 409-419 (1998) |
14 | EE | Karim Arabi,
Bozena Kaminska:
Integrated Temperature Sensors for On-Line Thermal Monitoring of Microelectronic Structures.
J. Electronic Testing 12(1-2): 93-99 (1998) |
1997 |
13 | EE | Karim Arabi,
Bozena Kaminska:
Efficient and accurate testing of analog-to-digital converters using oscillation-test method.
ED&TC 1997: 348-352 |
12 | | Karim Arabi,
Bozena Kaminska:
Built-In Temperature Sensors for On-line Thermal Monitoring of Microelectronic Structures.
ICCD 1997: 462-467 |
11 | | Bozena Kaminska,
Karim Arabi,
I. Bell,
José L. Huertas,
B. Kim,
Adoración Rueda,
Mani Soma,
Prashant Goteti:
Analog and Mixed-Signal Benchmark Circuits-First Release.
ITC 1997: 183-190 |
10 | | Karim Arabi,
Bozena Kaminska:
Design and Realization of an Accurate Built-In Current Sensor for On-Line Power Dissipation Measurement and IDDQ Testing.
ITC 1997: 578-586 |
9 | | Karim Arabi,
Bozena Kaminska:
Oscillation Built-In Self Test (OBIST) Scheme for Functional and Structural Testing of Analog and Mixed-Signal Integrated Circuits.
ITC 1997: 786-795 |
8 | EE | Karim Arabi,
Bozena Kaminska:
Parametric and Catastrophic Fault Coverage of Analog Circuits in Oscillation-Test Methodology.
VTS 1997: 166-171 |
7 | EE | Karim Arabi,
Bozena Kaminska:
Testing analog and mixed-signal integrated circuits using oscillation-test method.
IEEE Trans. on CAD of Integrated Circuits and Systems 16(7): 745-753 (1997) |
1996 |
6 | EE | Karim Arabi,
Bozena Kaminska,
Stephen K. Sunter:
Design for testability of integrated operational amplifiers using oscillation-test strategy.
ICCD 1996: 40-45 |
5 | EE | Karim Arabi,
Bozena Kaminska:
Oscillation-test strategy for analog and mixed-signal integrated circuits.
VTS 1996: 476-482 |
4 | EE | Mehdi Ehsanian,
Bozena Kaminska,
Karim Arabi:
A new digital test approach for analog-to-digital converter testing.
VTS 1996: 60-65 |
3 | EE | Karim Arabi,
Bozena Kaminska,
Janusz Rzeszut:
BIST for D/A and A/D Converters.
IEEE Design & Test of Computers 13(4): 40-49 (1996) |
1995 |
2 | | Jieyan Zhu,
Mohamad Sawan,
Karim Arabi:
An Offset Compensated CMOS Current-Feedback Operational-Amplifier.
ISCAS 1995: 1552-1555 |
1994 |
1 | EE | Karim Arabi,
Bozena Kaminska,
Janusz Rzeszut:
A new built-in self-test approach for digital-to-analog and analog-to-digital converters.
ICCAD 1994: 491-494 |