| |
| 1997 | ||
|---|---|---|
| 2 | EE | Vishwani D. Agrawal, Robert C. Aitken, J. Braden, Joan Figueras, S. Kumar, Hans-Joachim Wunderlich, Yervant Zorian: Power Dissipation During Testing: Should We Worry About it? VTS 1997: 456-457 |
| 1996 | ||
| 1 | EE | J. Braden, K. Brough, J. Evans, Martin P. McHugh, G. Young: Board-Level BIST. VTS 1996: 504-505 |
| 1 | Vishwani D. Agrawal | [2] |
| 2 | Robert C. Aitken | [2] |
| 3 | K. Brough | [1] |
| 4 | J. Evans | [1] |
| 5 | Joan Figueras | [2] |
| 6 | S. Kumar | [2] |
| 7 | Martin P. McHugh | [1] |
| 8 | Hans-Joachim Wunderlich | [2] |
| 9 | G. Young | [1] |
| 10 | Yervant Zorian | [2] |