| 2008 |
|---|
| 86 | | Yindar Chuo,
Bozena Kaminska:
Multiparameter Single Locus Integrated Multilayer Polymer Microsensor System.
BIODEVICES (1) 2008: 36-43 |
| 85 | | Pawel Gburzynski,
Bozena Kaminska:
Testing Real-Time Properties of Embedded Systems.
ESA 2008: 179-185 |
| 2007 |
|---|
| 84 | EE | Pawel Gburzynski,
Bozena Kaminska,
Wladek Olesinski:
A tiny and efficient wireless ad-hoc protocol for low-cost sensor networks.
DATE 2007: 1557-1562 |
| 83 | EE | Ashikur Rahman,
Pawel Gburzynski,
Bozena Kaminska:
Enhanced Dominant Pruning-based Broadcasting in Untrusted Ad-hoc Wireless Networks.
ICC 2007: 3389-3394 |
| 2006 |
|---|
| 82 | | Abraham O. Fapojuwo,
Bozena Kaminska:
Sixth IASTED International Multi-Conference on Wireless and Optical Communications: Conference on Communication Systems and Applications, Conference on Optical Communication Systems and Networks, Conference on Wireless Networks and Emerging Technologies, Conference on Wireless SENSOR Networks, Banff, Alberta, Canada, July 3-5, 2006
IASTED/ACTA Press 2006 |
| 81 | EE | Jasbir N. Patel,
Abdul Haseeb Ma,
Takaya Ueda,
Bonnie Gray,
Ash Parmeswaran,
Bozena Kaminska:
A Novel 3-Way Cell Sorter using Power Efficient Electrolysis-Based Actuator.
CCECE 2006: 348-351 |
| 2005 |
|---|
| 80 | EE | Ewa Sokolowska,
M. Barszcz,
Bozena Kaminska:
TED Thermo Electrical Designer: A New Physical Design Verification Tool.
ISQED 2005: 164-168 |
| 79 | EE | Bozena Kaminska,
Stephen K. Sunter,
Salvador Mir:
Analog and mixed signal test techniques for SOC development.
Microelectronics Journal 36(12): 1063 (2005) |
| 2003 |
|---|
| 78 | EE | Bozena Kaminska,
Karim Arabi:
Mixed Signal DFT: A Concise Overview.
ICCAD 2003: 672-680 |
| 77 | EE | Hans G. Kerkhoff,
Bozena Kaminska:
Analog and mixed signal test techniques for SoCs.
Microelectronics Journal 34(10): 887-888 (2003) |
| 2002 |
|---|
| 76 | EE | Bozena Kaminska:
Homegrown Tools and Equipment versus EDA and ATE Vendors: The Future of Design to Test Product Lines.
ITC 2002: 23 |
| 2001 |
|---|
| 75 | EE | Khaled Saab,
Naim Ben Hamida,
Bozena Kaminska:
Closing the gap between analog and digital testing.
IEEE Trans. on CAD of Integrated Circuits and Systems 20(2): 307-314 (2001) |
| 74 | EE | Iboun Taimiya Sylla,
Mustapha Slamani,
Bozena Kaminska:
A Unity Gain High Speed Buffer to Improve Signal Integrity in High Frequency Test Interface.
J. Electronic Testing 17(1): 53-61 (2001) |
| 2000 |
|---|
| 73 | EE | Khaled Saab,
Naim Ben Hamida,
Bozena Kaminska:
Closing the gap between analog and digital.
DAC 2000: 774-779 |
| 72 | EE | Khaled Saab,
Naim Ben Hamida,
Bozena Kaminska:
Parametric Fault Simulation and Test Vector Generation.
DATE 2000: 650- |
| 1999 |
|---|
| 71 | | Bozena Kaminska:
Is Analog Fault Simulation a Key to Product Quality? Practical Considerations.
ITC 1999: 648-648 |
| 70 | EE | Abdessatar Abderrahman,
Eduard Cerny,
Bozena Kaminska:
Worst case tolerance analysis and CLP-based multifrequency test generation for analog circuits.
IEEE Trans. on CAD of Integrated Circuits and Systems 18(3): 332-345 (1999) |
| 69 | EE | Samir Boubezari,
Eduard Cerny,
Bozena Kaminska,
Benoit Nadeau-Dostie:
Testability analysis and test-point insertion in RTL VHDL specifications for scan-based BIST.
IEEE Trans. on CAD of Integrated Circuits and Systems 18(9): 1327-1340 (1999) |
| 1998 |
|---|
| 68 | EE | Karim Arabi,
Hassan Ihs,
Christian Dufaza,
Bozena Kaminska:
Digital oscillation-test method for delay and stuck-at fault testing of digital circuits.
ITC 1998: 91-100 |
| 67 | EE | Iboun Taimiya Sylla,
Mustapha Slamani,
Bozena Kaminska,
Fartoumi M. Hossein,
Patrick Vincent:
Impedance Mismatch and Lumped Capacitance Effects in High Frequency Testing.
VTS 1998: 239-244 |
| 66 | EE | Karim Arabi,
Bozena Kaminska,
Mohamad Sawan:
On chip testing data converters using static parameters.
IEEE Trans. VLSI Syst. 6(3): 409-419 (1998) |
| 65 | EE | Karim Arabi,
Bozena Kaminska:
Integrated Temperature Sensors for On-Line Thermal Monitoring of Microelectronic Structures.
J. Electronic Testing 12(1-2): 93-99 (1998) |
| 1997 |
|---|
| 64 | EE | Naim Ben Hamida,
Khaled Saab,
David Marche,
Bozena Kaminska:
A perturbation based fault modeling and simulation for mixed-signal circuits.
Asian Test Symposium 1997: 182-187 |
| 63 | EE | Karim Arabi,
Bozena Kaminska:
Efficient and accurate testing of analog-to-digital converters using oscillation-test method.
ED&TC 1997: 348-352 |
| 62 | | Karim Arabi,
Bozena Kaminska:
Built-In Temperature Sensors for On-line Thermal Monitoring of Microelectronic Structures.
ICCD 1997: 462-467 |
| 61 | | Bozena Kaminska,
Karim Arabi,
I. Bell,
José L. Huertas,
B. Kim,
Adoración Rueda,
Mani Soma,
Prashant Goteti:
Analog and Mixed-Signal Benchmark Circuits-First Release.
ITC 1997: 183-190 |
| 60 | | Karim Arabi,
Bozena Kaminska:
Design and Realization of an Accurate Built-In Current Sensor for On-Line Power Dissipation Measurement and IDDQ Testing.
ITC 1997: 578-586 |
| 59 | | Mathieu Gagnon,
Bozena Kaminska:
Optical Communication Channel Test Using BIST Approaches.
ITC 1997: 626-635 |
| 58 | | Karim Arabi,
Bozena Kaminska:
Oscillation Built-In Self Test (OBIST) Scheme for Functional and Structural Testing of Analog and Mixed-Signal Integrated Circuits.
ITC 1997: 786-795 |
| 57 | EE | Abdessatar Abderrahman,
Eduard Cerny,
Bozena Kaminska:
CLP-based Multifrequency Test Generation for Analog Circuits.
VTS 1997: 158-165 |
| 56 | EE | Karim Arabi,
Bozena Kaminska:
Parametric and Catastrophic Fault Coverage of Analog Circuits in Oscillation-Test Methodology.
VTS 1997: 166-171 |
| 55 | EE | Melvin A. Breuer,
Bozena Kaminska,
J. McDermid,
V. Rayapathi,
Donald L. Wheater:
Will 0.1um Digital Circuits Require Mixed-Signal Testing.
VTS 1997: 186-187 |
| 54 | EE | Karim Arabi,
Bozena Kaminska:
Testing analog and mixed-signal integrated circuits using oscillation-test method.
IEEE Trans. on CAD of Integrated Circuits and Systems 16(7): 745-753 (1997) |
| 1996 |
|---|
| 53 | EE | Naim Ben Hamida,
Bechir Ayari,
Bozena Kaminska:
Testing of embedded A/D converters in mixed-signal circuit.
ICCD 1996: 135-136 |
| 52 | EE | Karim Arabi,
Bozena Kaminska,
Stephen K. Sunter:
Design for testability of integrated operational amplifiers using oscillation-test strategy.
ICCD 1996: 40-45 |
| 51 | | Naim Ben Hamida,
Khaled Saab,
David Marche,
Bozena Kaminska,
Guy Quesnel:
LIMSoft: Automated Tool for Design and Test Integration of Analog Circuits.
ITC 1996: 571-580 |
| 50 | EE | Bozena Kaminska,
Tad A. Kwasniewski,
Linda S. Milor,
G. Roberts,
P. Flahive,
Jérôme Wojcik:
Is High Frequency Analog DFT Possible?
VTS 1996: 214-215 |
| 49 | EE | Mohamed Soufi,
Steve Rochon,
Yvon Savaria,
Bozena Kaminska:
Design and performance of CMOS TSPC cells for high speed pseudo random testing.
VTS 1996: 368-373 |
| 48 | EE | Karim Arabi,
Bozena Kaminska:
Oscillation-test strategy for analog and mixed-signal integrated circuits.
VTS 1996: 476-482 |
| 47 | EE | Mehdi Ehsanian,
Bozena Kaminska,
Karim Arabi:
A new digital test approach for analog-to-digital converter testing.
VTS 1996: 60-65 |
| 46 | | Bozena Kaminska,
Bernard Courtois:
Guest Editors' Introduction: Mixed Analog and Digital Systems.
IEEE Design & Test of Computers 13(2): 8-9 (1996) |
| 45 | | Gil Philips,
Yervant Zorian,
Charles W. Rosenthal,
Bozena Kaminska:
Conference Reports.
IEEE Design & Test of Computers 13(3): 8, 113-144 (1996) |
| 44 | EE | Karim Arabi,
Bozena Kaminska,
Janusz Rzeszut:
BIST for D/A and A/D Converters.
IEEE Design & Test of Computers 13(4): 40-49 (1996) |
| 43 | EE | Samir Boubezari,
Bozena Kaminska:
A new reconfigurable Test Vector Generator for built-in self-test applications.
J. Electronic Testing 8(2): 153-164 (1996) |
| 42 | EE | Adel Belhaouane,
Yvon Savaria,
Bozena Kaminska,
Daniel Massicotte:
Reconstruction method for jitter tolerant data acquisition system.
J. Electronic Testing 9(1-2): 177-185 (1996) |
| 41 | EE | Abdessatar Abderrahman,
Bozena Kaminska,
Eduard Cerny:
Optimization-based multifrequency test generation for analog circuits.
J. Electronic Testing 9(1-2): 59-73 (1996) |
| 40 | EE | Bozena Kaminska,
Bernard Courtois:
Guest editorial.
J. Electronic Testing 9(1-2): 7-8 (1996) |
| 1995 |
|---|
| 39 | EE | Janusz Rzeszut,
Bozena Kaminska,
Yvon Savaria:
A new method for testing mixed analog and digital circuits.
Asian Test Symposium 1995: 127-132 |
| 38 | EE | Ali Assi,
Bozena Kaminska:
Modeling of communication protocols in VHDL.
Great Lakes Symposium on VLSI 1995: 168-171 |
| 37 | | Samir Lejmi,
Bozena Kaminska,
Bechir Ayari:
Retiming for BIST-Sequential Circuits.
ISCAS 1995: 1740-1743 |
| 36 | | Samir Boubezari,
Bozena Kaminska:
Mixed Deterministic and Pseudorandom Test Vector Generator Based on Cellular Automata Structures.
ISCAS 1995: 1928-1931 |
| 35 | | Bechir Ayari,
Bozena Kaminska:
BDD-FTEST: Fast, Backtrack-Free Test Generator Based on Binary Decision Diagram Representation.
ISCAS 1995: 2132-2135 |
| 34 | | Mohamed Soufi,
Yvon Savaria,
Bozena Kaminska:
On Using Partial Reset for Pseudo-Random Testing.
ISCAS 1995: 949-952 |
| 33 | | Samir Lejmi,
Bozena Kaminska,
Bechir Ayari:
Synthesis and Retiming for the Pseudo-Exhaustive BIST of Synchronous Sequential Circuits.
ITC 1995: 683-692 |
| 32 | EE | Mohamed Soufi,
Yvon Savaria,
Bozena Kaminska:
On the design of at-speed testable VLSI circuits.
VTS 1995: 290-295 |
| 31 | EE | Samir Lejmi,
Bozena Kaminska,
Bechir Ayari:
Retiming, resynthesis, and partitioning for the pseudo-exhaustive testing of sequential circuits.
VTS 1995: 434-439 |
| 30 | EE | Khaled Saab,
Bozena Kaminska,
Bernard Courtois,
Marcelo Lubaszewski:
Frequency-based BIST for analog circuit testin.
VTS 1995: 54-59 |
| 29 | EE | Mustapha Slamani,
Bozena Kaminska:
Multifrequency Analysis of Faults in Analog Circuits.
IEEE Design & Test of Computers 12(2): 70-80 (1995) |
| 28 | | Sreejit Chakravarty,
Ramalingam Sridhar,
Shambhu J. Upadhyaya,
Yervant Zorian,
Gil Philips,
Bozena Kaminska,
Bernard Courtois:
Conference Reports.
IEEE Design & Test of Computers 12(4): 95-97 (1995) |
| 27 | | Mohamed Soufi,
Yvon Savaria,
F. Darlay,
Bozena Kaminska:
Producing Reliable Initialization and Test of Sequential Circuits with Pseudorandom Vectors.
IEEE Trans. Computers 44(10): 1251-1256 (1995) |
| 26 | | Samir Boubezari,
Bozena Kaminska:
A Deterministic Built-In-Self-Test Generator Based on Cellular Automata Structures.
IEEE Trans. Computers 44(6): 805-816 (1995) |
| 25 | EE | Mounir Fares,
Bozena Kaminska:
FPAD: a fuzzy nonlinear programming approach to analog circuit design.
IEEE Trans. on CAD of Integrated Circuits and Systems 14(7): 785-793 (1995) |
| 1994 |
|---|
| 24 | | Mohamed Jamoussi,
Bozena Kaminska:
M-Testability: An Approach for Data-Path Testability Evaluation.
EDAC-ETC-EUROASIC 1994: 449-455 |
| 23 | | Abdessatar Abderrahman,
Bozena Kaminska,
Yvon Savaria:
Estimation of Simultaneous Switching Power and Ground Noise of Static CMOS Combinational Circuits.
EDAC-ETC-EUROASIC 1994: 658 |
| 22 | EE | Karim Arabi,
Bozena Kaminska,
Janusz Rzeszut:
A new built-in self-test approach for digital-to-analog and analog-to-digital converters.
ICCAD 1994: 491-494 |
| 21 | | Samir Lejmi,
Bozena Kaminska,
Edouard Wagneur:
Retiming for the Global Optimization of Synchronous Sequential Circuits.
ICCD 1994: 398-403 |
| 20 | | Naim Ben Hamida,
Bozena Kaminska,
Yvon Savaria:
Pseudo-Random Vector Compaction for Sequential Testability.
ISCAS 1994: 63-66 |
| 19 | | Naim Ben Hamida,
Bozena Kaminska:
High Level Synthesis with Testability Constraints.
ISCAS 1994: 65-68 |
| 18 | | Mustapha Slamani,
Bozena Kaminska,
Guy Quesnel:
An Integrated Approach for Analog Ciruit Testing with a Minmum Number of Detected Parameters.
ITC 1994: 631-640 |
| 17 | | Ewa Sokolowska,
Bozena Kaminska:
Application of Optoelectronic Techniques to High Speed Testing.
ITC 1994: 710-719 |
| 16 | | Mohamed Jamoussi,
Bozena Kaminska:
Data Path Testability Evaluation via Functional Testability Measures.
VLSI Design 1994: 301-306 |
| 15 | | Naim Ben Hamida,
Bozena Kaminska:
Multiple Fault Testing in Analog Circuits.
VLSI Design 1994: 61-66 |
| 14 | | Mounir Fares,
Bozena Kaminska:
Exploring Test Space with Fuzzy Decision Making.
IEEE Design & Test of Computers 11(3): 17-27 (1994) |
| 13 | EE | Bechir Ayari,
Bozena Kaminska:
A new dynamic test vector compaction for automatic test pattern generation.
IEEE Trans. on CAD of Integrated Circuits and Systems 13(3): 353-358 (1994) |
| 12 | EE | Said Amellal,
Bozena Kaminska:
Functional synthesis of digital systems with TASS.
IEEE Trans. on CAD of Integrated Circuits and Systems 13(5): 537-552 (1994) |
| 11 | EE | Mounir Fares,
Bozena Kaminska:
Fuzzy optimization models for analog test decisions.
J. Electronic Testing 5(2-3): 299-305 (1994) |
| 1993 |
|---|
| 10 | | Mohamed Jamoussi,
Bozena Kaminska:
A Functional-level Testability Evaluation Using a New M-Testability.
ISCAS 1993: 1611-1614 |
| 9 | | Naim Ben Hamida,
Bozena Kaminska,
Yvon Savaria:
Initiability: A Measure of Sequential Testability.
ISCAS 1993: 1619-1622 |
| 8 | | Said Amellal,
Bozena Kaminska:
Scheduling of a Control and Data Flow Graph.
ISCAS 1993: 1666-1669 |
| 7 | | Samir Lejmi,
Bozena Kaminska,
Edouard Wagneur:
Resynthesis and Retiming of Synchronous Sequential Cirucits.
ISCAS 1993: 1674-1677 |
| 6 | | Naim Ben Hamida,
Bozena Kaminska:
Analog Circuit Testing Based on Sensitivity Computation and New Circuit Modeling.
ITC 1993: 652-661 |
| 5 | EE | Naim Ben Hamida,
Bozena Kaminska:
Multiple fault analog circuit testing by sensitivity analysis.
J. Electronic Testing 4(4): 331-343 (1993) |
| 1992 |
|---|
| 4 | EE | Mustapha Slamani,
Bozena Kaminska:
Analog Circuit Fault Diagnosis Based on Sensitivity Computation and Functional Testing.
IEEE Design & Test of Computers 9(1): 30-39 (1992) |
| 1989 |
|---|
| 3 | | Yvon Savaria,
Bruno Laguë,
Bozena Kaminska:
A Pragmatic Approach to the Design of Self-Testing Circuits.
ITC 1989: 745-754 |
| 2 | | Bozena Kaminska,
Yvon Savaria:
Design-for-Testability Using Test Design Yield and Decision Theory.
ITC 1989: 884-892 |
| 1988 |
|---|
| 1 | | David Stannard,
Bozena Kaminska:
Detection of Hard Faults in a Combinational Circuit Using Budget Constraints.
ITC 1988: 999 |
