| 1996 |
|---|
| 6 | EE | Hong Helena Zheng,
Ashok Balivada,
Jacob A. Abraham:
A novel test generation approach for parametric faults in linear analog circuits .
VTS 1996: 470-475 |
| 5 | EE | Ashok Balivada,
Jin Chen,
Jacob A. Abraham:
Analog Testing with Time Response Parameters.
IEEE Design & Test of Computers 13(2): 18-25 (1996) |
| 4 | EE | Ashok Balivada,
Hong Zheng,
Naveena Nagi,
Abhijit Chatterjee,
Jacob A. Abraham:
A unified approach for fault simulation of linear mixed-signal circuits.
J. Electronic Testing 9(1-2): 29-41 (1996) |
| 1995 |
|---|
| 3 | EE | Naveena Nagi,
Abhijit Chatterjee,
Ashok Balivada,
Jacob A. Abraham:
Efficient multisine testing of analog circuits.
VLSI Design 1995: 234-238 |
| 2 | EE | Ashok Balivada,
Yatin Vasant Hoskote,
Jacob A. Abraham:
Verification of transient response of linear analog circuits.
VTS 1995: 42-47 |
| 1993 |
|---|
| 1 | EE | Naveena Nagi,
Abhijit Chatterjee,
Ashok Balivada,
Jacob A. Abraham:
Fault-based automatic test generator for linear analog circuits.
ICCAD 1993: 88-91 |
