Gerald T. Michael

1996
2	EE	T. Raju Damarla, Moon J. Chung, Wei Su, Gerald T. Michael: Faulty chip identification in a multi chip module system. VTS 1996: 254-259
1995
1	EE	T. Raju Damarla, Wei Su, Gerald T. Michael, Moon J. Chung, Charles E. Stroud: A built-in self test scheme for VLSI. ASP-DAC 1995

Coauthor Index

1	Moon J. Chung	[1] [2]
2	T. Raju Damarla	[1] [2]
3	Charles E. Stroud	[1]
4	Wei Su	[1] [2]