2002 |
12 | EE | David B. Lavo,
Ismed Hartanto,
Tracy Larrabee:
Multiplets, Models, and the Search for Meaning: Improving Per-Test Fault Diagnosis.
ITC 2002: 250-259 |
2001 |
11 | EE | Ismed Hartanto,
Srikanth Venkataraman,
W. Kent Fuchs,
Elizabeth M. Rudnick,
Janak H. Patel,
Sreejit Chakravarty:
Diagnostic simulation of stuck-at faults in sequential circuits using compact lists.
ACM Trans. Design Autom. Electr. Syst. 6(4): 471-489 (2001) |
2000 |
10 | | Peter C. Maxwell,
Ismed Hartanto,
Lee Bentz:
Comparing functional and structural tests.
ITC 2000: 400-407 |
1998 |
9 | EE | David B. Lavo,
Brian Chess,
Tracy Larrabee,
Ismed Hartanto:
Probabilistic mixed-model fault diagnosis.
ITC 1998: 1084-1093 |
1997 |
8 | EE | Vamsi Boppana,
Ismed Hartanto,
W. Kent Fuchs:
Characterization and Implicit Identification of Sequential Indistinguishability.
VLSI Design 1997: 376-380 |
7 | EE | Ismed Hartanto,
Vamsi Boppana,
Janak H. Patel,
W. Kent Fuchs:
Diagnostic Test Pattern Generation for Sequential Circuits.
VTS 1997: 196-202 |
1996 |
6 | | Vamsi Boppana,
Ismed Hartanto,
W. Kent Fuchs:
Fault Diagnosis Using State Information.
FTCS 1996: 96-103 |
5 | EE | Ismed Hartanto,
Vamsi Boppana,
W. Kent Fuchs:
Identification of unsettable flip-flops for partial scan and faster ATPG.
ICCAD 1996: 63-66 |
4 | | Ismed Hartanto,
Vamsi Boppana,
W. Kent Fuchs:
Diagnostic Fault Equivalence Identification Using Redundancy Information and Structural Analysis.
ITC 1996: 294-302 |
3 | EE | Vamsi Boppana,
Ismed Hartanto,
W. Kent Fuchs:
Full fault dictionary storage based on labeled tree encoding.
VTS 1996: 174-179 |
2 | EE | Srikanth Venkataraman,
Ismed Hartanto,
W. Kent Fuchs:
Dynamic diagnosis of sequential circuits based on stuck-at faults.
VTS 1996: 198-203 |
1995 |
1 | EE | Srikanth Venkataraman,
Ismed Hartanto,
W. Kent Fuchs,
Elizabeth M. Rudnick,
Sreejit Chakravarty,
Janak H. Patel:
Rapid Diagnostic Fault Simulation of Stuck-at Faults in Sequential Circuits Using Compact Lists.
DAC 1995: 133-138 |