| 2003 |
|---|
| 4 | EE | Christophe Fagot,
Olivier Gascuel,
Patrick Girard,
Christian Landrault:
A Ring Architecture Strategy for BIST Test Pattern Generation.
J. Electronic Testing 19(3): 223-231 (2003) |
| 1998 |
|---|
| 3 | EE | Christophe Fagot,
Olivier Gascuel,
Patrick Girard,
Christian Landrault:
A Ring Architecture Strategy for BIST Test Pattern Generation.
Asian Test Symposium 1998: 418-423 |
| 1997 |
|---|
| 2 | | Christophe Fagot,
Patrick Girard,
Christian Landrault:
On Using Machine Learning for Logic BIST.
ITC 1997: 338-346 |
| 1996 |
|---|
| 1 | EE | S. Cremoux,
Christophe Fagot,
Patrick Girard,
Christian Landrault,
Serge Pravossoudovitch:
A new test pattern generation method for delay fault testing.
VTS 1996: 296-301 |
