2004 |
11 | EE | Wangqi Qiu,
Jing Wang,
D. M. H. Walker,
Divya Reddy,
Zhuo Li,
Weiping Shi,
Hari Balachandran:
K Longest Paths Per Gate (KLPG) Test Generation for Scan-Based Sequential Circuits.
ITC 2004: 223-231 |
2002 |
10 | EE | Hari Balachandran,
Kenneth M. Butler,
Neil Simpson:
Facilitating Rapid First Silicon Debug.
ITC 2002: 628-637 |
2000 |
9 | | Anjali Kinra,
Hari Balachandran,
Regy Thomas,
John Carulli:
Logic mapping on a microprocessor.
ITC 2000: 701-710 |
8 | | Zoran Stanojevic,
Hari Balachandran,
D. M. H. Walker,
Fred Lakbani,
Jayashree Saxena,
Kenneth M. Butler:
Computer-aided fault to defect mapping (CAFDM) for defect diagnosis.
ITC 2000: 729-738 |
7 | EE | Sri Jandhyala,
Hari Balachandran,
Manidip Sengupta,
Anura P. Jayasumana:
Clustering Based Evaluation of IDDQ Measurements: Applications in Testing and Classification of ICs.
VTS 2000: 444-452 |
1999 |
6 | | Hari Balachandran,
Jason Parker,
Gordon Gammie,
John W. Olson,
Craig Force,
Kenneth M. Butler,
Sri Jandhyala:
Expediting ramp-to-volume production.
ITC 1999: 103-112 |
5 | | Hari Balachandran,
Jason Parker,
Daniel Shupp,
Stephanie Butler,
Kenneth M. Butler,
Craig Force,
Jason Smith:
Correlation of logical failures to a suspect process step.
ITC 1999: 458-476 |
4 | | Sri Jandhyala,
Hari Balachandran,
Anura P. Jayasumana:
Clustering based techniques for I_DDQ testing.
ITC 1999: 730-737 |
3 | EE | Michael R. Grimaila,
Sooryong Lee,
Jennifer Dworak,
Kenneth M. Butler,
Bret Stewart,
Hari Balachandran,
Bryan Houchins,
Vineet Mathur,
Jaehong Park,
Li-C. Wang,
M. Ray Mercer:
REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experimen.
VTS 1999: 268-274 |
1998 |
2 | EE | Jayashree Saxena,
Kenneth M. Butler,
Hari Balachandran,
David B. Lavo,
Tracy Larrabee,
F. Joel Ferguson,
Brian Chess:
On applying non-classical defect models to automated diagnosis.
ITC 1998: 748-757 |
1996 |
1 | EE | Hari Balachandran,
D. M. H. Walker:
Improvement of SRAM-based failure analysis using calibrated Iddq testing.
VTS 1996: 130-137 |