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| 1996 | ||
|---|---|---|
| 2 | EE | T. Raju Damarla, Moon J. Chung, Wei Su, Gerald T. Michael: Faulty chip identification in a multi chip module system. VTS 1996: 254-259 |
| 1995 | ||
| 1 | EE | T. Raju Damarla, Wei Su, Gerald T. Michael, Moon J. Chung, Charles E. Stroud: A built-in self test scheme for VLSI. ASP-DAC 1995 |
| 1 | T. Raju Damarla | [1] [2] |
| 2 | Gerald T. Michael | [1] [2] |
| 3 | Charles E. Stroud | [1] |
| 4 | Wei Su | [1] [2] |