| |
| 1996 | ||
|---|---|---|
| 1 | EE | R. L. Campbell, P. Kuekes, David Y. Lepejian, W. Maly, Michael Nicolaidis, Alex Orailoglu: Can Defect-Tolerant Chips Better Meet the Quality Challenge? VTS 1996: 362-363 |
| 1 | R. L. Campbell | [1] |
| 2 | P. Kuekes | [1] |
| 3 | David Y. Lepejian | [1] |
| 4 | Michael Nicolaidis | [1] |
| 5 | Alex Orailoglu | [1] |