Prab Varma

2004
18		Prab Varma: Verification evolution or industrial revolution? IEEE Design & Test of Computers 21(2): 168- (2004)
2003
17	EE	Prab Varma: Design Verification Problems: Test To The Rescue?. ITC 2003: 1292
2001
16	EE	Magdy S. Abadir, Scott Davidson, Vijay Nagasamy, Dhiraj K. Pradhan, Prab Varma: ATPG for Design Errors-Is It Possible? VTS 2001: 283-285
2000
15	EE	Bechir Ayari, Prab Varma: Test Cycle Count Reduction in a Parallel Scan BIST Environment. J. Electronic Testing 16(5): 409-418 (2000)
1998
14	EE	Bechir Ayari, Prab Varma: Test Cycle Count Reduction in a Parallel Scan BIST Environment. Asian Test Symposium 1998: 21-26
13	EE	Prab Varma: System Chip Test Challenges, Are There Solutions Today? (Panel). DAC 1998: 750-751
12	EE	Prab Varma: System chip test: are we there yet? ITC 1998: 1144
11	EE	Prab Varma, Sandeep Bhatia: A structured test re-use methodology for core-based system chips. ITC 1998: 294-302
1997
10	EE	Sandeep Bhatia, Prab Varma: Test Compaction in a Parallel Access Scan Environment. Asian Test Symposium 1997: 300-305
1996
9		Sandeep Bhatia, Tushar Gheewala, Prab Varma: A Unifying Methodology for Intellectual Property and Custom Logic Testing. ITC 1996: 639-648
8	EE	Sandeep K. Gupta, Slawomir Pilarski, Sudhakar M. Reddy, Jacob Savir, Prab Varma: Delay Fault Testing: How Robust are Our Models? VTS 1996: 502-503
1995
7		Prab Varma: Optimizing Product Profitability - The Test Way. ITC 1995: 922
1994
6		Prab Varma: On Path-Delay Testing in a Standard Scan Environment. ITC 1994: 164-173
5	EE	Prab Varma, Tushar Gheewala: The economics of scan-path design for testability. J. Electronic Testing 5(2-3): 179-193 (1994)
1993
4		Prab Varma, Tushar Gheewala: Delay Testing Using a Matrix of Accessible Storage. ITC 1993: 243-252
3		Prab Varma: Scan DFT: Why More Can Cost Less. ITC 1993: 267
1987
2	EE	S. B. Tan, K. Totton, Keith Baker, Prab Varma, R. Porter: A Fast Signature Simulation Tool for Built-In Self-Testing Circuits. DAC 1987: 17-25
1984
1		Prab Varma, Anthony P. Ambler, Keith Baker: An Analysis of the Economics of Self Test. ITC 1984: 20-30

Coauthor Index

1	Magdy S. Abadir	[16]
2	Anthony P. Ambler	[1]
3	Bechir Ayari	[14] [15]
4	Keith Baker	[1] [2]
5	Sandeep Bhatia	[9] [10] [11]
6	Scott Davidson	[16]
7	Tushar Gheewala	[4] [5] [9]
8	Sandeep K. Gupta	[8]
9	Vijay Nagasamy	[16]
10	Slawomir Pilarski	[8]
11	R. Porter	[2]
12	Dhiraj K. Pradhan	[16]
13	Sudhakar M. Reddy	[8]
14	Jacob Savir	[8]
15	S. B. Tan	[2]
16	K. Totton	[2]

Colors in the list of coauthors