| 2009 |
|---|
| 63 | EE | Dimitris Nikolos,
Dimitrios Kagaris,
Samara Sudireddy,
Spyros Gidaros:
An Improved Search Method for Accumulator-Based Test Set Embedding.
IEEE Trans. Computers 58(1): 132-138 (2009) |
| 2008 |
|---|
| 62 | EE | Dimitri Kagaris,
Spyros Tragoudas:
Graph Theory and Algorithms.
Wiley Encyclopedia of Computer Science and Engineering 2008 |
| 61 | EE | Jayawant Kakade,
Dimitrios Kagaris,
Dhiraj K. Pradhan:
Evaluation of Generalized LFSRs as Test Pattern Generators in Two-Dimensional Scan Designs.
IEEE Trans. on CAD of Integrated Circuits and Systems 27(9): 1689-1692 (2008) |
| 2007 |
|---|
| 60 | EE | Abhishek Pillai,
Wei Zhang,
Dimitrios Kagaris:
Detecting VLIW Hard Errors Cost-Effectively through a Software-Based Approach.
AINA Workshops (1) 2007: 811-815 |
| 59 | EE | Snehal Udar,
Dimitri Kagaris:
LFSR Reseeding with Irreducible Polynomials.
IOLTS 2007: 293-298 |
| 58 | EE | Christopher Jenkins,
Jayawant Kakade,
Dimitri Kagaris:
Cellular Automata with Large Channel Separations.
ISCAS 2007: 1033-1036 |
| 57 | EE | Dimitri Kagaris,
Themistoklis Haniotakis:
Transistor-Level Synthesis for Low-Power Applications.
ISQED 2007: 607-612 |
| 56 | EE | Dimitrios Kagaris,
Themistoklis Haniotakis:
A Methodology for Transistor-Efficient Supergate Design.
IEEE Trans. VLSI Syst. 15(4): 488-492 (2007) |
| 55 | EE | Jayawant Kakade,
Dimitrios Kagaris:
Minimization of Linear Dependencies Through the Use of Phase Shifters.
IEEE Trans. on CAD of Integrated Circuits and Systems 26(10): 1877-1882 (2007) |
| 2006 |
|---|
| 54 | EE | Dimitris Nikolos,
Dimitrios Kagaris,
Spyros Gidaros:
Diophantine-Equation Based Arithmetic Test Set Embedding.
IOLTS 2006: 193-194 |
| 53 | EE | Jayawant Kakade,
Dimitrios Kagaris:
Phase shifts and linear dependencies.
ISCAS 2006 |
| 52 | EE | Dimitri Kagaris,
Themistoklis Haniotakis:
Transistor-Level Optimization of Supergates.
ISQED 2006: 682-690 |
| 51 | EE | Dimitri Kagaris:
A similarity transform for linear finite state machines.
Discrete Applied Mathematics 154(11): 1570-1577 (2006) |
| 50 | EE | Dimitri Kagaris,
Spyros Tragoudas,
Sherin Kuriakose:
InTeRail: A Test Architecture for Core-Based SOCs.
IEEE Trans. Computers 55(2): 137-149 (2006) |
| 49 | EE | Dimitrios Kagaris,
P. Karpodinis,
Dimitris Nikolos:
On Obtaining Maximum-Length Sequences for Accumulator-Based Serial TPG.
IEEE Trans. on CAD of Integrated Circuits and Systems 25(11): 2578-2586 (2006) |
| 48 | EE | A. Mehta,
Dimitrios Kagaris,
R. Viswanathan:
Throughput performance of an adaptive ARQ scheme in Rayleigh fading channels.
IEEE Transactions on Wireless Communications 5(1): 12-15 (2006) |
| 47 | EE | Dimitri Kagaris,
Rajesh Aakuthota,
Anila Verma:
Maximum sequence test pattern generators with irreducible characteristic polynomials.
Microprocessors and Microsystems 30(2): 117-123 (2006) |
| 2005 |
|---|
| 46 | EE | Dhiraj K. Pradhan,
Dimitri Kagaris,
Rohit Gambhir:
A Hamming Distance Based Test Pattern Generator with Improved Fault Coverage.
IOLTS 2005: 221-226 |
| 45 | EE | Dimitrios Kagaris:
A unified method for phase shifter computation.
ACM Trans. Design Autom. Electr. Syst. 10(1): 157-167 (2005) |
| 44 | EE | Dimitri Kagaris:
Phase Shifter Merging.
J. Electronic Testing 21(2): 161-168 (2005) |
| 2004 |
|---|
| 43 | EE | P. Karpodinis,
Dimitri Kagaris,
Dimitris Nikolos:
Accumulator based Test-per-Scan BIST.
IOLTS 2004: 193-198 |
| 2003 |
|---|
| 42 | EE | Dimitri Kagaris,
Spyros Tragoudas:
InTeRail: Using Existing and Extra Interconnects to Test Core-Based SOCs.
IOLTS 2003: 219-224 |
| 41 | EE | Maciej Bellos,
Dimitri Kagaris,
Dimitris Nikolos:
Low Power Test Set Embedding Based on Phase Shifters.
ISVLSI 2003: 155-160 |
| 40 | | Maciej Bellos,
Xrysovalantis Kavousianos,
Dimitris Nikolos,
Dimitri Kagaris:
DV-TSE: Difference Vector Based Test Set Embedding.
VLSI-SOC 2003: 343- |
| 39 | EE | Dimitri Kagaris:
Built-In TPG with Designed Phaseshifts.
VTS 2003: 365-370 |
| 38 | EE | Dimitri Kagaris:
Multiple-Seed TPG Structures.
IEEE Trans. Computers 52(12): 1633-1639 (2003) |
| 37 | EE | Dimitri Kagaris:
On minimum delay clustering without replication.
Integration 36(1-2): 27-39 (2003) |
| 36 | EE | Dimitri Kagaris,
Spyros Tragoudas:
LFSR Characteristic Polynomials for Pseudo-Exhaustive TPG with Low Number of Seeds.
J. Electronic Testing 19(3): 233-244 (2003) |
| 2002 |
|---|
| 35 | EE | Maciej Bellos,
Dimitrios Kagaris,
Dimitris Nikolos:
Test Set Embedding Based on Phase Shifters.
EDCC 2002: 90-101 |
| 34 | EE | Dimitri Kagaris:
Built-in Generation of m -Sequences with Irreducible Characteristic Polynomials.
IOLTW 2002: 158- |
| 33 | EE | Dimitrios Kagaris:
Linear dependencies in extended LFSMs.
IEEE Trans. on CAD of Integrated Circuits and Systems 21(7): 852-859 (2002) |
| 32 | EE | Dimitrios Kagaris,
Spyros Tragoudas:
On the nonenumerative path delay fault simulation problem.
IEEE Trans. on CAD of Integrated Circuits and Systems 21(9): 1095-1101 (2002) |
| 31 | EE | Dimitrios Kagaris,
Spyros Tragoudas:
Using a WLFSR to Embed Test Pattern Pairs in Minimum Time.
J. Electronic Testing 18(3): 305-313 (2002) |
| 2001 |
|---|
| 30 | EE | Dimitri Kagaris,
Spyros Tragoudas:
Using a WLFSR to Embed Test Pattern Pairs in Minimum Time.
IOLTW 2001: 75-79 |
| 29 | EE | Dimitrios Kagaris,
Spyros Tragoudas:
Von Neumann hybrid cellular automata for generating deterministic test sequences.
ACM Trans. Design Autom. Electr. Syst. 6(3): 308-321 (2001) |
| 28 | | Dimitrios Kagaris,
Spyros Tragoudas:
Computational analysis of counter-based schemes for VLSI test pattern generation.
Discrete Applied Mathematics 110(2-3): 227-250 (2001) |
| 2000 |
|---|
| 27 | EE | Dimitrios Kagaris,
Spyros Tragoudas:
Pseudoexhaustive TPG with a Provably Low Number of LFSR Seeds.
ICCD 2000: 42-47 |
| 26 | EE | Dimitri Kagaris,
Spyros Tragoudas,
Amitava Majumdar:
Test-set partitioning for multi-weighted random LFSRs.
Integration 30(1): 65-75 (2000) |
| 1999 |
|---|
| 25 | EE | Dimitrios Kagaris,
Spyros Tragoudas:
LFSR/SR Pseudo-Exhaustive TPG in Fewer Test Cycles.
DFT 1999: 130-138 |
| 24 | EE | Dimitrios Kagaris,
Spyros Tragoudas:
Embedded cores using built-in mechanisms.
ISCAS (1) 1999: 23-26 |
| 23 | EE | Dimitrios Kagaris,
Spyros Tragoudas:
On the design of optimal counter-based schemes for test set embedding.
IEEE Trans. on CAD of Integrated Circuits and Systems 18(2): 219-230 (1999) |
| 22 | EE | Dimitri Kagaris,
Spyros Tragoudas:
Maximum weighted independent sets on transitive graphs and applications1.
Integration 27(1): 77-86 (1999) |
| 21 | EE | Dimitrios Kagaris,
Grammati E. Pantziou,
Spyros Tragoudas,
Christos D. Zaroliagis:
Transmissions in a network with capacities and delays.
Networks 33(3): 167-174 (1999) |
| 1998 |
|---|
| 20 | EE | Dimitrios Kagaris,
Spyros Tragoudas,
Amitava Majumdar:
On-Chip Test Embedding for Multi-Weighted Random LFSRs.
DFT 1998: 135- |
| 1997 |
|---|
| 19 | EE | Dimitrios Kagaris,
Spyros Tragoudas:
Cellular automata for generating deterministic test sequences.
ED&TC 1997: 77-81 |
| 18 | EE | Dimitrios Kagaris,
Spyros Tragoudas:
Maximum independent sets on transitive graphs and their applications in testing and CAD.
ICCAD 1997: 736-740 |
| 17 | | Dimitrios Kagaris,
Spyros Tragoudas,
Dimitrios Karayiannis:
Nonenumerative Path Delay Fault Coverage Estimation with Optimal Algorithms.
ICCD 1997: 366-371 |
| 16 | EE | Dimitrios Kagaris,
Spyros Tragoudas,
Dimitrios Karayiannis:
Improved nonenumerative path-delay fault-coverage estimation based on optimal polynomial-time algorithms.
IEEE Trans. on CAD of Integrated Circuits and Systems 16(3): 309-315 (1997) |
| 1996 |
|---|
| 15 | EE | Dimitrios Kagaris,
Spyros Tragoudas:
A multiseed counter TPG with performance guarantee.
ICCD 1996: 34-39 |
| 14 | EE | Dimitrios Kagaris,
Spyros Tragoudas:
Generating deterministic unordered test patterns with counters.
VTS 1996: 374-379 |
| 13 | EE | Dimitrios Kagaris,
Spyros Tragoudas:
A fast algorithm for minimizing FPGA combinational and sequential modules.
ACM Trans. Design Autom. Electr. Syst. 1(3): 341-351 (1996) |
| 12 | | Dimitrios Kagaris,
Spyros Tragoudas:
Retiming-Based Partial Scan.
IEEE Trans. Computers 45(1): 75-87 (1996) |
| 11 | | Dimitrios Kagaris,
Spyros Tragoudas,
Amitava Majumdar:
On the Use of Counters for Reproducing Deterministic Test Sets.
IEEE Trans. Computers 45(12): 1405-1419 (1996) |
| 1995 |
|---|
| 10 | EE | Dimitrios Kagaris,
Spyros Tragoudas,
Grammati E. Pantziou,
Christos D. Zaroliagis:
Quickest paths: parallelization and dynamization .
HICSS (2) 1995: 39-40 |
| 9 | | Dimitrios Kagaris,
Spyros Tragoudas,
Grammati E. Pantziou,
Christos D. Zaroliagis:
On the Computation of Fast Data Transmissions in Networks with Capacities and Delays.
WADS 1995: 291-302 |
| 8 | EE | Dimitrios Kagaris,
Spyros Tragoudas,
Dinesh Bhatia:
Pseudo-exhaustive built-in TPG for sequential circuits.
IEEE Trans. on CAD of Integrated Circuits and Systems 14(9): 1160-1171 (1995) |
| 7 | EE | Dimitrios Kagaris,
Spyros Tragoudas:
Avoiding linear dependencies in LFSR test pattern generators.
J. Electronic Testing 6(2): 229-241 (1995) |
| 1994 |
|---|
| 6 | | Dimitrios Kagaris,
Spyros Tragoudas:
A Class of Good Characteristics Polynomials for LFSR Test Pattern Generators.
ICCD 1994: 292-295 |
| 5 | EE | Dimitrios Kagaris,
Fillia Makedon,
Spyros Tragoudas:
A method for pseudo-exhaustive test pattern generation.
IEEE Trans. on CAD of Integrated Circuits and Systems 13(9): 1170-1178 (1994) |
| 1993 |
|---|
| 4 | EE | Dimitrios Kagaris,
Spyros Tragoudas:
Partial Scan with Retiming.
DAC 1993: 249-254 |
| 3 | | Dimitrios Kagaris,
Spyros Tragoudas,
Dinesh Bhatia:
Pseudoexhaustive BIST for Sequential Circuits.
ICCD 1993: 523-527 |
| 2 | EE | Dimitrios Kagaris,
Spyros Tragoudas:
Cost-effective LFSR synthesis for optimal pseudoexhaustive BIST test sets.
IEEE Trans. VLSI Syst. 1(4): 526-536 (1993) |
| 1992 |
|---|
| 1 | | Dimitrios Kagaris,
Fillia Makedon,
Spyros Tragoudas:
On Minimizing Hardware Overhead for Pseudoexhaustive Circuit Testability.
ICCD 1992: 358-364 |
