| 1996 |
|---|
| 4 | EE | M. Miegler,
Werner Wolz:
Development of test programs in a virtual test environment.
VTS 1996: 99-105 |
| 1992 |
|---|
| 3 | | R. Scharf,
C. Kuntzsch,
Klaus Helmreich,
Werner Wolz,
Klaus D. Müller-Glaser:
DRC-based Selection of Optimal Probing Points for Chip-Internal Measurements.
ITC 1992: 840-847 |
| 2 | | R. Arnold,
M. Chowanetz,
Werner Wolz,
Klaus D. Müller-Glaser:
Test/Agent: CAD-integrated Automatic Generation of Test Programs.
ITC 1992: 854-859 |
| 1991 |
|---|
| 1 | | Klaus Helmreich,
Peter Nagel,
Werner Wolz,
Klaus D. Müller-Glaser:
An Approach to Chip-Internal Current Monitoring and Measurement Using an Electron Beam Tester.
ITC 1991: 256-262 |
