| 2001 |
|---|
| 4 | EE | Julie Segal,
Alvin Jee,
David Y. Lepejian,
Ben Chu:
Using Electrical Bitmap Results from Embedded Memory to Enhance Yield.
IEEE Design & Test of Computers 18(3): 28-39 (2001) |
| 2000 |
|---|
| 3 | EE | Yervant Zorian,
Michael Nicolaidis,
Peter Muhmenthaler,
David Y. Lepejian,
Chris W. H. Strolenberg,
Kees Veelenturf:
Tutorial Statement.
DATE 2000: 66 |
| 1998 |
|---|
| 2 | | Meh-Ron Amerian,
William D. Atwell Jr.,
Ian Burgess,
Gary D. Fleeman,
David Y. Lepejian,
T. W. Williams,
Farzad Zarrinfar,
Yervant Zorian:
A D&T Roundtable: Testing Mixed Logic and DRAM Chips.
IEEE Design & Test of Computers 15(2): 86-92 (1998) |
| 1996 |
|---|
| 1 | EE | R. L. Campbell,
P. Kuekes,
David Y. Lepejian,
W. Maly,
Michael Nicolaidis,
Alex Orailoglu:
Can Defect-Tolerant Chips Better Meet the Quality Challenge?
VTS 1996: 362-363 |
