| |
| 1996 | ||
|---|---|---|
| 3 | EE | S. Crepaux-Motte, Mireille Jacomino, Rene David: An algebraic method for delay fault testing. VTS 1996: 308-315 |
| 1990 | ||
| 2 | EE | Rene David, S. Rahal, J. L. Rainard: Some relationships between delay testing and stuck-open testing in CMOS circuits. EURO-DAC 1990: 339-343 |
| 1987 | ||
| 1 | Mireille Jacomino, J. L. Rainard, Rene David: Fault Detection By Consumption Measurement in CMOS Circuits. Fehlertolerierende Rechensysteme 1987: 83-94 | |
| 1 | S. Crepaux-Motte | [3] |
| 2 | Mireille Jacomino | [1] [3] |
| 3 | S. Rahal | [2] |
| 4 | J. L. Rainard | [1] [2] |