2009 |
65 | EE | Michele Favalli,
Marcello Dalpasso:
How Many Test Vectors We Need to Detect a Bridging Fault?
J. Electronic Testing 25(1): 79-95 (2009) |
2007 |
64 | EE | Michele Favalli,
Cecilia Metra:
Interactive presentation: Pulse propagation for the detection of small delay defects.
DATE 2007: 1295-1300 |
63 | EE | Michele Favalli:
Delay Fault Detection Problems in Circuits Featuring a Low Combinational Depth.
DFT 2007: 170-178 |
62 | EE | Michele Favalli,
Marcello Dalpasso:
High Quality Test Vectors for Bridging Faults in the Presence of IC's Parameters Variations.
DFT 2007: 448-456 |
2006 |
61 | EE | Michele Favalli:
Diversity Analysis in the Presence of Delay Faults Affecting Duplex Systems.
IEEE Trans. Computers 55(3): 348-352 (2006) |
2005 |
60 | EE | Michele Favalli:
A fuzzy model for path delay fault detection.
IEEE Trans. VLSI Syst. 13(8): 943-956 (2005) |
2004 |
59 | EE | Michele Favalli:
"Victim Gate" Crosstalk Fault Model.
DFT 2004: 191-199 |
58 | EE | Michele Favalli:
Annotated Bit Flip Fault Model.
DFT 2004: 366-376 |
57 | EE | Michele Favalli,
Cecilia Metra:
TMR voting in the presence of crosstalk faults at the voter inputs.
IEEE Transactions on Reliability 53(3): 342-348 (2004) |
2003 |
56 | EE | Cecilia Metra,
Luca Schiano,
Michele Favalli:
Concurrent detection of power supply noise.
IEEE Transactions on Reliability 52(4): 469-475 (2003) |
55 | EE | Cecilia Metra,
Stefano Di Francescantonio,
Michele Favalli,
Bruno Riccò:
Scan flip-flops with on-line testing ability with respect to input delay and crosstalk faults.
Microelectronics Journal 34(1): 23-29 (2003) |
2002 |
54 | EE | Michele Favalli,
Marcello Dalpasso:
An Evolutionary Approach to the Design of On-Chip Pseudorandom Test Pattern Generators.
DATE 2002: 1122 |
53 | EE | Michele Favalli,
Cecilia Metra:
Problems Due to Open Faults in the Interconnections of Self-Checking Data-Paths.
DATE 2002: 612-619 |
52 | EE | Cecilia Metra,
Luca Schiano,
Bruno Riccò,
Michele Favalli:
Self-Checking Scheme for the On-Line Testing of Power Supply Noise.
DATE 2002: 832-836 |
51 | EE | Michele Favalli,
Cecilia Metra:
Online Testing Approach for Very Deep-Submicron ICs.
IEEE Design & Test of Computers 19(2): 16-23 (2002) |
50 | EE | Michele Favalli,
Marcello Dalpasso:
Bridging fault modeling and simulation for deep submicron CMOS ICs.
IEEE Trans. on CAD of Integrated Circuits and Systems 21(8): 941-953 (2002) |
49 | EE | Michele Favalli,
Cecilia Metra:
Single Output Distributed Two-Rail Checker with Diagnosing Capabilities for Bus Based Self-Checking Architectures.
J. Electronic Testing 18(3): 273-283 (2002) |
48 | EE | Cecilia Metra,
Michele Favalli,
Stefano Di Francescantonio,
Bruno Riccò:
On-Chip Clock Faults' Detector.
J. Electronic Testing 18(4-5): 555-564 (2002) |
2001 |
47 | EE | Michele Favalli,
Cecilia Metra:
Optimization of error detecting codes for the detection of crosstalk originated errors.
DATE 2001: 290-296 |
46 | EE | Michele Favalli,
Cecilia Metra:
Single Output Distributed Two-Rail Checker with Diagnosing Capabilities for Bus Based Self-Checking Architectures.
IOLTW 2001: 100-105 |
2000 |
45 | EE | Cecilia Metra,
Michele Favalli,
Bruno Riccò:
On-Line Testing and Diagnosis of Bus Lines with respect to Intermediate Voltage Values.
DATE 2000: 763 |
44 | EE | Marcello Dalpasso,
Alessandro Bogliolo,
Luca Benini,
Michele Favalli:
Virtual Fault Simulation of Distributed IP-Based Designs.
DATE 2000: 99- |
43 | EE | Cecilia Metra,
Michele Favalli,
Bruno Riccò:
Self-Checking Detection and Diagnosis of Transient, Delay, and Crosstalk Faults Affecting Bus Lines.
IEEE Trans. Computers 49(6): 560-574 (2000) |
42 | EE | Alessandro Bogliolo,
Michele Favalli,
Maurizio Damiani:
Enabling testability of fault-tolerant circuits by means of IDDQ-checkable voters.
IEEE Trans. VLSI Syst. 8(4): 415-419 (2000) |
41 | EE | Michele Favalli,
Cecilia Metra:
Bridging Faults in Pipelined Circuits.
J. Electronic Testing 16(6): 617-629 (2000) |
1999 |
40 | EE | Michele Favalli,
Cecilia Metra:
On the Design of Self-Checking Functional Units Based on Shannon Circuits.
DATE 1999: 368-375 |
39 | EE | Michele Favalli,
Cecilia Metra:
Bus crosstalk fault-detection capabilities of error-detecting codes for on-line testing.
IEEE Trans. VLSI Syst. 7(3): 392-396 (1999) |
1998 |
38 | EE | Cecilia Metra,
Michele Favalli,
Bruno Riccò:
Highly Testable and Compact 1-out-of-n Code Checker with Single Output.
DATE 1998: 981-982 |
37 | EE | Cecilia Metra,
Michele Favalli,
Bruno Riccò:
Signal Coding Technique and CMOS Gates for Strongly Fault-Secure Combinational Functional Blocks.
DFT 1998: 174-182 |
36 | EE | Cecilia Metra,
Michele Favalli,
Bruno Riccò:
On-line detection of logic errors due to crosstalk, delay, and transient faults.
ITC 1998: 524-533 |
35 | EE | Cecilia Metra,
Michele Favalli,
Bruno Riccò:
Concurrent Checking of Clock Signal Correctness.
IEEE Design & Test of Computers 15(4): 42-48 (1998) |
1997 |
34 | EE | Cecilia Metra,
Michele Favalli,
Bruno Riccò:
Compact and low power on-line self-testing voting scheme.
DFT 1997: 137-147 |
33 | EE | Michele Favalli,
Cecilia Metra:
Low-level error recovery mechanism for self-checking sequential circuits.
DFT 1997: 234-242 |
32 | EE | Michele Favalli,
Cecilia Metra:
Testing scheme for IC's clocks.
ED&TC 1997: 445-449 |
31 | | Cecilia Metra,
Michele Favalli,
Bruno Riccò:
On-Line Testing Scheme for Clock's Faults.
ITC 1997: 587-596 |
30 | EE | Cecilia Metra,
Michele Favalli,
Bruno Riccò:
Highly testable and compact single output comparator.
VTS 1997: 210-215 |
29 | EE | Marcello Dalpasso,
Michele Favalli:
A method for increasing the IDDQ testability.
IEEE Trans. on CAD of Integrated Circuits and Systems 16(10): 1186-1188 (1997) |
28 | EE | Cecilia Metra,
Michele Favalli,
Piero Olivo,
Bruno Riccò:
On-line detection of bridging and delay faults in functional blocks of CMOS self-checking circuits.
IEEE Trans. on CAD of Integrated Circuits and Systems 16(7): 770-776 (1997) |
27 | EE | Michele Favalli,
Marcello Dalpasso:
Symbolic Handling of Bridging Fault Effects.
J. Electronic Testing 10(3): 271-276 (1997) |
1996 |
26 | EE | Cecilia Metra,
Michele Favalli,
Bruno Riccò:
Embedded two-rail checkers with on-line testing ability.
VTS 1996: 145-150 |
25 | EE | Michele Favalli,
Cecilia Metra:
Sensing circuit for on-line detection of delay faults.
IEEE Trans. VLSI Syst. 4(1): 130-133 (1996) |
24 | EE | Michele Favalli,
Marcello Dalpasso,
Piero Olivo:
Modeling and simulation of broken connections in CMOS IC's.
IEEE Trans. on CAD of Integrated Circuits and Systems 15(7): 808-814 (1996) |
1995 |
23 | EE | Michele Favalli,
Luca Benini:
Analysis of glitch power dissipation in CMOS ICs.
ISLPD 1995: 123-128 |
22 | EE | Marcello Dalpasso,
Michele Favalli,
Piero Olivo:
Test pattern generation for I/sub DDQ/: increasing test quality.
VTS 1995: 304-309 |
21 | EE | Cecilia Metra,
Michele Favalli,
Piero Olivo,
Bruno Riccò:
Design of CMOS checkers with improved testability of bridging and transistor stuck-on faults.
J. Electronic Testing 6(1): 7-22 (1995) |
1994 |
20 | | Cecilia Metra,
Michele Favalli,
Bruno Riccò:
CMOS Self Checking Circuits with Faulty Sequential Functional Block.
DFT 1994: 133-141 |
19 | | Cecilia Metra,
Michele Favalli,
Bruno Riccò:
Highly Testable and Compact 1-out-of-n CMOS Checkers.
DFT 1994: 142-150 |
18 | | Michele Favalli,
Marcello Dalpasso,
Piero Olivo,
Bruno Riccò:
Modeling of Broken Connections Faults in CMOS ICs.
EDAC-ETC-EUROASIC 1994: 159-164 |
1993 |
17 | | Cecilia Metra,
Michele Favalli,
Piero Olivo,
Bruno Riccò:
Design Rules for CMOS Self Checking Circuits with Parametric Faults in the Functional Block.
DFT 1993: 271-278 |
16 | | Cecilia Metra,
Michele Favalli,
Piero Olivo,
Bruno Riccò:
A Highly Testable 1-out-of-3 CMOS Checker.
DFT 1993: 279-286 |
15 | | Michele Favalli,
Marcello Dalpasso,
Piero Olivo,
Bruno Riccò:
Analyss of Dynamic Effects of Resistive Bridging Faults in CMOS and BiCMOS Digital ICs.
ITC 1993: 865-874 |
14 | EE | Michele Favalli,
Marcello Dalpasso,
Piero Olivo,
Bruno Riccò:
Analysis of resistive bridging fault detection in BiCMOS digital ICs.
IEEE Trans. VLSI Syst. 1(3): 342-355 (1993) |
13 | EE | Marcello Dalpasso,
Michele Favalli,
Piero Olivo,
Bruno Riccò:
Fault simulation of parametric bridging faults in CMOS IC's.
IEEE Trans. on CAD of Integrated Circuits and Systems 12(9): 1403-1410 (1993) |
1992 |
12 | | Michele Favalli,
Marcello Dalpasso,
Piero Olivo,
Bruno Riccò:
Analysis of Steady State Detection of Resistive Bridging Faults in BiCMOS Digital ICs.
ITC 1992: 466-475 |
11 | | Marcello Dalpasso,
Michele Favalli,
Piero Olivo,
Bruno Riccò:
Parametric Bridging Fault Characterization for the Fault Simulation of Library-Based ICs.
ITC 1992: 486-495 |
10 | | Cecilia Metra,
Michele Favalli,
Piero Olivo,
Bruno Riccò:
CMOS Checkers with Testable Bridging and Transistor Stuck-on Faults.
ITC 1992: 948-957 |
9 | EE | Michele Favalli,
Piero Olivo,
Bruno Riccò:
A probabilistic fault model for `analog' faults in digital CMOS circuits.
IEEE Trans. on CAD of Integrated Circuits and Systems 11(11): 1459-1462 (1992) |
8 | EE | Silvia Ercolani,
Michele Favalli,
Maurizio Damiani,
Piero Olivo,
Bruno Riccò:
Testability measures in pseudorandom testing.
IEEE Trans. on CAD of Integrated Circuits and Systems 11(6): 794-800 (1992) |
7 | EE | Michele Favalli,
Piero Olivo,
Bruno Riccò:
Dynamic effects in the detection of bridging faults in CMOS ICs.
J. Electronic Testing 3(3): 197-205 (1992) |
1991 |
6 | EE | Michele Favalli,
Piero Olivo,
Bruno Riccò:
A novel critical path heuristic for fast fault grading.
IEEE Trans. on CAD of Integrated Circuits and Systems 10(4): 544-548 (1991) |
5 | EE | Michele Favalli,
Piero Olivo,
Maurizio Damiani,
Bruno Riccò:
Fault simulation of unconventional faults in CMOS circuits.
IEEE Trans. on CAD of Integrated Circuits and Systems 10(5): 677-682 (1991) |
4 | EE | Michele Favalli,
Piero Olivo,
Bruno Riccò,
Fabio Somenzi:
Fault simulation for general FCMOS ICs.
J. Electronic Testing 2(2): 181-190 (1991) |
1990 |
3 | EE | Maurizio Damiani,
Piero Olivo,
Michele Favalli,
Silvia Ercolani,
Bruno Riccò:
Aliasing in signature analysis testing with multiple input shift registers.
IEEE Trans. on CAD of Integrated Circuits and Systems 9(12): 1344-1353 (1990) |
1989 |
2 | | Michele Favalli,
Piero Olivo,
Maurizio Damiani,
Bruno Riccò:
CMOS Design for Improved IC Testability.
ITC 1989: 934 |
1 | EE | Maurizio Damiani,
Piero Olivo,
Michele Favalli,
Bruno Riccò:
An analytical model for the aliasing probability in signature analysis testing.
IEEE Trans. on CAD of Integrated Circuits and Systems 8(11): 1133-1144 (1989) |