Sami A. Al-Arian

2000
16	EE	Bassam Shaer, Sami A. Al-Arian, David L. Landis: Partitioning sequential circuits for pseudoexhaustive testing. IEEE Trans. VLSI Syst. 8(5): 534-541 (2000)
15	EE	Bassam Shaer, David L. Landis, Sami A. Al-Arian: Partitioning algorithm to enhance pseudoexhaustive testing of digital VLSI circuits. IEEE Trans. VLSI Syst. 8(6): 750-754 (2000)
1999
14	EE	Bassam Shaer, Sami A. Al-Arian, David L. Landis: Pseudo-Exhaustive Testing of Sequential Circuits. Great Lakes Symposium on VLSI 1999: 109-
1998
13	EE	Bassam Shaer, Sami A. Al-Arian, David L. Landis: Partitioning algorithm to enhance VLSI testability. ACM Southeast Regional Conference 1998: 121-129
1997
12	EE	Musaed A. Al-Kharji, Sami A. Al-Arian: A New Heuristic Algorithm for Estimating Signal and Detection Probabilities. Great Lakes Symposium on VLSI 1997: 26-31
1996
11	EE	Stephan P. Athan, David L. Landis, Sami A. Al-Arian: A novel built-in current sensor for I/sub DDQ/ testing of deep submicron CMOS ICs. VTS 1996: 118-123
1994
10		Sami A. Al-Arian, Randy E. Bolling: Improving the Testability of VLSI Circuits through Partitioning. ISCAS 1994: 199-202
9		Randy E. Bolling, Sami A. Al-Arian: Reconfigurable Linear Feedback Register Design, Analysis & Applications. ISCAS 1994: 87-90
1993
8	EE	Warren H. Debany Jr., Kevin A. Kwiat, Sami A. Al-Arian: A Method for Consistent Fault Coverage Reporting. IEEE Design & Test of Computers 10(3): 68-79 (1993)
1992
7		Sami A. Al-Arian, Musaed A. Al-Kharji: Fault Simulation and Test Generation by Fault Sampling Techniques. ICCD 1992: 365-368
1991
6		Sami A. Al-Arian, Hussam Y. Abujbara, Jim C. Ruel: A Unique Approach to Built-in-Self-Test Circuit Design. ICCD 1991: 270-274
1990
5	EE	Sami A. Al-Arian, Hari P. Kunamneni: Three approaches to design fault tolerant programmable logic arrays. ACM Southeast Regional Conference 1990: 151-158
4	EE	Hussam Y. Abujbara, Sami A. Al-Arian: Self-testing and self-reconfiguration architecture for 2-D WSI arrays. SPDP 1990: 527-530
1989
3		Sami A. Al-Arian: Design and Test in the Universities. ITC 1989: 245-245
1988
2		Sami A. Al-Arian, Kevin A. Kwiat: Defining a Standard for Fault Simulator Evaluation. ITC 1988: 1001
1984
1		Dharma P. Agrawal, Sami A. Al-Arian: Comprehensive Fault Model and Testing of CMOS Circuits. ITC 1984: 218-223

Coauthor Index

1	Hussam Y. Abujbara	[4] [6]
2	Dharma P. Agrawal	[1]
3	Musaed A. Al-Kharji	[7] [12]
4	Stephan P. Athan	[11]
5	Randy E. Bolling	[9] [10]
6	Warren H. Debany Jr.	[8]
7	Hari P. Kunamneni	[5]
8	Kevin A. Kwiat	[2] [8]
9	David L. Landis	[11] [13] [14] [15] [16]
10	Jim C. Ruel	[6]
11	Bassam Shaer	[13] [14] [15] [16]

Colors in the list of coauthors