Dimitris Gizopoulos

2009
64	EE	George Xenoulis, Dimitris Gizopoulos, Mihalis Psarakis, Antonis M. Paschalis: Instruction-Based Online Periodic Self-Testing of Microprocessors with Floating-Point Units. IEEE Trans. Dependable Sec. Comput. 6(2): 124-134 (2009)
63	EE	Dimitris Gizopoulos: Online Periodic Self-Test Scheduling for Real-Time Processor-Based Systems Dependability Enhancement. IEEE Trans. Dependable Sec. Comput. 6(2): 152-158 (2009)
2008
62		Cristiana Bolchini, Yong-Bin Kim, Dimitris Gizopoulos, Mohammad Tehranipoor: 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 1-3 October 2008, Boston, MA, USA IEEE Computer Society 2008
61	EE	A. Apostolakis, Dimitris Gizopoulos, Mihalis Psarakis, Antonis M. Paschalis: Functional Self-Testing for Bus-Based Symmetric Multiprocessors. DATE 2008: 1304-1309
60	EE	Dimitris Gizopoulos, Kaushik Roy, Patrick Girard, Nicola Nicolici, Xiaoqing Wen: Power-Aware Testing and Test Strategies for Low Power Devices. DATE 2008
59	EE	Dimitris Gizopoulos, Kaushik Roy, Subhasish Mitra, Pia Sanda: Soft Errors: System Effects, Protection Techniques and Case Studies. DATE 2008
58	EE	Nektarios Kranitis, Andreas Merentitis, George Theodorou, Antonis M. Paschalis, Dimitris Gizopoulos: Hybrid-SBST Methodology for Efficient Testing of Processor Cores. IEEE Design & Test of Computers 25(1): 64-75 (2008)
57	EE	Ioannis Voyiatzis, Antonis M. Paschalis, Dimitris Gizopoulos, Constantin Halatsis, Frosso S. Makri, Miltiadis Hatzimihail: An Input Vector Monitoring Concurrent BIST Architecture Based on a Precomputed Test Set. IEEE Trans. Computers 57(8): 1012-1022 (2008)
56	EE	Dimitris Gizopoulos, Mihalis Psarakis, Miltiadis Hatzimihail, M. Maniatakos, Antonis M. Paschalis, Anand Raghunathan, Srivaths Ravi: Systematic Software-Based Self-Test for Pipelined Processors. IEEE Trans. VLSI Syst. 16(11): 1441-1453 (2008)
2007
55	EE	George Xenoulis, Mihalis Psarakis, Dimitris Gizopoulos, Antonis M. Paschalis: On-Line Periodic Self-Testing of High-Speed Floating-Point Units in Microprocessors. DFT 2007: 379-387
54	EE	Andreas Merentitis, Nektarios Kranitis, Antonis M. Paschalis, Dimitris Gizopoulos: Selecting Power-Optimal SBST Routines for On-Line Processor Testing. European Test Symposium 2007: 111-116
53	EE	A. Apostolakis, Mihalis Psarakis, Dimitris Gizopoulos, Antonis M. Paschalis: A Functional Self-Test Approach for Peripheral Cores in Processor-Based SoCs. IOLTS 2007: 271-276
52	EE	Dimitris Gizopoulos, Robert C. Aitken, S. Kundu: Guest Editorial: Special Section on "Autonomous Silicon Validation and Testing of Microprocessors and Microprocessor-Based Systems". IEEE Trans. VLSI Syst. 15(5): 493-494 (2007)
51	EE	A. Apostolakis, Mihalis Psarakis, Dimitris Gizopoulos, Antonis M. Paschalis: Functional Processor-Based Testing of Communication Peripherals in Systems-on-Chip. IEEE Trans. VLSI Syst. 15(8): 971-975 (2007)
2006
50	EE	Mihalis Psarakis, Dimitris Gizopoulos, Miltiadis Hatzimihail, Antonis M. Paschalis, Anand Raghunathan, Srivaths Ravi: Systematic software-based self-test for pipelined processors. DAC 2006: 393-398
49	EE	Nektarios Kranitis, Andreas Merentitis, N. Laoutaris, George Theodorou, Antonis M. Paschalis, Dimitris Gizopoulos, Constantin Halatsis: Optimal periodic testing of intermittent faults in embedded pipelined processor applications. DATE 2006: 65-70
48	EE	P. Kenterlis, Nektarios Kranitis, Antonis M. Paschalis, Dimitris Gizopoulos, Mihalis Psarakis: A Low-Cost SEU Fault Emulation Platform for SRAM-Based FPGAs. IOLTS 2006: 235-241
47	EE	George Xenoulis, Mihalis Psarakis, Dimitris Gizopoulos, Antonis M. Paschalis: Testability Analysis and Scalable Test Generation for High-Speed Floating-Point Units. IEEE Trans. Computers 55(11): 1449-1457 (2006)
46	EE	Bashir M. Al-Hashimi, Dimitris Gizopoulos, Manoj Sachdev, Adit D. Singh: New JETTA Editors, 2006. J. Electronic Testing 22(1): 9-10 (2006)
2005
45	EE	Miltiadis Hatzimihail, Mihalis Psarakis, George Xenoulis, Dimitris Gizopoulos, Antonis M. Paschalis: Software-Based Self-Test for Pipelined Processors: A Case Study. DFT 2005: 535-543
44	EE	Ioannis Voyiatzis, Dimitris Gizopoulos, Antonis M. Paschalis: Accumulator-Based Weighted Pattern Generation. IOLTS 2005: 215-220
43	EE	George Xenoulis, Mihalis Psarakis, Dimitris Gizopoulos, Antonis M. Paschalis: Test Generation Methodology for High-Speed Floating Point Adders. IOLTS 2005: 227-232
42	EE	Nektarios Kranitis, Antonis M. Paschalis, Dimitris Gizopoulos, George Xenoulis: Software-Based Self-Testing of Embedded Processors. IEEE Trans. Computers 54(4): 461-475 (2005)
41	EE	Ioannis Voyiatzis, Dimitris Gizopoulos, Antonis M. Paschalis: Accumulator-based test generation for robust sequential fault testing in DSP cores in near-optimal time. IEEE Trans. VLSI Syst. 13(9): 1079-1086 (2005)
40	EE	Antonis M. Paschalis, Dimitris Gizopoulos: Effective software-based self-test strategies for on-line periodic testing of embedded processors. IEEE Trans. on CAD of Integrated Circuits and Systems 24(1): 88-99 (2005)
39	EE	Mihalis Psarakis, Dimitris Gizopoulos, Antonis M. Paschalis: Built-in sequential fault self-testing of array multipliers. IEEE Trans. on CAD of Integrated Circuits and Systems 24(3): 449-460 (2005)
38	EE	Ioannis Voyiatzis, Antonis M. Paschalis, Dimitris Gizopoulos, Nektarios Kranitis, Constantin Halatsis: A concurrent built-in self-test architecture based on a self-testing RAM. IEEE Transactions on Reliability 54(1): 69-78 (2005)
2004
37	EE	Antonis M. Paschalis, Dimitris Gizopoulos: Effective Software-Based Self-Test Strategies for On-Line Periodic Testing of Embedded Processors. DATE 2004: 578-583
36	EE	Yervant Zorian, Dimitris Gizopoulos, Cary Vandenberg, Philippe Magarshack: Guest Editors' Introduction: Design for Yield and Reliability. IEEE Design & Test of Computers 21(3): 177-182 (2004)
35	EE	Dimitris Gizopoulos: Low-cost, on-line self-testing of processor cores based on embedded software routines. Microelectronics Journal 35(5): 443-449 (2004)
2003
34	EE	Nektarios Kranitis, George Xenoulis, Dimitris Gizopoulos, Antonis M. Paschalis, Yervant Zorian: Low-Cost Software-Based Self-Testing of RISC Processor Cores. DATE 2003: 10714-10719
33	EE	Konstantinos Rokas, Yiorgos Makris, Dimitris Gizopoulos: Low Cost Convolutional Code Based Concurrent Error Detection in FSMs. DFT 2003: 344-351
32	EE	George Xenoulis, Dimitris Gizopoulos, Nektarios Kranitis, Antonis M. Paschalis: Low-Cost, On-Line Software-Based Self-Testing of Embedded Processor Cores. IOLTS 2003: 149-
31	EE	Nektarios Kranitis, George Xenoulis, Antonis M. Paschalis, Dimitris Gizopoulos, Yervant Zorian: Application and Analysis of RT-Level Software-Based Self-Testing for Embedded Processor Cores. ITC 2003: 431-440
30	EE	Nektarios Kranitis, Antonis M. Paschalis, Dimitris Gizopoulos, Yervant Zorian: Instruction-Based Self-Testing of Processor Cores. J. Electronic Testing 19(2): 103-112 (2003)
29	EE	Dimitris Gizopoulos, Mihalis Psarakis, Antonis M. Paschalis, Yervant Zorian: Easily Testable Cellular Carry Lookahead Adders. J. Electronic Testing 19(3): 285-298 (2003)
2002
28	EE	Nektarios Kranitis, Antonis M. Paschalis, Dimitris Gizopoulos, Yervant Zorian: Effective Software Self-Test Methodology for Processor Cores. DATE 2002: 592-597
27	EE	Nektarios Kranitis, Antonis M. Paschalis, Dimitris Gizopoulos, Yervant Zorian: Instruction-Based Self-Testing of Processor Cores. VTS 2002: 223-228
2001
26	EE	Antonis M. Paschalis, Dimitris Gizopoulos, Nektarios Kranitis, Mihalis Psarakis, Yervant Zorian: Deterministic software-based self-testing of embedded processor cores. DATE 2001: 92-96
25	EE	Nektarios Kranitis, Mihalis Psarakis, Dimitris Gizopoulos, Antonis M. Paschalis, Yervant Zorian: An Effective Deterministic BIST Scheme for Shifter/Accumulator Pairs in Datapaths. ISQED 2001: 343-349
24	EE	Mihalis Psarakis, Antonis M. Paschalis, Nektarios Kranitis, Dimitris Gizopoulos, Yervant Zorian: Robust and Low-Cost BIST Architectures for Sequential Fault Testing in Datapath Multipliers. VTS 2001: 15-21
23	EE	Nektarios Kranitis, Antonis M. Paschalis, Dimitris Gizopoulos, Mihalis Psarakis, Yervant Zorian: An Effective Deterministic BIST Scheme for Shifter/Accumulator Pairs in Datapaths. J. Electronic Testing 17(2): 97-107 (2001)
2000
22	EE	Dimitris Gizopoulos, Nektarios Kranitis, Mihalis Psarakis, Antonis M. Paschalis, Yervant Zorian: Effective Low Power BIST for Datapaths. DATE 2000: 757
21	EE	Dimitris Gizopoulos, Nektarios Kranitis, Mihalis Psarakis, Antonis M. Paschalis, Yervant Zorian: Low Power/Energy BIST Scheme for Datapaths. VTS 2000: 23-28
20	EE	Nektarios Kranitis, Dimitris Gizopoulos, Antonis M. Paschalis, Mihalis Psarakis, Yervant Zorian: Power-/Energy Efficient BIST Schemes for Processor Data Paths. IEEE Design & Test of Computers 17(4): 15-28 (2000)
19	EE	Mihalis Psarakis, Dimitris Gizopoulos, Antonis M. Paschalis, Yervant Zorian: Sequential Fault Modeling and Test Pattern Generation for CMOS Iterative Logic Arrays. IEEE Trans. Computers 49(10): 1083-1099 (2000)
1999
18	EE	Antonis M. Paschalis, Nektarios Kranitis, Mihalis Psarakis, Dimitris Gizopoulos, Yervant Zorian: An Effective BIST Architecture for Fast Multiplier Cores. DATE 1999: 117-121
17	EE	Mihalis Psarakis, Antonis M. Paschalis, Dimitris Gizopoulos, Yervant Zorian: An Effective BIST Architecture for Sequential Fault Testing in Array Multipliers. VTS 1999: 252-259
16		Dimitris Gizopoulos, Antonis M. Paschalis, Yervant Zorian: An Effective Built-In Self-Test Scheme for Parallel Multipliers. IEEE Trans. Computers 48(9): 936-950 (1999)
1998
15	EE	Mihalis Psarakis, Dimitris Gizopoulos, Antonis M. Paschalis, Yervant Zorian: Robustly Testable Array Multipliers under Realistic Sequential Cell Fault Model. VTS 1998: 152-157
14	EE	Dimitris Gizopoulos, Antonis M. Paschalis, Yervant Zorian: Effective Built-In Self-Test for Booth Multipliers. IEEE Design & Test of Computers 15(3): 105-111 (1998)
13	EE	Antonis M. Paschalis, Dimitris Gizopoulos, Nikolaos Gaitanis: Concurrent Delay Testing in Totally Self-Checking Systems. J. Electronic Testing 12(1-2): 55-61 (1998)
12	EE	Antonis M. Paschalis, Nikolaos Gaitanis, Dimitris Gizopoulos, Panagiotis Kostarakis: A Totally Self-Checking 1-out-of-3 Code Error Indicator. J. Electronic Testing 13(1): 61-66 (1998)
11	EE	Mihalis Psarakis, Dimitris Gizopoulos, Antonis M. Paschalis: Test Generation and Fault Simulation for Cell Fault Model using Stuck-at Fault Model based Test Tools. J. Electronic Testing 13(3): 315-319 (1998)
1997
10	EE	Antonis M. Paschalis, Nikolaos Gaitanis, Dimitris Gizopoulos, Panagiotis Kostarakis: A totally self-checking 1-out-of-3 code error indicator. ED&TC 1997: 450-454
9		Dimitris Gizopoulos, Antonis M. Paschalis, Yervant Zorian, Mihalis Psarakis: An Effective BIST Scheme for Arithmetic Logic Units. ITC 1997: 868-877
8	EE	Dimitris Gizopoulos, Mihalis Psarakis, Antonis M. Paschalis: Robust Sequential Fault Testing of Iterative Logic Arrays. VTS 1997: 238-244
1996
7		Dimitris Gizopoulos, Antonis M. Paschalis, Yervant Zorian: An Effective BIST Scheme for Datapaths. ITC 1996: 76-85
6	EE	Nikolaos Gaitanis, Dimitris Gizopoulos, Antonis M. Paschalis, Panagiotis Kostarakis: An asynchronous totally self-checking two-rail code error indicator. VTS 1996: 151-156
5	EE	Dimitris Gizopoulos, Dimitris Nikolos, Antonis M. Paschalis: Testing CMOS combinational iterative logic arrays for realistic faults. Integration 21(3): 209-228 (1996)
4	EE	Dimitris Gizopoulos, Dimitris Nikolos, Antonis M. Paschalis, Constantin Halatsis: C-Testable modified-Booth multipliers. J. Electronic Testing 8(3): 241-260 (1996)
1995
3	EE	Dimitris Gizopoulos, Antonis M. Paschalis, Yervant Zorian: An effective BIST scheme for carry-save and carry-propagate array multipliers. Asian Test Symposium 1995: 298-302
2		Dimitris Gizopoulos, Antonis M. Paschalis, Yervant Zorian: An Effective BIST Scheme for Booth Multipliers. ITC 1995: 824-833
1	EE	Dimitris Gizopoulos, Dimitris Nikolos, Antonis M. Paschalis: Testing combinational iterative logic arrays for realistic faults. VTS 1995: 35-41

Coauthor Index

1	Robert C. Aitken	[52]
2	Bashir M. Al-Hashimi	[46]
3	A. Apostolakis	[51] [53] [61]
4	Cristiana Bolchini	[62]
5	Nikolaos Gaitanis	[6] [10] [12] [13]
6	Patrick Girard	[60]
7	Constantin Halatsis (Constantine Halatsis, Constantinos Halatsis)	[4] [38] [49] [57]
8	Miltiadis Hatzimihail	[45] [50] [56] [57]
9	P. Kenterlis	[48]
10	Yong-Bin Kim	[62]
11	Panagiotis Kostarakis	[6] [10] [12]
12	Nektarios Kranitis	[18] [20] [21] [22] [23] [24] [25] [26] [27] [28] [30] [31] [32] [34] [38] [42] [48] [49] [54] [58]
13	S. Kundu	[52]
14	N. Laoutaris	[49]
15	Philippe Magarshack	[36]
16	Frosso S. Makri	[57]
17	Yiorgos Makris	[33]
18	M. Maniatakos	[56]
19	Andreas Merentitis	[49] [54] [58]
20	Subhasish Mitra	[59]
21	Nicola Nicolici	[60]
22	Dimitris Nikolos	[1] [4] [5]
23	Antonis M. Paschalis	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15] [16] [17] [18] [19] [20] [21] [22] [23] [24] [25] [26] [27] [28] [29] [30] [31] [32] [34] [37] [38] [39] [40] [41] [42] [43] [44] [45] [47] [48] [49] [50] [51] [53] [54] [55] [56] [57] [58] [61] [64]
24	Mihalis Psarakis	[8] [9] [11] [15] [17] [18] [19] [20] [21] [22] [23] [24] [25] [26] [29] [39] [43] [45] [47] [48] [50] [51] [53] [55] [56] [61] [64]
25	Anand Raghunathan	[50] [56]
26	Srivaths Ravi	[50] [56]
27	Konstantinos Rokas	[33]
28	Kaushik Roy	[59] [60]
29	Manoj Sachdev	[46]
30	Pia Sanda	[59]
31	Adit D. Singh	[46]
32	Mohammad Tehranipoor	[62]
33	George Theodorou	[49] [58]
34	Cary Vandenberg	[36]
35	Ioannis Voyiatzis	[38] [41] [44] [57]
36	Xiaoqing Wen	[60]
37	George Xenoulis	[31] [32] [34] [42] [43] [45] [47] [55] [64]
38	Yervant Zorian	[2] [3] [7] [9] [14] [15] [16] [17] [18] [19] [20] [21] [22] [23] [24] [25] [26] [27] [28] [29] [30] [31] [34] [36]

Colors in the list of coauthors