2008 |
20 | EE | Gurgen Harutunyan,
Valery A. Vardanian,
Yervant Zorian:
An Efficient March-Based Three-Phase Fault Location and Full Diagnosis Algorithm for Realistic Two-Operation Dynamic Faults in Random Access Memories.
VTS 2008: 95-100 |
2007 |
19 | | Gurgen Harutunyan,
Valery A. Vardanian,
Yervant Zorian:
A March-based Fault Location Algorithm with Partial and Full Diagnosis for All Simple Static Faults in Random Access Memories.
DDECS 2007: 145-148 |
18 | EE | Gurgen Harutunyan,
Valery A. Vardanian,
Yervant Zorian:
Minimal March Tests for Detection of Dynamic Faults in Random Access Memories.
J. Electronic Testing 23(1): 55-74 (2007) |
2006 |
17 | | Gurgen Harutunyan,
Valery A. Vardanian,
Yervant Zorian:
Minimal March-Based Fault Location Algorithm with Partial Diagnosis for all Static Faults in Random Access Memories.
DDECS 2006: 262-267 |
16 | EE | Gurgen Harutunyan,
Valery A. Vardanian,
Yervant Zorian:
Minimal March Tests for Dynamic Faults in Random Access Memories.
European Test Symposium 2006: 43-48 |
15 | EE | T. A. Gyonjyan,
Gurgen Harutunyan,
Valery A. Vardanian:
A March-Based Algorithm for Location and Full Diagnosis of All Unlinked Static Faults.
MTDT 2006: 9-14 |
14 | EE | Gurgen Harutunyan,
Valery A. Vardanian,
Y. Zorian Zorian:
Minimal March Test Algorithm for Detection of Linked Static Faults in Random Access Memories.
VTS 2006: 120-127 |
2005 |
13 | EE | Yervant Zorian,
Valery A. Vardanian,
K. Aleksanyan,
K. Amirkhanyan:
Impact of Soft Error Challenge on SoC Design.
IOLTS 2005: 63-68 |
12 | EE | Gurgen Harutunyan,
Valery A. Vardanian,
Yervant Zorian:
Minimal March Tests for Unlinked Static Faults in Random Access Memories.
VTS 2005: 53-59 |
2004 |
11 | EE | N. Derhacobian,
Valery A. Vardanian,
Yervant Zorian:
Embedded Memory Reliability: The SER Challenge.
MTDT 2004: 104-110 |
10 | EE | Samvel K. Shoukourian,
Valery A. Vardanian,
Yervant Zorian:
A Methodology for Design and Evaluation of Redundancy Allocation Algorithms.
VTS 2004: 249-260 |
9 | EE | Samvel K. Shoukourian,
Valery A. Vardanian,
Yervant Zorian:
SoC Yield Optimization via an Embedded-Memory Test and Repair Infrastructure.
IEEE Design & Test of Computers 21(3): 200-207 (2004) |
2002 |
8 | EE | Valery A. Vardanian,
Yervant Zorian:
A March-Based Fault Location Algorithm for Static Random Access Memories.
IOLTW 2002: 256-261 |
7 | EE | Valery A. Vardanian,
Yervant Zorian:
A March-Based Fault Location Algorithm for Static Random Access Memories.
MTDT 2002: 62-67 |
2001 |
6 | EE | Samvel K. Shoukourian,
Valery A. Vardanian,
Yervant Zorian:
An Approach for Evaluation of Redunancy Analysis Algorithms.
MTDT 2001: 51- |
2000 |
5 | EE | Valery A. Vardanian,
Liana B. Mirzoyan:
Improving the Error Detection Ability of Concurrent Checkers by Observation Point Insertion in the Circuit Under Check.
DATE 2000: 762 |
1997 |
4 | EE | Valery A. Vardanian:
Exact probabilistic analysis of error detection for parity checkers.
VTS 1997: 222-229 |
1996 |
3 | EE | Valery A. Vardanian:
On completely robust path delay fault testable realization of logic functions.
VTS 1996: 302-307 |
1994 |
2 | EE | Valery A. Vardanian:
On the Complexity of Dynamic Tests for Logic Functions.
Acta Cybern. 11(4): 333-344 (1994) |
1985 |
1 | | Valery A. Vardanian:
On the length of single dynamic tests for monotone Boolean functions.
FCT 1985: 442-449 |