Hong Helena Zheng
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1996
1
EE
Hong Helena Zheng,
Ashok Balivada
,
Jacob A. Abraham
: A novel test generation approach for parametric faults in linear analog circuits .
VTS 1996
: 470-475
Coauthor
Index
1
Jacob A. Abraham
[
1
]
2
Ashok Balivada
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
