| 2009 |
|---|
| 15 | EE | Faizal Karim,
Marco Ottavi,
Hamidreza Hashempour,
Vamsi Vankamamidi,
Konrad Walus,
André Ivanov,
Fabrizio Lombardi:
Modeling and Evaluating Errors Due to Random Clock Shifts in Quantum-Dot Cellular Automata Circuits.
J. Electronic Testing 25(1): 55-66 (2009) |
| 2008 |
|---|
| 14 | EE | Hamidreza Hashempour,
Fabrizio Lombardi:
Device Model for Ballistic CNFETs Using the First Conducting Band.
IEEE Design & Test of Computers 25(2): 178-186 (2008) |
| 2007 |
|---|
| 13 | EE | Hamidreza Hashempour,
Fabrizio Lombardi:
Circuit-level modeling and detection of metallic carbon nanotube defects in carbon nanotube FETs.
DATE 2007: 841-846 |
| 2006 |
|---|
| 12 | EE | Hamidreza Hashempour,
Fabrizio Lombardi:
A Novel Methodology for Functional Test Data Compression.
DFT 2006: 128-135 |
| 2005 |
|---|
| 11 | EE | Hamidreza Hashempour,
Fabrizio Lombardi:
Two dimensional reordering of functional test data for compression by ATE.
ACM Great Lakes Symposium on VLSI 2005: 188-192 |
| 10 | EE | Hamidreza Hashempour,
Luca Schiano,
Fabrizio Lombardi:
Enhancing error resilience for reliable compression of VLSI test data.
ACM Great Lakes Symposium on VLSI 2005: 371-376 |
| 9 | EE | Hamidreza Hashempour,
Luca Schiano,
Fabrizio Lombardi:
Evaluation of Error-Resilience for Reliable Compression of Test Data.
DATE 2005: 1284-1289 |
| 8 | EE | Hamidreza Hashempour,
Fabrizio Lombardi:
Application of Arithmetic Coding to Compression of VLSI Test Data.
IEEE Trans. Computers 54(9): 1166-1177 (2005) |
| 2004 |
|---|
| 7 | EE | Hamidreza Hashempour,
Fabrizio Lombardi:
Evaluation of heuristic techniques for test vector ordering.
ACM Great Lakes Symposium on VLSI 2004: 96-99 |
| 6 | EE | Hamidreza Hashempour,
Fabrizio Lombardi:
Compression of VLSI Test Data by Arithmetic Coding.
DFT 2004: 150-157 |
| 5 | EE | Hamidreza Hashempour,
Luca Schiano,
Fabrizio Lombardi:
Error-Resilient Test Data Compression Using Tunstall Codes.
DFT 2004: 316-323 |
| 2003 |
|---|
| 4 | EE | Hamidreza Hashempour,
Fabrizio Lombardi:
ATE-Amenable Test Data Compression with No Cyclic Scan.
DFT 2003: 151-158 |
| 3 | EE | Hamidreza Hashempour,
Fred J. Meyer,
Fabrizio Lombardi,
Farzin Karimi:
Hybrid Multisite Testing at Manufacturing.
ITC 2003: 927-936 |
| 2002 |
|---|
| 2 | EE | Hamidreza Hashempour,
Fred J. Meyer,
Fabrizio Lombardi:
Test Time Reduction in a Manufacturing Environment by Combining BIST and ATE.
DFT 2002: 186-194 |
| 1 | EE | Hamidreza Hashempour,
Yong-Bin Kim,
Nohpill Park:
A Test-Vector Generation Methodology for Crosstalk Noise Faults.
DFT 2002: 40-50 |
