Hamidreza Hashempour

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15EEFaizal Karim, Marco Ottavi, Hamidreza Hashempour, Vamsi Vankamamidi, Konrad Walus, André Ivanov, Fabrizio Lombardi: Modeling and Evaluating Errors Due to Random Clock Shifts in Quantum-Dot Cellular Automata Circuits. J. Electronic Testing 25(1): 55-66 (2009)
14EEHamidreza Hashempour, Fabrizio Lombardi: Device Model for Ballistic CNFETs Using the First Conducting Band. IEEE Design & Test of Computers 25(2): 178-186 (2008)
13EEHamidreza Hashempour, Fabrizio Lombardi: Circuit-level modeling and detection of metallic carbon nanotube defects in carbon nanotube FETs. DATE 2007: 841-846
12EEHamidreza Hashempour, Fabrizio Lombardi: A Novel Methodology for Functional Test Data Compression. DFT 2006: 128-135
11EEHamidreza Hashempour, Fabrizio Lombardi: Two dimensional reordering of functional test data for compression by ATE. ACM Great Lakes Symposium on VLSI 2005: 188-192
10EEHamidreza Hashempour, Luca Schiano, Fabrizio Lombardi: Enhancing error resilience for reliable compression of VLSI test data. ACM Great Lakes Symposium on VLSI 2005: 371-376
9EEHamidreza Hashempour, Luca Schiano, Fabrizio Lombardi: Evaluation of Error-Resilience for Reliable Compression of Test Data. DATE 2005: 1284-1289
8EEHamidreza Hashempour, Fabrizio Lombardi: Application of Arithmetic Coding to Compression of VLSI Test Data. IEEE Trans. Computers 54(9): 1166-1177 (2005)
7EEHamidreza Hashempour, Fabrizio Lombardi: Evaluation of heuristic techniques for test vector ordering. ACM Great Lakes Symposium on VLSI 2004: 96-99
6EEHamidreza Hashempour, Fabrizio Lombardi: Compression of VLSI Test Data by Arithmetic Coding. DFT 2004: 150-157
5EEHamidreza Hashempour, Luca Schiano, Fabrizio Lombardi: Error-Resilient Test Data Compression Using Tunstall Codes. DFT 2004: 316-323
4EEHamidreza Hashempour, Fabrizio Lombardi: ATE-Amenable Test Data Compression with No Cyclic Scan. DFT 2003: 151-158
3EEHamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi, Farzin Karimi: Hybrid Multisite Testing at Manufacturing. ITC 2003: 927-936
2EEHamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi: Test Time Reduction in a Manufacturing Environment by Combining BIST and ATE. DFT 2002: 186-194
1EEHamidreza Hashempour, Yong-Bin Kim, Nohpill Park: A Test-Vector Generation Methodology for Crosstalk Noise Faults. DFT 2002: 40-50

Coauthor Index

1André Ivanov [15]
2Faizal Karim [15]
3Farzin Karimi [3]
4Yong-Bin Kim [1]
5Fabrizio Lombardi [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15]
6Fred J. Meyer [2] [3]
7Marco Ottavi [15]
8Nohpill Park [1]
9Luca Schiano [5] [9] [10]
10Vamsi Vankamamidi [15]
11Konrad Walus [15]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)