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8. Asian Test Symposium 1999: Shanghai, China

8th Asian Test Symposium (ATS '99), 16-18 November 1999, Shanghai, China. IEEE Computer Society 1999, ISBN 0-7695-0315-2 BibTeX
@proceedings{DBLP:conf/ats/1999,
  title     = {8th Asian Test Symposium (ATS '99), 16-18 November 1999, Shanghai,
               China},
  booktitle = {Asian Test Symposium},
  publisher = {IEEE Computer Society},
  year      = {1999},
  isbn      = {0-7695-0315-2},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

ATPG Related Approaches I

Delay Fault & Memory Test

ATPG Related Approaches II

BIST Related Approaches

Test Generation, Diagnosis, & Verification

IDDQ Test

Sequential Circuit Test

Fault-Tolerant & Diagnosis

Analog Circuits Test

Railway Signaling Software

DFT

Software Test & Verification

Scan & Boundary Scan

Beam Testing in Japan

FPGA Test

Beam Testing in Japan

Copyright © Sat May 16 22:59:03 2009 by Michael Ley (ley@uni-trier.de)