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DFT 2004: Cannes, France

19th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2004), 10-13 October 2004, Cannes, France, Proceedings. IEEE Computer Society 2004, ISBN 0-7695-2241-6
Contents BibTeX

Yield and Defects I

Yield and Defects II


Defect and Fault Tolerance

Memory Test


Error Correcting Codes

Interconnect Faults

RF and High Speed Circuits

Analog Testing

Interactive Session

Error Detection and Correction

System-on-Chip Test

Circuit and System Reliability and Dependability

Novel Test Approaches

FPGA and Reconfigurable Circuit

Copyright © Sat May 16 23:06:36 2009 by Michael Ley (ley@uni-trier.de)