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DFT 2000: Mt. Fuji, Yamanashi, Japan

15th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2000), 25-27 October 2000, Yamanashi, Japan, Proceedings. IEEE Computer Society 2000, ISBN 0-7695-0719-0 BibTeX
@proceedings{DBLP:conf/dft/2000,
  title     = {15th IEEE International Symposium on Defect and Fault-Tolerance
               in VLSI Systems (DFT 2000), 25-27 October 2000, Yamanashi, Japan,
               Proceedings},
  booktitle = {DFT},
  publisher = {IEEE Computer Society},
  year      = {2000},
  isbn      = {0-7695-0719-0},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

Yield Analysis and Modeling

Yield Enhancement Techniques

Wafer Scale/Large Area Systems

Fault-Tolerant Interconnections

Fault-Tolerant Systems

Error Coding

Reconfiguration and Repair

Online Testing

Built-In Self-Test

Testing Strategies

IDDQ Testing

Fault Injection

Copyright © Sat May 16 23:06:35 2009 by Michael Ley (ley@uni-trier.de)