8. IOLTW 2002:
Isle of Bendor,
France
8th IEEE International On-Line Testing Workshop (IOLTW 2002), 8-10 July 2002, Isle of Bendor, France.
IEEE Computer Society 2002, ISBN 0-7695-1641-6 BibTeX
@proceedings{DBLP:conf/iolts/2002,
title = {8th IEEE International On-Line Testing Workshop (IOLTW 2002),
8-10 July 2002, Isle of Bendor, France},
booktitle = {IOLTW},
publisher = {IEEE Computer Society},
year = {2002},
isbn = {0-7695-1641-6},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Hardware Fault Tolerance
Hardware-Software Design and Validation of Fault Tolerant Systems
Self Checking Circuits
Concurrent Error Detection I
Concurrent Error Detection II
Analog and Mixed Signal Testing and Reliability
Fault Injection Techniques and Results
BIST Techniques I
BIST Techniques II
Testing Issues
Posters
- Carlo Dallavalle:
Adaptive IDDQ: How to Set an IDDQ Limit for any Device Under Test.
177
Electronic Edition (link) BibTeX
- Christian Galke, Matthias Pflanz, Heinrich Theodor Vierhaus:
On-line Detection and Compensation of Transient Errors in Processor Pipeline-Structures.
178
Electronic Edition (link) BibTeX
- Jose Miguel Vieira dos Santos:
Recovering Sequential Circuits from Temporary Faults: The Survival Capability of Scan-Cells.
179
Electronic Edition (link) BibTeX
- Naotake Kamiura, Kazuharu Yamato, Teijiro Isokawa, Nobuyuki Matsui:
Learning-Based On-Line Testing in Feedforward Neural Networks.
180
Electronic Edition (link) BibTeX
- Adam Kristof:
On-Line Detection of Short Circuits in Digital Devices and Systems.
183
Electronic Edition (link) BibTeX
- Mohammad A. Naal, M. Rakotoar, Emmanuel Simeu, Chouki Aktouf:
Using Concurrent and Semi-Concurrent On-Line Testing During HLS: An Adaptable Approach.
184
Electronic Edition (link) BibTeX
- Petros Oikonomakos, Mark Zwolinski:
Transformation Based Insertion of On-Line Testing Resources in a High-Level Synthesis Environment.
185
Electronic Edition (link) BibTeX
- Aleksandra Rankov, Gaynor E. Taylor, John Webster:
Robust Data Compression for Analogue Test Outputs.
186
Electronic Edition (link) BibTeX
- Fabian Vargas, Rubem Dutra Ribeiro Fagundes, Daniel Barros Jr.:
A New On-Line Robust Approach to Design Noise Immune Speech Recognition Systems.
187
Electronic Edition (link) BibTeX
- Ari Virtanen:
Radiation Effects Facility RADEF.
188
Electronic Edition (link) BibTeX
- Ilia Polian, Martin Keim, Nicolai Mallig, Bernd Becker:
Sequential n -Detection Criteria: Keep It Simple.
189
Electronic Edition (link) BibTeX
- Chouki Aktouf, Benoît Pannetier, Pierre Lemaître-Auger, Smail Tedjini:
On-line Testing of Embedded Systems Using Optical Probes: System Modeling and Probing Technology.
191
Electronic Edition (link) BibTeX
- B. Alorda, André Ivanov, Jaume Segura:
An Off-Chip Sensor Circuit for On-Line Transient Current Testing.
192
Electronic Edition (link) BibTeX
- Luis Berrojo, Isabel González, Luis Entrena, Celia López, Fulvio Corno, Matteo Sonza Reorda, Giovanni Squillero:
Analysis of the Equivalences and Dominances of Transient Faults at the RT Level.
193
Electronic Edition (link) BibTeX
- Fernanda Gusmão de Lima, Luigi Carro, Raoul Velazco, Ricardo Augusto da Luz Reis:
Injecting Multiple Upsets in a SEU Tolerant 8051 Micro-Controller.
194
Electronic Edition (link) BibTeX
- F. Kaddour, Sana Rezgui, Raoul Velazco, S. Rodriguez, J. R. De Mingo:
Error Rate Estimation for a Flight Application Using the CEU Fault Injection Approach.
195
Electronic Edition (link) BibTeX
Memory BIST Analysis and Application
Memory ECC and Soft Errors
High Reliability in Railway and Automotive Systems
Embedded Memory Yield Enhancement
Copyright © Sat May 16 23:24:15 2009
by Michael Ley (ley@uni-trier.de)
