Volume 20,
Number 1,
January/February 2003
EIC Message
Features
- Alex Orailoglu, Alexander V. Veidenbaum:
Guest Editors' Introduction: Application-Specific Microprocessors.
6-7 BibTeX
- Wolfgang Raab, Nico Brüls, J. A. Ulrich Hachmann, Jens Harnisch, Ulrich Ramacher, Christian Sauer, Axel Techmer:
A 100-GOPS Programmable Processor for Vehicle Vision Systems.
8-16
Electronic Edition (link) BibTeX
- Peter Petrov, Alex Orailoglu:
Application-Specific Instruction Memory Customizations for Power-Efficient Embedded Processors.
18-25
Electronic Edition (link) BibTeX
- Jong-eun Lee, Kiyoung Choi, Nikil D. Dutt:
Compilation Approach for Coarse-Grained Reconfigurable Architectures.
26-33
Electronic Edition (link) BibTeX
- Oliver Wahlen, Manuel Hohenauer, Rainer Leupers, Heinrich Meyr:
Instruction Scheduler Generation for Retargetable Compilation.
34-41
Electronic Edition (link) BibTeX
Special Features
- Jörg E. Vollrath:
Testing and Characterization of SDRAMs.
42-50
Electronic Edition (link) BibTeX
- Grzegorz Mrugalski, Jerzy Tyszer, Janusz Rajski:
2D Test Sequence Generators.
51-59
Electronic Edition (link) BibTeX
- Florence Azaïs, Yves Bertrand, Michel Renovell, André Ivanov, Sassan Tabatabaei:
An All-Digital DFT Scheme for Testing Catastrophic Faults in PLLs.
60-67
Electronic Edition (link) BibTeX
- Jean Michel Daga, Caroline Papaix, Marc Merandat, Stephane Ricard, Giuseppe Medulla, Jeanine Guichaoua, Daniel Auvergne:
Design Techniques for EEPROMs Embedded in Portable Systems on Chips.
68-75
Electronic Edition (link) BibTeX
- Luigi Carro, Marcelo Negreiros, Gabriel Parmegiani Jahn, Adão Antônio de Souza Jr., Denis Teixeira Franco:
Circuit-Level Considerations for Mixed-Signal Programmable Components.
76-84
Electronic Edition (link) BibTeX
The Road Ahead
Panel Summarie
Standards
Conference Reports
Newsletters
The Last Byte
Volume 20,
Number 2,
March/April 2003
EIC Message
Features
- Monica Lobetti Bodoni, Ben Bennetts:
Guest Editors' Introduction: Board Test.
5-7
Electronic Edition (link) BibTeX
- Erik Jan Marinissen, Bart Vermeulen, Henk D. L. Hollmann, Ben Bennetts:
Minimizing Pattern Count for Interconnect Test under a Ground Bounce Constraint.
8-18
Electronic Edition (link) BibTeX
- Bradford G. Van Treuren, José M. Miranda:
Embedded Boundary Scan.
20-25
Electronic Edition (link) BibTeX
- Mahnaz Salamati, Dag Stranneby:
Electromagnetic Signatures as a Tool for Connectionless Test.
26-30
Electronic Edition (link) BibTeX
- Uros Kac, Franc Novak, Florence Azaïs, Pascal Nouet, Michel Renovell:
Extending IEEE Std. 1149.4 Analog Boundary Modules to Enhance Mixed-Signal Test.
32-39
Electronic Edition (link) BibTeX
Special Features
Round Table
- Test Data Compression.
76-87 BibTeX
Conference Reports
- Conference Reports.
88-89 BibTeX
Panel Summaries
Newsletters
The Last Byte
Volume 20,
Number 3,
May/June 2003
EIC Message
Features
Special Infrastructure IP Section
DAC Watch
Special Report:
CADathlon
DTAP Update
The Road Ahead
Standards
Panel Summaries
Conference Reports
- Conference Reports.
115- BibTeX
Newsletters
- TTTC Newsletter.
116-117 BibTeX
- DATC Newsletter.
118- BibTeX
The Last Byte
Volume 20,
Number 4,
July/August 2003
EIC Message
Special Features
- Ravi Hosabettu, Ganesh Gopalakrishnan, Mandayam K. Srivas:
A Practical Methodology for Verifying Pipelined Microarchitectures.
4-14
Electronic Edition (link) BibTeX
- João P. Marques Silva, Luís Guerra e Silva:
Solving Satisfiability in Combinational Circuits.
16-21
Electronic Edition (link) BibTeX
- Ozgur Sinanoglu, Alex Orailoglu:
Compacting Test Responses for Deeply Embedded SoC Cores.
22-30
Electronic Edition (link) BibTeX
- Alfredo Benso, Stefano Di Carlo, Paolo Prinetto, Yervant Zorian:
A Hierarchical Infrastructure for SoC Test Management.
32-39
Electronic Edition (link) BibTeX
- Ian G. Harris:
Fault Models and Test Generation for Hardware-Software Covalidation.
40-47
Electronic Edition (link) BibTeX
- Nicola Nicolici, Bashir M. Al-Hashimi:
Power-Conscious Test Synthesis and Scheduling.
48-55
Electronic Edition (link) BibTeX
- Dionisios N. Pnevmatikatos, Ioannis Sourdis, Kyriakos Vlachos:
An Efficient, Low-Cost I/O Subsystem for Network Processors.
56-64
Electronic Edition (link) BibTeX
Roundtable
- Embedded Memories for the Future.
66-81 BibTeX
Standards
Panel Summaries
Conference Reports
- McCluskey Awarded TTTC Lifetime Contribution Medal.
89- BibTeX
Newsletters
The Last Byte
Volume 20,
Number 5,
September/October 2003
From the EIC
Feature
- Kenneth M. Butler, Kwang-Ting (Tim) Cheng, Li-C. Wang:
Guest Editors' Introduction: Speed Test and Speed Binning for Complex ICs.
6-7
Electronic Edition (link) BibTeX
- Kee Sup Kim, Subhasish Mitra, Paul G. Ryan:
Delay Defect Characteristics and Testing Strategies.
8-16
Electronic Edition (link) BibTeX
- Xijiang Lin, Ron Press, Janusz Rajski, Paul Reuter, Thomas Rinderknecht, Bruce Swanson, Nagesh Tamarapalli:
High-Frequency, At-Speed Scan Testing.
17-25
Electronic Edition (link) BibTeX
- Stephen Pateras:
Achieving At-Speed Structural Test.
26-33
Electronic Edition (link) BibTeX
- Alfred L. Crouch, John C. Potter, Jason Doege:
AC Scan Path Selection for Physical Debugging.
34-40
Electronic Edition (link) BibTeX
- Bruce D. Cory, Rohit Kapur, Bill Underwood:
Speed Binning with Path Delay Test in 150-nm Technology.
41-45
Electronic Edition (link) BibTeX
- Robert Madge, Brady Benware, W. Robert Daasch:
Obtaining High Defect Coverage for Frequency-Dependent Defects in Complex ASICs.
46-53
Electronic Edition (link) BibTeX
ITC Watch
- Robert C. Aitken, Gordon W. Roberts:
ITC 2003: Breaking Test Interface Bottlenecks.
54- BibTeX
- Gordon W. Roberts, Robert C. Aitken:
ITC Highlights.
55-57 BibTeX
- Janusz Rajski, Mark Kassab, Nilanjan Mukherjee, Nagesh Tamarapalli, Jerzy Tyszer, Jun Qian:
Embedded Deterministic Test for Low-Cost Manufacturing.
58-66
Electronic Edition (link) BibTeX
- Darren Anand, Bruce Cowan, Owen Farnsworth, Peter Jakobsen, Steven F. Oakland, Michael Ouellette, Donald L. Wheater:
An On-Chip Self-Repair Calculation and Fusing Methodology.
67-75
Electronic Edition (link) BibTeX
- Bill Eklow, Carl Barnhart, Kenneth P. Parker:
IEEE 1149.6: A Boundary-Scan Standard for Advanced Digital Networks.
76-83
Electronic Edition (link) BibTeX
- Peter C. Maxwell:
Wafer-Package Test Mix for Optimal Defect Detection and Test Time Savings.
84-89
Electronic Edition (link) BibTeX
- ARM Twisting with Sir Robin: An Interview with ARM Chairman Sir Robin Saxby.
90-93
Electronic Edition (link) BibTeX
Standards
Conference Reports
- Conference Reports.
97-99 BibTeX
Newsletters
- DATC Newsletter.
100- BibTeX
- TTTC Newsletter.
102-103 BibTeX
The Last Byte
Volume 20,
Number 6,
November/December 2003
From the EIC
Features
- Soha Hassoun, Yong-Bin Kim, Fabrizio Lombardi:
Guest Editors' Introduction: Clockless VLSI Systems.
5-8
Electronic Edition (link) BibTeX
- Alain J. Martin, Mika Nyström, Catherine G. Wong:
Three Generations of Asynchronous Microprocessors.
9-17
Electronic Edition (link) BibTeX
- Stephen H. Unger:
Reducing Power Dissipation, Delay, and Area in Logic Circuits by Narrowing Transistors.
18-24
Electronic Edition (link) BibTeX
- Satish K. Bandapati, Scott C. Smith, Minsu Choi:
Design and Characterization of Null Convention Self-Timed Multipliers.
26-36
Electronic Edition (link) BibTeX
- Steve Masteller, Lief Sorenson:
Cycle Decomposition in NCL.
38-43
Electronic Edition (link) BibTeX
- Juha Plosila, Tiberiu Seceleanu, Pasi Liljeberg:
Implementation of a Self-Timed Segmented Bus.
44-50
Electronic Edition (link) BibTeX
- Woo Jin Kim, Yong-Bin Kim:
Automating Wave-Pipelined Circuit Design.
51-58
Electronic Edition (link) BibTeX
Special Section:
Perspectives in EDA
The Road Ahead
Standards
Panel Summaries
Conference Reports
Newsletters
- Test Technology TC Newsletter.
104-105 BibTeX
- Design Automation Technical Committee Newsletter.
106- BibTeX
Annual Index
The Last Byte
Copyright © Sat May 16 23:57:38 2009
by Michael Ley (ley@uni-trier.de)
