Fred J. Meyer

2005
48	EE	Zachary D. Patitz, Nohpill Park, Minsu Choi, Fred J. Meyer: QCA-Based Majority Gate Design under Radius of Effect-Induced Faults. DFT 2005: 217-228
2004
47	EE	Marco Ottavi, Xiaopeng Wang, Fred J. Meyer, Fabrizio Lombardi: Simulation of reconfigurable memory core yield. ACM Great Lakes Symposium on VLSI 2004: 136-140
46	EE	Xiaopeng Wang, Marco Ottavi, Fred J. Meyer, Fabrizio Lombardi: On The Yield of Compiler-Based eSRAMs. DFT 2004: 11-19
45	EE	T. Feng, Nohpill Park, Yong-Bin Kim, Fabrizio Lombardi, Fred J. Meyer: Reliability Modeling and Assurance of Clockless Wave Pipeline. DFT 2004: 442-450
44	EE	Jun Zhao, Fred J. Meyer, Nohpill Park, Fabrizio Lombardi: Sequential diagnosis of processor array systems. IEEE Transactions on Reliability 53(4): 487-498 (2004)
43	EE	Cristiana Bolchini, Fred J. Meyer: Guest editorial. Journal of Systems Architecture 50(5): 237-238 (2004)
2003
42	EE	Fengming Zhang, Young-Jun Lee, T. Kane, Luca Schiano, Mariam Momenzadeh, Yong-Bin Kim, Fred J. Meyer, Fabrizio Lombardi, S. Max, Phil Perkinson: A Digital and Wide Power Bandwidth H-Field Generator for Automatic Test Equipment. DFT 2003: 159-166
41	EE	Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi, Farzin Karimi: Hybrid Multisite Testing at Manufacturing. ITC 2003: 927-936
40	EE	Wenyi Feng, Fred J. Meyer, Fabrizio Lombardi: Adaptive Algorithms for Maximal Diagnosis of Wiring Interconnects. IEEE Trans. Computers 52(10): 1259-1270 (2003)
39	EE	Fred J. Meyer, Nohpill Park: Predicting Defect-Tolerant Yield in the Embedded Core Context. IEEE Trans. Computers 52(11): 1470-1479 (2003)
38	EE	Jun Zhao, Fred J. Meyer, Fabrizio Lombardi, Nohpill Park: Maximal diagnosis of interconnects of random access memories. IEEE Transactions on Reliability 52(4): 423-434 (2003)
2002
37	EE	Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi: Test Time Reduction in a Manufacturing Environment by Combining BIST and ATE. DFT 2002: 186-194
36	EE	Farzin Karimi, Fred J. Meyer, Fabrizio Lombardi: Random Testing of Multi-Port Static Random Access Memories. MTDT 2002: 101-108
35	EE	Jun Zhao, Fred J. Meyer, Fabrizio Lombardi: Analyzing and Diagnosing Interconnect Faults in Bus-Structured Systems. IEEE Design & Test of Computers 19(1): 54-64 (2002)
2001
34	EE	Xiao-Tao Chen, Wei-Kang Huang, Nohpill Park, Fred J. Meyer, Fabrizio Lombardi: Novel Approaches for Fault Detection in Two-Dimensional Combinational Arrays. DFT 2001: 161-169
33	EE	Minsu Choi, Nohpill Park, Fred J. Meyer, Fabrizio Lombardi: Connectivity-Based Multichip Module Repair. PRDC 2001: 19-26
2000
32	EE	Nohpill Park, Fred J. Meyer, Fabrizio Lombardi: Quality-Effective Repair of Multichip Module Systems. DFT 2000: 47-55
31	EE	Wenyi Feng, Fred J. Meyer, Fabrizio Lombardi: Complexity Bounds for Lookup Table Implementation of Factored Forms in FPGA Technology Mapping. IPDPS Workshops 2000: 951-958
30	EE	Jun Zhao, Fred J. Meyer, Fabrizio Lombardi: Diagnosing the Interconnect of Bus-Connected Multi-RAM Systems under Restricted and General Fault Models. MTDT 2000: 14-19
29	EE	Wei-Kang Huang, Fred J. Meyer, Fabrizio Lombardi: An Approach for Detecting Multiple Faulty FPGA Logic Blocks. IEEE Trans. Computers 49(1): 48-54 (2000)
28	EE	Tong Liu, Wei-Kang Huang, Fred J. Meyer, Fabrizio Lombardi: Testing and testable designs for one-time programmable FPGAs. IEEE Trans. on CAD of Integrated Circuits and Systems 19(11): 1370-1375 (2000)
1999
27	EE	Wenyi Feng, Wei-Kang Huang, Fred J. Meyer, Fabrizio Lombardi: A BIST TPG Approach for Interconnect Testing With the IEEE 1149.1 STD. Asian Test Symposium 1999: 95-100
26	EE	Wenyi Feng, Fred J. Meyer, Fabrizio Lombardi: Novel Control Pattern Generators for Interconnect Testing with Boundary Scan. DFT 1999: 112-120
25	EE	Fred J. Meyer, Fabrizio Lombardi, Jun Zhao: Good Processor Identification in Two-Dimensional Grids. DFT 1999: 348-356
24	EE	Wenyi Feng, Xiao-Tao Chen, Fred J. Meyer, Fabrizio Lombardi: Reconfiguration of One-Time Programmable FPGAs with Faulty Logic Resources. DFT 1999: 368-376
23	EE	Wenyi Feng, Fred J. Meyer, Fabrizio Lombardi: Two-Step Algorithms for Maximal Diagnosis of Wiring Interconnects. FTCS 1999: 130-137
22	EE	Jun Zhao, Fred J. Meyer, Fabrizio Lombardi: Interconnect Diagnosis of Bus-Connected Multi-RAM Systems. MTDT 1999: 40-47
21	EE	Jun Zhao, Fred J. Meyer, Fabrizio Lombardi: Maximal Diagnosis of Interconnects of Random Access Memories. VTS 1999: 378-383
20		Bruce F. Cockburn, Fabrizio Lombardi, Fred J. Meyer: Guest Editors' Introduction: DRAM Architecture and Testing. IEEE Design & Test of Computers 16(1): 19-21 (1999)
19	EE	Xiao-Tao Chen, Wei-Kang Huang, Nohpill Park, Fred J. Meyer, Fabrizio Lombardi: Design Verification of FPGA Implementations. IEEE Design & Test of Computers 16(2): 66-73 (1999)
18	EE	Tong Liu, Xiao-Tao Chen, Fred J. Meyer, Fabrizio Lombardi: Test generation and scheduling for layout-based detection of bridge faults in interconnects. IEEE Trans. VLSI Syst. 7(1): 48-55 (1999)
17	EE	Jun Zhao, Fred J. Meyer, Fabrizio Lombardi: Adaptive Fault Detection and Diagnosis of RAM Interconnects. J. Electronic Testing 15(1-2): 157-171 (1999)
1998
16	EE	Wenyi Feng, Wei-Kang Huang, Fred J. Meyer, Fabrizio Lombardi: Fault Detection in a Tristate System Environment. Asian Test Symposium 1998: 253-258
15	EE	Avinash Munshi, Fred J. Meyer, Fabrizio Lombardi: A New Method for Testing EEPLA's. DFT 1998: 146-154
14	EE	Wenyi Feng, Fred J. Meyer, Wei-Kang Huang, Fabrizio Lombardi: On the Complexity of Sequential Testing in Configurable FPGAs. DFT 1998: 164-
13	EE	Jun Zhao, Fred J. Meyer, Fabrizio Lombardi: Fault Detection and Diagnosis of Interconnects of Random Access Memories. VTS 1998: 42-47
12	EE	Xiao-Tao Chen, Fred J. Meyer, Fabrizio Lombardi: Structural diagnosis of interconnects by coloring. ACM Trans. Design Autom. Electr. Syst. 3(2): 249-271 (1998)
11	EE	Wei-Kang Huang, Fred J. Meyer, Xiao-Tao Chen, Fabrizio Lombardi: Testing configurable LUT-based FPGA's. IEEE Trans. VLSI Syst. 6(2): 276-283 (1998)
1997
10	EE	Wei-Kang Huang, M. Y. Zhang, Fred J. Meyer, Fabrizio Lombardi: A XOR-Tree Based Technique for Constant Testability of Configurable FPGAs. Asian Test Symposium 1997: 248-253
9	EE	Wei Liang Huang, Fred J. Meyer, Fabrizio Lombardi: Multiple fault detection in logic resources of FPGAs. DFT 1997: 186-194
8	EE	D. G. Ashen, Fred J. Meyer, Nohpill Park, Fabrizio Lombardi: Testing of programmable logic devices (PLD) with faulty resources. DFT 1997: 76-84
7		Fred J. Meyer, Xiao-Tao Chen, Wei-Kang Huang, Fabrizio Lombardi: Using Virtual Links for Reliable Information Retrieval Across Point-to-Point Networks. FTCS 1997: 216-225
6	EE	Xiao-Tao Chen, Fred J. Meyer, Fabrizio Lombardi: On the Fault Coverage of Interconnect Diagnosis. VTS 1997: 101-109
1993
5	EE	D. D. Sharma, Fred J. Meyer, Dhiraj K. Pradhan: Yield optimization of modular and redundant multimegabit RAMs: a study of effectiveness of coding versus static redundancy using the center-satellite model. IEEE Trans. VLSI Syst. 1(4): 546-558 (1993)
1991
4	EE	Fred J. Meyer, Dhiraj K. Pradhan: Consensus With Dual Failure Modes. IEEE Trans. Parallel Distrib. Syst. 2(2): 214-222 (1991)
1989
3		Fred J. Meyer, Dhiraj K. Pradhan: Dynamic Testing Strategy for Distributed Systems. IEEE Trans. Computers 38(3): 356-365 (1989)
2		Fred J. Meyer, Dhiraj K. Pradhan: Modeling Defect Spatial Distribution. IEEE Trans. Computers 38(4): 538-546 (1989)
1988
1		Fred J. Meyer, Dhiraj K. Pradhan: Flip-Trees: Fault-Tolerant Graphs with Wide Containers. IEEE Trans. Computers 37(4): 472-478 (1988)

Coauthor Index

1	D. G. Ashen	[8]
2	Cristiana Bolchini	[43]
3	Xiao-Tao Chen	[6] [7] [11] [12] [18] [19] [24] [34]
4	Minsu Choi	[33] [48]
5	Bruce F. Cockburn	[20]
6	T. Feng	[45]
7	Wenyi Feng	[14] [16] [23] [24] [26] [27] [31] [40]
8	Hamidreza Hashempour	[37] [41]
9	Wei Liang Huang	[9]
10	Wei-Kang Huang	[7] [10] [11] [14] [16] [19] [27] [28] [29] [34]
11	T. Kane	[42]
12	Farzin Karimi	[36] [41]
13	Yong-Bin Kim	[42] [45]
14	Young-Jun Lee	[42]
15	Tong Liu	[18] [28]
16	Fabrizio Lombardi	[6] [7] [8] [9] [10] [11] [12] [13] [14] [15] [16] [17] [18] [19] [20] [21] [22] [23] [24] [25] [26] [27] [28] [29] [30] [31] [32] [33] [34] [35] [36] [37] [38] [40] [41] [42] [44] [45] [46] [47]
17	S. Max	[42]
18	Mariam Momenzadeh	[42]
19	Avinash Munshi	[15]
20	Marco Ottavi	[46] [47]
21	Nohpill Park	[8] [19] [32] [33] [34] [38] [39] [44] [45] [48]
22	Zachary D. Patitz	[48]
23	Phil Perkinson	[42]
24	Dhiraj K. Pradhan	[1] [2] [3] [4] [5]
25	Luca Schiano	[42]
26	D. D. Sharma	[5]
27	Xiaopeng Wang	[46] [47]
28	Fengming Zhang	[42]
29	M. Y. Zhang	[10]
30	Jun Zhao	[13] [17] [21] [22] [25] [30] [35] [38] [44]

Colors in the list of coauthors