2008 |
14 | EE | Wenyi Feng,
Sinan Kaptanoglu:
Designing Efficient Input Interconnect Blocks for LUT Clusters Using Counting and Entropy.
TRETS 1(1): (2008) |
2007 |
13 | EE | Wenyi Feng,
Sinan Kaptanoglu:
Designing efficient input interconnect blocks for LUT clusters using counting and entropy.
FPGA 2007: 23-32 |
12 | EE | Wenyi Feng,
Jonathan W. Greene:
Post-Placement Interconnect Entropy.
IEEE Trans. VLSI Syst. 15(8): 945-948 (2007) |
2006 |
11 | EE | Wenyi Feng,
Jonathan Greene:
Post-placement interconnect entropy.
FPGA 2006: 227 |
10 | EE | Wenyi Feng,
Jonathan W. Greene:
Post-placement interconnect entropy: how many configuration bits does a programmable logic device need?
SLIP 2006: 41-48 |
2003 |
9 | EE | Wenyi Feng,
Fred J. Meyer,
Fabrizio Lombardi:
Adaptive Algorithms for Maximal Diagnosis of Wiring Interconnects.
IEEE Trans. Computers 52(10): 1259-1270 (2003) |
2001 |
8 | EE | Wenyi Feng,
Farzin Karimi,
Fabrizio Lombardi:
Fault Detection in a Tristate System Environment.
IEEE Micro 21(5): 77-85 (2001) |
2000 |
7 | EE | Wenyi Feng,
Fred J. Meyer,
Fabrizio Lombardi:
Complexity Bounds for Lookup Table Implementation of Factored Forms in FPGA Technology Mapping.
IPDPS Workshops 2000: 951-958 |
1999 |
6 | EE | Wenyi Feng,
Wei-Kang Huang,
Fred J. Meyer,
Fabrizio Lombardi:
A BIST TPG Approach for Interconnect Testing With the IEEE 1149.1 STD.
Asian Test Symposium 1999: 95-100 |
5 | EE | Wenyi Feng,
Fred J. Meyer,
Fabrizio Lombardi:
Novel Control Pattern Generators for Interconnect Testing with Boundary Scan.
DFT 1999: 112-120 |
4 | EE | Wenyi Feng,
Xiao-Tao Chen,
Fred J. Meyer,
Fabrizio Lombardi:
Reconfiguration of One-Time Programmable FPGAs with Faulty Logic Resources.
DFT 1999: 368-376 |
3 | EE | Wenyi Feng,
Fred J. Meyer,
Fabrizio Lombardi:
Two-Step Algorithms for Maximal Diagnosis of Wiring Interconnects.
FTCS 1999: 130-137 |
1998 |
2 | EE | Wenyi Feng,
Wei-Kang Huang,
Fred J. Meyer,
Fabrizio Lombardi:
Fault Detection in a Tristate System Environment.
Asian Test Symposium 1998: 253-258 |
1 | EE | Wenyi Feng,
Fred J. Meyer,
Wei-Kang Huang,
Fabrizio Lombardi:
On the Complexity of Sequential Testing in Configurable FPGAs.
DFT 1998: 164- |