| 2008 | 
|---|
| 14 | EE | Wenyi Feng,
Sinan Kaptanoglu:
Designing Efficient Input Interconnect Blocks for LUT Clusters Using Counting and Entropy.
TRETS 1(1):  (2008) | 
| 2007 | 
|---|
| 13 | EE | Wenyi Feng,
Sinan Kaptanoglu:
Designing efficient input interconnect blocks for LUT clusters using counting and entropy.
FPGA 2007: 23-32 | 
| 12 | EE | Wenyi Feng,
Jonathan W. Greene:
Post-Placement Interconnect Entropy.
IEEE Trans. VLSI Syst. 15(8): 945-948 (2007) | 
| 2006 | 
|---|
| 11 | EE | Wenyi Feng,
Jonathan Greene:
Post-placement interconnect entropy.
FPGA 2006: 227 | 
| 10 | EE | Wenyi Feng,
Jonathan W. Greene:
Post-placement interconnect entropy: how many configuration bits does a programmable logic device need?
SLIP 2006: 41-48 | 
| 2003 | 
|---|
| 9 | EE | Wenyi Feng,
Fred J. Meyer,
Fabrizio Lombardi:
Adaptive Algorithms for Maximal Diagnosis of Wiring Interconnects.
IEEE Trans. Computers 52(10): 1259-1270 (2003) | 
| 2001 | 
|---|
| 8 | EE | Wenyi Feng,
Farzin Karimi,
Fabrizio Lombardi:
Fault Detection in a Tristate System Environment.
IEEE Micro 21(5): 77-85 (2001) | 
| 2000 | 
|---|
| 7 | EE | Wenyi Feng,
Fred J. Meyer,
Fabrizio Lombardi:
Complexity Bounds for Lookup Table Implementation of Factored Forms in FPGA Technology Mapping.
IPDPS Workshops 2000: 951-958 | 
| 1999 | 
|---|
| 6 | EE | Wenyi Feng,
Wei-Kang Huang,
Fred J. Meyer,
Fabrizio Lombardi:
A BIST TPG Approach for Interconnect Testing With the IEEE 1149.1 STD.
Asian Test Symposium 1999: 95-100 | 
| 5 | EE | Wenyi Feng,
Fred J. Meyer,
Fabrizio Lombardi:
Novel Control Pattern Generators for Interconnect Testing with Boundary Scan.
DFT 1999: 112-120 | 
| 4 | EE | Wenyi Feng,
Xiao-Tao Chen,
Fred J. Meyer,
Fabrizio Lombardi:
Reconfiguration of One-Time Programmable FPGAs with Faulty Logic Resources.
DFT 1999: 368-376 | 
| 3 | EE | Wenyi Feng,
Fred J. Meyer,
Fabrizio Lombardi:
Two-Step Algorithms for Maximal Diagnosis of Wiring Interconnects.
FTCS 1999: 130-137 | 
| 1998 | 
|---|
| 2 | EE | Wenyi Feng,
Wei-Kang Huang,
Fred J. Meyer,
Fabrizio Lombardi:
Fault Detection in a Tristate System Environment.
Asian Test Symposium 1998: 253-258 | 
| 1 | EE | Wenyi Feng,
Fred J. Meyer,
Wei-Kang Huang,
Fabrizio Lombardi:
On the Complexity of Sequential Testing in Configurable FPGAs.
DFT 1998: 164- |