Minsu Choi

2008
24	EE	Myungsu Choi, Minsu Choi: Scalability of Globally Asynchronous QCA (Quantum-Dot Cellular Automata) Adder Design. J. Electronic Testing 24(1-3): 313-320 (2008)
23	EE	Nur A. Touba, Adelio Salsano, Minsu Choi: Guest Editorial. J. Electronic Testing 24(1-3): 9-10 (2008)
22	EE	Yadunandana Yellambalase, Minsu Choi: Cost-driven repair optimization of reconfigurable nanowire crossbar systems with clustered defects. Journal of Systems Architecture - Embedded Systems Design 54(8): 729-741 (2008)
2007
21	EE	Ravi Bonam, Yong-Bin Kim, Minsu Choi: Defect-Tolerant Gate Macro Mapping & Placement in Clock-Free Nanowire Crossbar Architecture. DFT 2007: 161-169
20	EE	Kyung Ki Kim, Yong-Bin Kim, Minsu Choi, Nohpill Park: Leakage Minimization Technique for Nanoscale CMOS VLSI. IEEE Design & Test of Computers 24(4): 322-330 (2007)
19	EE	Myungsu Choi, Zachary D. Patitz, Byoungjae Jin, Feng Tao, Nohpill Park, Minsu Choi: Designing layout-timing independent quantum-dot cellular automata (QCA) circuits by global asynchrony. Journal of Systems Architecture 53(9): 551-567 (2007)
2006
18	EE	Minsu Choi, Myungsu Choi, Zachary D. Patitz, Nohpill Park: Efficient and Robust Delay-Insensitive QCA (Quantum-Dot Cellular Automata) Design. DFT 2006: 80-88
17	EE	Yadunandana Yellambalase, Minsu Choi, Yong-Bin Kim: Inherited Redundancy and Configurability Utilization for Repairing Nanowire Crossbars with Clustered Defects. DFT 2006: 98-106
2005
16	EE	Zachary D. Patitz, Nohpill Park, Minsu Choi, Fred J. Meyer: QCA-Based Majority Gate Design under Radius of Effect-Induced Faults. DFT 2005: 217-228
15	EE	Minsu Choi, Nohpill Park: Teaching Nanotechnology by Introducing Crossbar-Based Architecture and Quantum-Dot Cellular Automata. MSE 2005: 29-30
2004
14	EE	Shanrui Zhang, Minsu Choi, Nohpill Park: Modeling Yield of Carbon-Nanotube/Silicon-Nanowire FET-Based Nanoarray Architecture with h-hot Addressing Scheme. DFT 2004: 356-364
13	EE	Shanrui Zhang, Minsu Choi, Nohpill Park, Fabrizio Lombardi: Probabilistic Balancing of Fault Coverage and Test Cost in Combined Built-In Self-Test/Automated Test Equipment Testing Environment. DFT 2004: 48-56
12	EE	Bin Liu, Fabrizio Lombardi, Nohpill Park, Minsu Choi: Testing Layered Interconnection Networks. IEEE Trans. Computers 53(6): 710-722 (2004)
11	EE	Minsu Choi, Nohpill Park, Vincenzo Piuri, Yong-Bin Kim, Fabrizio Lombardi: Balanced dual-stage repair for dependable embedded memory cores. Journal of Systems Architecture 50(5): 281-285 (2004)
2003
10	EE	Noh-Jin Park, Byoungjae Jin, K. M. George, Nohpill Park, Minsu Choi: Regressive Testing for System-on-Chip with Unknown-Good-Yield. DFT 2003: 393-400
9	EE	Minsu Choi, Hardy J. Pottinger, Nohpill Park, Yong-Bin Kim: Need For Undergraduate And Graduate-Level Education In Testing Of Microelectronic Circuits And Systems. MSE 2003: 121-122
8	EE	Minsu Choi, Nohpill Park, Fabrizio Lombardi, Yong-Bin Kim, Vincenzo Piuri: Optimal Spare Utilization in Repairable and Reliable Memory Cores. MTDT 2003: 64-71
7	EE	Minsu Choi, Noh-Jin Park, K. M. George, Byoungjae Jin, Nohpill Park, Yong-Bin Kim, Fabrizio Lombardi: Fault Tolerant Memory Design for HW/SW Co-Reliability in Massively Parallel Computing Systems. NCA 2003: 341-
6	EE	Satish K. Bandapati, Scott C. Smith, Minsu Choi: Design and Characterization of Null Convention Self-Timed Multipliers. IEEE Design & Test of Computers 20(6): 26-36 (2003)
2002
5	EE	Minsu Choi, Nohpill Park, Fabrizio Lombardi, Yong-Bin Kim, Vincenzo Piuri: Balanced Redundancy Utilization in Embedded Memory Cores for Dependable Systems. DFT 2002: 419-427
4	EE	Y. Chang, Minsu Choi, Nohpill Park, Fabrizio Lombardi: Repairability Evaluation of Embedded Multiple Region DRAMs. DFT 2002: 428-436
3	EE	Minsu Choi, Nohpill Park, Fabrizio Lombardi: Hardware-Software Co-Reliability in Field Reconfigurable Multi-Processor-Memory Systems. IPDPS 2002
2	EE	Minsu Choi, Nohpill Park, Yong-Bin Kim, Fabrizio Lombardi: Hardware/Software Co-Reliability of Configurable Digital Systems. PRDC 2002: 67-74
2001
1	EE	Minsu Choi, Nohpill Park, Fred J. Meyer, Fabrizio Lombardi: Connectivity-Based Multichip Module Repair. PRDC 2001: 19-26

Coauthor Index

1	Satish K. Bandapati	[6]
2	Ravi Bonam	[21]
3	Y. Chang	[4]
4	Myungsu Choi	[18] [19] [24]
5	K. M. George	[7] [10]
6	Byoungjae Jin	[7] [10] [19]
7	Kyung Ki Kim	[20]
8	Yong-Bin Kim	[2] [5] [7] [8] [9] [11] [17] [20] [21]
9	Bin Liu	[12]
10	Fabrizio Lombardi	[1] [2] [3] [4] [5] [7] [8] [11] [12] [13]
11	Fred J. Meyer	[1] [16]
12	Noh-Jin Park	[7] [10]
13	Nohpill Park	[1] [2] [3] [4] [5] [7] [8] [9] [10] [11] [12] [13] [14] [15] [16] [18] [19] [20]
14	Zachary D. Patitz	[16] [18] [19]
15	Vincenzo Piuri	[5] [8] [11]
16	Hardy J. Pottinger	[9]
17	Adelio Salsano	[23]
18	Scott C. Smith	[6]
19	Feng Tao (Barry Tao)	[19]
20	Nur A. Touba	[23]
21	Yadunandana Yellambalase	[17] [22]
22	Shanrui Zhang	[13] [14]

Colors in the list of coauthors