IEEE Design & Test of Computers, Volume 15

Volume 15, Number 1, January-March 1998

• Yervant Zorian: D&T: 15th Year in Service. 1- BibTeX

• News. 4-5 BibTeX

• Teruhiko Yamada: 1997 Asian Test Symposium. 6- BibTeX

• Dilip K. Bhavsar, Yervant Zorian: ITC 97 Panel Sessions. 7, 91 BibTeX

• Fabrizio Lombardi: Field-Programmable Gate Arrays. 8-9 BibTeX

• Vaughn Betz, Jonathan Rose:
  How Much Logic Should Go in an FPGA Logic Block? 10-15
  Electronic Edition (link) BibTeX
• Miriam Leeser, Waleed Meleis, Mankuan Michael Vai, Silviu M. S. A. Chiricescu, Weidong Xu, Paul M. Zavracky:
  Rothko: A Three-Dimensional FPGA. 16-23
  Electronic Edition (link) BibTeX
• Shanzhen Xing, William W. H. Yu:
  FPGA Adders: Performance Evaluation and Optimal Design. 24-29
  Electronic Edition (link) BibTeX
• Roger Woods, David W. Trainor, Jean-Paul Heron:
  Applying an XC6200 to Real-Time Image Processing. 30-38
  Electronic Edition (link) BibTeX
• Tomoo Inoue, Satoshi Miyazaki, Hideo Fujiwara:
  Universal Fault Diagnosis for Lookup Table FPGAs. 39-44
  Electronic Edition (link) BibTeX
• Michel Renovell, Jean Michel Portal, Joan Figueras, Yervant Zorian:
  Testing the Interconnect of RAM-Based FPGAs. 45-50
  Electronic Edition (link) BibTeX

• Kenneth L. Shepard, Vinod Narayanan:
  Conquering Noise in Deep-Submicron Digital ICs. 51-62
  Electronic Edition (link) BibTeX
• Stefano Barbagallo, Davide Medina, Fulvio Corno, Paolo Prinetto, Matteo Sonza Reorda:
  Integrating Online and Offline Testing of a Switching Memory. 63-70
  Electronic Edition (link) BibTeX
• Felice Balarin, Luciano Lavagno, Praveen K. Murthy, Alberto L. Sangiovanni-Vincentelli:
  Scheduling for Embedded Real-Time Systems. 71-82
  Electronic Edition (link) BibTeX
• A D&T Roundtable: Relative Effectiveness of Tests. 83-90 BibTeX

• Test Technology TC Newsletter. 92-94 BibTeX

• Design Automation TC Newsletter. 95- BibTeX

• Hideo Fujiwara: Needed: Third-generation ATPG Benchmarks. 96- BibTeX

Volume 15, Number 2, April-June 1998

• Our new world. 1- BibTeX

• Letters. 3- BibTeX

• Patrick Dewilde: Date 98. 4- BibTeX

• Panel Summaries. 5-7 BibTeX

• Colin Maunder:
  The Future: Plug and Pray? 8-13
  Electronic Edition (link) BibTeX
• Vladimir Székely, Márta Rencz, Bernard Courtois:
  Tracing the Thermal Behavior of ICs. 14-21
  Electronic Edition (link) BibTeX
• Kayhan Küçükçakar, Chih-Tung Chen, Jie Gong, Wim Philipsen, Thomas E. Tkacik:
  Matisse: An Architectural Design Tool for Commodity ICs. 22-33
  Electronic Edition (link) BibTeX
• Peter J. Ashenden, Philip A. Wilsey, Dale E. Martin:
  SUAVE: Extending VHDL to Improve Data Modeling Support. 34-44
  Electronic Edition (link) BibTeX
• Rolf Ernst:
  Codesign of Embedded Systems: Status and Trends. 45-54
  Electronic Edition (link) BibTeX
• Yeong-Ruey Shieh, Cheng-Wen Wu:
  Control and Observation Structures for Analog Circuits. 56-64
  Electronic Edition (link) BibTeX
• Wen-Jong Fang, Allen C.-H. Wu:
  Integrating HDL Synthesis and Partitioning for Multi-FPGA Designs. 65-72
  Electronic Edition (link) BibTeX
• Samvel K. Shoukourian:
  A Unified Design Methodology for Offline and Online Testing. 73-79
  Electronic Edition (link) BibTeX
• Yuri V. Malyshenko:
  Functional Fault Models for Analog Circuits. 80-85
  Electronic Edition (link) BibTeX
• Meh-Ron Amerian, William D. Atwell Jr., Ian Burgess, Gary D. Fleeman, David Y. Lepejian, T. W. Williams, Farzad Zarrinfar, Yervant Zorian: A D&T Roundtable: Testing Mixed Logic and DRAM Chips. 86-92 BibTeX

• DATC Newsletter. 93- BibTeX

• Test Technology TC Newsletter. 94-95 BibTeX

• Scott Davidson: The Newer Colossus. 96- BibTeX

Volume 15, Number 3, July-September 1998

• Conference Reports. 2- BibTeX

• Yervant Zorian: Once Again, a Super Issue. 3- BibTeX

• Wilfred Corrigan:
  ASIC Challenges: Emerging from a Primordial Soup. 4-7
  Electronic Edition (link) BibTeX

• David E. Schimmel, Chryssa Dislis: Guest Editors' Introduction: Early Modeling and Analysis of Packaged Systems. 8-9 BibTeX
• Peter Sandborn, Mike Vertal:
  Analyzing Packaging Trade-Offs During System Design. 10-19
  Electronic Edition (link) BibTeX
• Michael Scheffler, Daniel Ammann, Andreas Thiel, Claus M. Habiger, Gerhard Tröster:
  Modeling and Optimizing the Costs of Electronic Systems. 20-26
  Electronic Edition (link) BibTeX
• Earl E. Swartzlander Jr.:
  VLSI, MCM, and WSI: A Design Comparison. 28-34
  Electronic Edition (link) BibTeX
• Claudio Truzzi:
  The Role of the Good-Die Project in Miniaturized-System Design. 35-43
  Electronic Edition (link) BibTeX
• Koppolu Sasidhar, Leon Alkalai, Abhijit Chatterjee:
  Testing NASA's 3D-Stack MCM Space Flight Computer. 44-55
  Electronic Edition (link) BibTeX

• Wayne M. Needham: Guest Editor's Introduction: Microprocessor Testing Today. 56-57 BibTeX
• Jeff Brauch, Jay Fleischman:
  Design of Cache Test Hardware on the HP PA8500. 58-63
  Electronic Edition (link) BibTeX
• R. Scott Fetherston, Imtiaz P. Shaik, Siyad C. Ma:
  Testability Features of the AMD-K6 Microprocessor. 64-69
  Electronic Edition (link) BibTeX
• Dale Amason, Alfred L. Crouch, Renny Eisele, Grady Giles, Michael Mateja:
  Test Development for Second-Generation ColdFire Microprocessors. 70-76
  Electronic Edition (link) BibTeX
• Adrian Carbine, Derek Feltham:
  Pentium Pro Processor Design for Test and Debug. 77-82
  Electronic Edition (link) BibTeX
• Thomas G. Foote, Dale E. Hoffman, William V. Huott, Timothy J. Koprowski, Mary P. Kusko, Bryan J. Robbins:
  Testing the 500-MHz IBM S/390 Microprocessor. 83-89
  Electronic Edition (link) BibTeX
• Carol Pyron, Javier Prado, James Golab:
  Test Strategy for the PowerPC 750 Microprocessor. 90-97
  Electronic Edition (link) BibTeX
• Carol Stolicny, Richard Davies, Pamela McKernan, Tuyen Truong:
  Alpha 21164 Manufacturing Test Development and Coverage Analysis. 98-104
  Electronic Edition (link) BibTeX

• Dimitris Gizopoulos, Antonis M. Paschalis, Yervant Zorian:
  Effective Built-In Self-Test for Booth Multipliers. 105-111
  Electronic Edition (link) BibTeX
• Michel Dubois, Jaeheon Jeong, Yong Ho Song, Adrian Moga:
  Rapid Hardware Prototyping on RPM-2. 112-118
  Electronic Edition (link) BibTeX
• A D&T Roundtable: Challenges for Low-Power and High-Performance Chips. 119-124 BibTeX

• Test Technology TC Newsletter. 125-126 BibTeX
• Design Automation Technical Committee Newsletter. 126-127 BibTeX

• Scott Davidson: Minutes Found on a Cave Wall. 128- BibTeX

Volume 15, Number 4, October-December 1998

• Yervant Zorian: Challenges and Options. 3- BibTeX

• Mukund Modi: IEEE Standards Coordinating Committee 20. 4-6 BibTeX

• Bill Bottoms:
  The Third Millennium's Test Dilemma. 7-11
  Electronic Edition (link) BibTeX

• Ramesh Karri, Michael Nicolaidis: Guest Editors' Introduction: Online VLSI Testing. 12-16 BibTeX
• Hussain Al-Asaad, Brian T. Murray, John P. Hayes:
  Online BIST for Embedded Systems. 17-24
  Electronic Edition (link) BibTeX
• Samuel Norman Hamilton, Alex Orailoglu:
  Efficient Self-Recovering ASIC Design. 25-35
  Electronic Edition (link) BibTeX
• Sybille Hellebrand, Hans-Joachim Wunderlich, Andre Hertwig:
  Synthesizing Fast, Online-Testable Control Units. 36-41
  Electronic Edition (link) BibTeX
• Cecilia Metra, Michele Favalli, Bruno Riccò:
  Concurrent Checking of Clock Signal Correctness. 42-48
  Electronic Edition (link) BibTeX
• Jien-Chung Lo:
  Online Current Testing. 49-56
  Electronic Edition (link) BibTeX
• Eberhard Böhl, Thomas Lindenkreuz, Matthias Meerwein:
  On-Chip IDDQ Testing in the AE11 Fail-Stop Controller. 57-65
  Electronic Edition (link) BibTeX
• Cristiana Bolchini, Fabio Salice, Donatella Sciuto:
  Fault Analysis for Networks with Concurrent Error Detection. 66-74
  Electronic Edition (link) BibTeX

• Glenn H. Chapman, Benoit Dufort:
  Using Laser Defect Avoidance to Build Large-Area FPGAs. 75-81
  Electronic Edition (link) BibTeX

• Deep-Submicron Noise. 82-88 BibTeX

• IEEE Design & Test of Computers, 1998 Annual Index, Volume 15. 89-92 BibTeX

• TTTC Newsletter. 93-94 BibTeX

• Design Automation Technical Committee Newsletter. 95- BibTeX

• Scott Davidson: The Last Byte. 96- BibTeX