| 2009 |
| 52 | EE | Cristiana Bolchini,
Yong-Bin Kim:
Guest Editorial.
J. Electronic Testing 25(1): 9-10 (2009) |
| 2008 |
| 51 | | Cristiana Bolchini,
Yong-Bin Kim,
Dimitris Gizopoulos,
Mohammad Tehranipoor:
23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 1-3 October 2008, Boston, MA, USA
IEEE Computer Society 2008 |
| 50 | EE | Sheng Lin,
Yong-Bin Kim,
Fabrizio Lombardi:
A low leakage 9t sram cell for ultra-low power operation.
ACM Great Lakes Symposium on VLSI 2008: 123-126 |
| 49 | EE | Stephen Frechette,
Yong-Bin Kim,
Fabrizio Lombardi:
Checkpointing of Rectilinear Growth in DNA Self-Assembly.
DFT 2008: 525-533 |
| 48 | EE | Jun Zhao,
Yong-Bin Kim:
A low power 32 nanometer CMOS digitally controlled oscillator.
SoCC 2008: 183-186 |
| 47 | EE | Young Bok Kim,
Yong-Bin Kim,
Fabrizio Lombardi:
Low power 8T SRAM using 32nm independent gate FinFET technology.
SoCC 2008: 247-250 |
| 46 | EE | Kyung Ki Kim,
Jing Huang,
Yong-Bin Kim,
Fabrizio Lombardi:
Analysis and Simulation of Jitter Sequences for Testing Serial Data Channels.
IEEE Trans. Industrial Informatics 4(2): 134-143 (2008) |
| 45 | EE | Byunghyun Jang,
Yong-Bin Kim,
Fabrizio Lombardi:
Monomer Control for Error Tolerance in DNA Self-Assembly.
J. Electronic Testing 24(1-3): 271-284 (2008) |
| 2007 |
| 44 | | Cristiana Bolchini,
Yong-Bin Kim,
Adelio Salsano,
Nur A. Touba:
22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 26-28 September 2007, Rome, Italy.
IEEE Computer Society 2007 |
| 43 | EE | Young Bok Kim,
Yong-Bin Kim:
Fault Tolerant Source Routing for Network-on-Chip.
DFT 2007: 12-20 |
| 42 | EE | Ravi Bonam,
Yong-Bin Kim,
Minsu Choi:
Defect-Tolerant Gate Macro Mapping & Placement in Clock-Free Nanowire Crossbar Architecture.
DFT 2007: 161-169 |
| 41 | EE | Yong-Bin Kim,
Kyung Ki Kim,
James T. Doyle:
A CMOS Low Power Fully Digital Adaptive Power Delivery System Based on Finite State Machine Control.
ISCAS 2007: 1149-1152 |
| 40 | EE | Kyung Ki Kim,
Yong-Bin Kim:
Optimal Body Biasing for Minimum Leakage Power in Standby Mode.
ISCAS 2007: 1161-1164 |
| 39 | EE | Kyung Ki Kim,
Yong-Bin Kim,
Minsu Choi,
Nohpill Park:
Leakage Minimization Technique for Nanoscale CMOS VLSI.
IEEE Design & Test of Computers 24(4): 322-330 (2007) |
| 38 | EE | Young-Jun Lee,
Jihyun Lee,
Kyung Ki Kim,
Yong-Bin Kim,
Joseph Ayers:
Low power CMOS electronic central pattern generator design for a biomimetic underwater robot.
Neurocomputing 71(1-3): 284-296 (2007) |
| 37 | EE | Leonid Zamdborg,
Richard D. LeDuc,
Kevin J. Glowacz,
Yong-Bin Kim,
Vinayak Viswanathan,
Ian T. Spaulding,
Bryan P. Early,
Eric J. Bluhm,
Shannee Babai,
Neil L. Kelleher:
ProSight PTM 2.0: improved protein identification and characterization for top down mass spectrometry.
Nucleic Acids Research 35(Web-Server-Issue): 701-706 (2007) |
| 2006 |
| 36 | EE | Rui Tang,
Yong-Bin Kim:
PWAM signalling scheme for high speed serial link transceiver design.
ACM Great Lakes Symposium on VLSI 2006: 49-52 |
| 35 | EE | Fengming Zhang,
Warren Necoechea,
Peter Reiter,
Yong-Bin Kim,
Fabrizio Lombardi:
Load Board Designs Using Compound Dot Technique and Phase Detector for Hierarchical ATE Calibrations.
DFT 2006: 486-494 |
| 34 | EE | Byunghyun Jang,
Yong-Bin Kim,
Fabrizio Lombardi:
Error Tolerance of DNA Self-Assembly by Monomer Concentration Control.
DFT 2006: 89-97 |
| 33 | EE | Yadunandana Yellambalase,
Minsu Choi,
Yong-Bin Kim:
Inherited Redundancy and Configurability Utilization for Repairing Nanowire Crossbars with Clustered Defects.
DFT 2006: 98-106 |
| 32 | EE | Woon Kang,
Yong-Bin Kim,
T. Doyle:
A high-efficiency fully digital synchronous buck converter power delivery system based on a finite-state machine.
IEEE Trans. VLSI Syst. 14(3): 229-240 (2006) |
| 31 | EE | Jihyun Lee,
Yong-Bin Kim:
ASLIC: A low power CMOS analog circuit design automation.
Integration 39(3): 157-181 (2006) |
| 30 | EE | Rui Tang,
Fengming Zhang,
Yong-Bin Kim:
Design metal-dot based QCA circuits using SPICE model.
Microelectronics Journal 37(8): 821-827 (2006) |
| 2005 |
| 29 | EE | Rui Tang,
Fengming Zhang,
Yong-Bin Kim:
Quantum-dot cellular automata SPICE macro model.
ACM Great Lakes Symposium on VLSI 2005: 108-111 |
| 28 | EE | Kyung Ki Kim,
Jing Huang,
Yong-Bin Kim,
Fabrizio Lombardi:
On the Modeling and Analysis of Jitter in ATE Using Matlab.
DFT 2005: 285-293 |
| 27 | EE | Kyung Ki Kim,
Yong-Bin Kim,
Fabrizio Lombardi:
Data Dependent Jitter (DDJ) Characterization Methodology.
DFT 2005: 294-304 |
| 26 | EE | Rui Tang,
Fengming Zhang,
Yong-Bin Kim:
QCA-based nano circuits design [adder design example].
ISCAS (3) 2005: 2527-2530 |
| 25 | EE | Jihyun Lee,
Yong-Bin Kim:
ASLIC: A Low Power CMOS Analog Circuit Design Automation.
ISQED 2005: 470-475 |
| 24 | EE | Fengming Zhang,
Rui Tang,
Yong-Bin Kim:
SET-based nano-circuit simulation and design method using HSPICE.
Microelectronics Journal 36(8): 741-748 (2005) |
| 2004 |
| 23 | EE | Fengming Zhang,
Rui Tang,
Yong-Bin Kim:
SET-based nano-circuit simulation and design method using HSPICE.
ACM Great Lakes Symposium on VLSI 2004: 344-347 |
| 22 | EE | T. Feng,
Byoungjae Jin,
J. Wang,
Nohpill Park,
Yong-Bin Kim,
Fabrizio Lombardi:
Fault tolerant clockless wave pipeline design.
Conf. Computing Frontiers 2004: 350-356 |
| 21 | EE | Luca Schiano,
Yong-Bin Kim,
Fabrizio Lombardi:
Scan Test of IP Cores in an ATE Environment.
DELTA 2004: 281-286 |
| 20 | EE | T. Feng,
Nohpill Park,
Yong-Bin Kim,
Fabrizio Lombardi,
Fred J. Meyer:
Reliability Modeling and Assurance of Clockless Wave Pipeline.
DFT 2004: 442-450 |
| 19 | | Young-Jun Lee,
Yong-Bin Kim:
A fast and precise interconnect capacitive coupling noise model.
ISCAS (2) 2004: 873-876 |
| 18 | | Young-Jun Lee,
Jihyun Lee,
Yong-Bin Kim,
Joseph Ayers,
A. Volkovskii,
Allen I. Selverston,
Henry D. I. Abarbanel,
Mikhail I. Rabinovich:
Low power real time electronic neuron VLSI design using subthreshold technique.
ISCAS (4) 2004: 744-747 |
| 17 | EE | Minsu Choi,
Nohpill Park,
Vincenzo Piuri,
Yong-Bin Kim,
Fabrizio Lombardi:
Balanced dual-stage repair for dependable embedded memory cores.
Journal of Systems Architecture 50(5): 281-285 (2004) |
| 16 | EE | James T. Doyle,
Young-Jun Lee,
Yong-Bin Kim:
Fast and accurate DAC modeling techniques based on wavelet theory.
Microelectronics Journal 35(5): 451-460 (2004) |
| 15 | | Richard D. LeDuc,
Gregory K. Taylor,
Yong-Bin Kim,
Thomas E. Januszyk,
Lee H. Bynum,
Joseph V. Sola,
John S. Garavelli,
Neil L. Kelleher:
ProSight PTM: an integrated environment for protein identification and characterization by top-down mass spectrometry.
Nucleic Acids Research 32(Web-Server-Issue): 340-345 (2004) |
| 2003 |
| 14 | EE | Yeshwant Kolla,
Yong-Bin Kim,
John Carter:
A novel 32-bit scalable multiplier architecture.
ACM Great Lakes Symposium on VLSI 2003: 241-244 |
| 13 | EE | Fengming Zhang,
Young-Jun Lee,
T. Kane,
Luca Schiano,
Mariam Momenzadeh,
Yong-Bin Kim,
Fred J. Meyer,
Fabrizio Lombardi,
S. Max,
Phil Perkinson:
A Digital and Wide Power Bandwidth H-Field Generator for Automatic Test Equipment.
DFT 2003: 159-166 |
| 12 | EE | T. Feng,
Nohpill Park,
Yong-Bin Kim,
Vincenzo Piuri:
Yield Modeling and Analysis of a Clockless Asynchronous Wave Pipeline with Pulse Faults.
DFT 2003: 34- |
| 11 | EE | Young-Jun Lee,
Jong-Jin Lim,
Yong-Bin Kim:
A Novel Clocking Strategy for Dynamic Circuits.
ISQED 2003: 307-312 |
| 10 | EE | Minsu Choi,
Hardy J. Pottinger,
Nohpill Park,
Yong-Bin Kim:
Need For Undergraduate And Graduate-Level Education In Testing Of Microelectronic Circuits And Systems.
MSE 2003: 121-122 |
| 9 | EE | Minsu Choi,
Nohpill Park,
Fabrizio Lombardi,
Yong-Bin Kim,
Vincenzo Piuri:
Optimal Spare Utilization in Repairable and Reliable Memory Cores.
MTDT 2003: 64-71 |
| 8 | EE | Minsu Choi,
Noh-Jin Park,
K. M. George,
Byoungjae Jin,
Nohpill Park,
Yong-Bin Kim,
Fabrizio Lombardi:
Fault Tolerant Memory Design for HW/SW Co-Reliability in Massively Parallel Computing Systems.
NCA 2003: 341- |
| 7 | EE | Soha Hassoun,
Yong-Bin Kim,
Fabrizio Lombardi:
Guest Editors' Introduction: Clockless VLSI Systems.
IEEE Design & Test of Computers 20(6): 5-8 (2003) |
| 6 | EE | Woo Jin Kim,
Yong-Bin Kim:
Automating Wave-Pipelined Circuit Design.
IEEE Design & Test of Computers 20(6): 51-58 (2003) |
| 2002 |
| 5 | EE | Hamidreza Hashempour,
Yong-Bin Kim,
Nohpill Park:
A Test-Vector Generation Methodology for Crosstalk Noise Faults.
DFT 2002: 40-50 |
| 4 | EE | Minsu Choi,
Nohpill Park,
Fabrizio Lombardi,
Yong-Bin Kim,
Vincenzo Piuri:
Balanced Redundancy Utilization in Embedded Memory Cores for Dependable Systems.
DFT 2002: 419-427 |
| 3 | EE | Dae Woon Kang,
Yong-Bin Kim:
Design flow of robust routed power distribution for low power ASIC.
ISCAS (1) 2002: 181-184 |
| 2 | EE | Minsu Choi,
Nohpill Park,
Yong-Bin Kim,
Fabrizio Lombardi:
Hardware/Software Co-Reliability of Configurable Digital Systems.
PRDC 2002: 67-74 |
| 2001 |
| 1 | EE | Chris Winstead,
Jie Dai,
Woo Jin Kim,
Scott Little,
Yong-Bin Kim,
Chris J. Myers,
Christian Schlegel:
Analog MAP Decoder for (8, 4) Hamming Code in Subthreshold CMOS.
ARVLSI 2001: 132-147 |