| 2003 |
|---|
| 5 | EE | Farzin Karimi,
V. Swamy Irrinki,
T. Crosby,
Nohpill Park,
Fabrizio Lombardi:
Parallel testing of multi-port static random access memories.
Microelectronics Journal 34(1): 3-21 (2003) |
| 2001 |
|---|
| 4 | EE | Farzin Karimi,
Fabrizio Lombardi,
V. Swamy Irrinki,
T. Crosby:
A Parallel Approach for Testing Multi-Port Static Random Access Memories.
MTDT 2001: 73- |
| 2000 |
|---|
| 3 | EE | Alvin Jee,
Jonathon E. Colburn,
V. Swamy Irrinki,
Mukesh Puri:
Optimizing Memory Tests by Analyzing Defect Coverage.
MTDT 2000: 20-28 |
| 2 | EE | Jun Zhao,
V. Swamy Irrinki,
Mukesh Puri,
Fabrizio Lombardi:
Detection of Inter-Port Faults in Multi-Port Static RAMs.
VTS 2000: 297-304 |
| 1 | EE | Jun Zhao,
V. Swamy Irrinki,
Mukesh Puri,
Fabrizio Lombardi:
Testing SRAM-Based Content Addressable Memories.
IEEE Trans. Computers 49(10): 1054-1063 (2000) |
