| 2003 |
|---|
| 9 | EE | Hamidreza Hashempour,
Fred J. Meyer,
Fabrizio Lombardi,
Farzin Karimi:
Hybrid Multisite Testing at Manufacturing.
ITC 2003: 927-936 |
| 8 | EE | Farzin Karimi,
V. Swamy Irrinki,
T. Crosby,
Nohpill Park,
Fabrizio Lombardi:
Parallel testing of multi-port static random access memories.
Microelectronics Journal 34(1): 3-21 (2003) |
| 2002 |
|---|
| 7 | EE | Farzin Karimi,
Waleed Meleis,
Zainalabedin Navabi,
Fabrizio Lombardi:
Data Compression for System-on-Chip Testing Using ATE.
DFT 2002: 166-176 |
| 6 | EE | Farzin Karimi,
Fabrizio Lombardi:
A Scan-Bist Environment for Testing Embedded Memories.
IOLTW 2002: 211- |
| 5 | EE | Farzin Karimi,
Fred J. Meyer,
Fabrizio Lombardi:
Random Testing of Multi-Port Static Random Access Memories.
MTDT 2002: 101-108 |
| 4 | EE | Farzin Karimi,
Fabrizio Lombardi:
A Scan-Bist Environment for Testing Embedded Memories.
MTDT 2002: 17- |
| 2001 |
|---|
| 3 | EE | Farzin Karimi,
Fabrizio Lombardi:
Parallel Testing of Multi-port Static Random Access Memories for BIST.
DFT 2001: 271-279 |
| 2 | EE | Farzin Karimi,
Fabrizio Lombardi,
V. Swamy Irrinki,
T. Crosby:
A Parallel Approach for Testing Multi-Port Static Random Access Memories.
MTDT 2001: 73- |
| 1 | EE | Wenyi Feng,
Farzin Karimi,
Fabrizio Lombardi:
Fault Detection in a Tristate System Environment.
IEEE Micro 21(5): 77-85 (2001) |
