MTDT 2001:
San Jose,
CA,
USA
9th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2001), 6-7 August 2001, San Jose, CA, USA.
IEEE Computer Society 2001, ISBN 0-7695-1242-9 BibTeX
@proceedings{DBLP:conf/mtdt/2001,
title = {9th IEEE International Workshop on Memory Technology, Design,
and Testing (MTDT 2001), 6-7 August 2001, San Jose, CA, USA},
booktitle = {MTDT},
publisher = {IEEE Computer Society},
year = {2001},
isbn = {0-7695-1242-9},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Memory Design
Memory BIST
Redundancy and Error Control
Fault Models and Multi-Port SRAM Testing
Verification and Test
Copyright © Sat May 16 23:30:58 2009
by Michael Ley (ley@uni-trier.de)
