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DFT 1998: Austin, TX, USA

13th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT '98), 2-4 November 1998, Austin, TX, USA, Proceedings. IEEE Computer Society 1998, ISBN 0-8186-8832-7 BibTeX
@proceedings{DBLP:conf/dft/1998,
  title     = {13th International Symposium on Defect and Fault-Tolerance in
               VLSI Systems (DFT '98), 2-4 November 1998, Austin, TX, USA, Proceedings},
  booktitle = {DFT},
  publisher = {IEEE Computer Society},
  year      = {1998},
  isbn      = {0-8186-8832-7},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

Session 1: Yield and Defect Density

Session 2: Layout and Critical Area

Session 3: Reliability Enhancement

Session 4: Defect and Fault Analysis

Session 5: Testing Techniques

Session 6: Testing of Regular Structures

Session 7: Concurrent Testing Techniques

Session 8: Fault Diagnosis

Session 9: Fault-Tolerant Designs I

Session 10: Fault-Tolerant Designs II

Session 11: High-Level Synthesis of Reliable Systems

Session 12: Yield and Reliability Issues of Analog and Mixed Signal Circuits

Copyright © Sat May 16 23:06:35 2009 by Michael Ley (ley@uni-trier.de)