MTDT 2004:
San José,
CA,
USA
12th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2004), 9-10 August 2004, San Jose, CA, USA.
IEEE Computer Society 2004, ISBN 0-7695-2193-2 BibTeX
Session 2:
Fast ECC and Efficient Cache Controllers
Session 3:
Memory Fault Coverage and Test Analysis
Session 4:
Special Session
Session 5:
Embedded Memory Test Trends and Future
Session 6:
Industrial Practices on BIST,
BISD and BISR
- Rita Zappa, Carolina Selva, Danilo Rimondi, Cosimo Torelli, M. Crestan, Giovanni Mastrodomenico, Lara Albani:
Micro Programmable Built-In Self Repair for SRAMs.
72-77
Electronic Edition (link) BibTeX
- Swapnil Bahl:
A Novel Method for Silicon Configurable Test Flow and Algorithms for Testing, Debugging and Characterizing Different Types of Embedded Memories through a Shared Controller.
78-83
Electronic Edition (link) BibTeX
- Carolina Selva, Cosimo Torelli, Danilo Rimondi, Rita Zappa, Stefano Corbani, Giovanni Mastrodomenico, Lara Albani:
A Programmable Built-in Self-Diagnosis for Embedded SRAM.
84-89
Electronic Edition (link) BibTeX
Session 7:
EDA Solutions to Test and Repair Memories
Session 8:
Making Memories More Reliable
Copyright © Sat May 16 23:30:58 2009
by Michael Ley (ley@uni-trier.de)
