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MTDT 2004: San José, CA, USA

12th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2004), 9-10 August 2004, San Jose, CA, USA. IEEE Computer Society 2004, ISBN 0-7695-2193-2 BibTeX

Session 2: Fast ECC and Efficient Cache Controllers

Session 3: Memory Fault Coverage and Test Analysis

Session 4: Special Session

Session 5: Embedded Memory Test Trends and Future

Session 6: Industrial Practices on BIST, BISD and BISR

Session 7: EDA Solutions to Test and Repair Memories

Session 8: Making Memories More Reliable

Copyright © Sat May 16 23:30:58 2009 by Michael Ley (ley@uni-trier.de)