2008 |
49 | EE | Zachary D. Patitz,
Nohpill Park:
Modeling and Evaluation of Threshold Defect Tolerance.
DFT 2008: 211-219 |
48 | | Noh-Jin Park,
K. M. George,
Nohpill Park:
A Probabilistic Risk Estimation with Multiple Regression Dependent Dummy Variable Method using Logit Transformation.
MSV 2008: 165-169 |
2007 |
47 | EE | Kyung Ki Kim,
Yong-Bin Kim,
Minsu Choi,
Nohpill Park:
Leakage Minimization Technique for Nanoscale CMOS VLSI.
IEEE Design & Test of Computers 24(4): 322-330 (2007) |
46 | EE | Myungsu Choi,
Zachary D. Patitz,
Byoungjae Jin,
Feng Tao,
Nohpill Park,
Minsu Choi:
Designing layout-timing independent quantum-dot cellular automata (QCA) circuits by global asynchrony.
Journal of Systems Architecture 53(9): 551-567 (2007) |
2006 |
45 | EE | Minsu Choi,
Myungsu Choi,
Zachary D. Patitz,
Nohpill Park:
Efficient and Robust Delay-Insensitive QCA (Quantum-Dot Cellular Automata) Design.
DFT 2006: 80-88 |
44 | | J. Y. Shin,
Noh-Jin Park,
Nohpill Park,
K. M. George:
Exploratory Data Analysis with Bivariate Dependence Functions.
MSV 2006: 217-223 |
2005 |
43 | | B. D. Gaston,
K. M. George,
Nohpill Park:
An Approach to Protection Using a Non-Persistent Client-Side Page Proxy.
Computers and Their Applications 2005: 226-231 |
42 | EE | Zachary D. Patitz,
Nohpill Park,
Minsu Choi,
Fred J. Meyer:
QCA-Based Majority Gate Design under Radius of Effect-Induced Faults.
DFT 2005: 217-228 |
41 | EE | Minsu Choi,
Nohpill Park:
Teaching Nanotechnology by Introducing Crossbar-Based Architecture and Quantum-Dot Cellular Automata.
MSE 2005: 29-30 |
40 | EE | Srivastav Sethupathy,
Nohpill Park,
Marcin Paprzycki:
Logic Restructuring for Delay Balancing in Wave-Pipelined Circuits: An Integer Programming Approach.
SYNASC 2005: 182-188 |
2004 |
39 | EE | T. Feng,
Byoungjae Jin,
J. Wang,
Nohpill Park,
Yong-Bin Kim,
Fabrizio Lombardi:
Fault tolerant clockless wave pipeline design.
Conf. Computing Frontiers 2004: 350-356 |
38 | EE | Shanrui Zhang,
Minsu Choi,
Nohpill Park:
Modeling Yield of Carbon-Nanotube/Silicon-Nanowire FET-Based Nanoarray Architecture with h-hot Addressing Scheme.
DFT 2004: 356-364 |
37 | EE | T. Feng,
Nohpill Park,
Yong-Bin Kim,
Fabrizio Lombardi,
Fred J. Meyer:
Reliability Modeling and Assurance of Clockless Wave Pipeline.
DFT 2004: 442-450 |
36 | EE | Shanrui Zhang,
Minsu Choi,
Nohpill Park,
Fabrizio Lombardi:
Probabilistic Balancing of Fault Coverage and Test Cost in Combined Built-In Self-Test/Automated Test Equipment Testing Environment.
DFT 2004: 48-56 |
35 | EE | Bin Liu,
Fabrizio Lombardi,
Nohpill Park,
Minsu Choi:
Testing Layered Interconnection Networks.
IEEE Trans. Computers 53(6): 710-722 (2004) |
34 | EE | Jun Zhao,
Fred J. Meyer,
Nohpill Park,
Fabrizio Lombardi:
Sequential diagnosis of processor array systems.
IEEE Transactions on Reliability 53(4): 487-498 (2004) |
33 | EE | Minsu Choi,
Nohpill Park,
Vincenzo Piuri,
Yong-Bin Kim,
Fabrizio Lombardi:
Balanced dual-stage repair for dependable embedded memory cores.
Journal of Systems Architecture 50(5): 281-285 (2004) |
2003 |
32 | EE | T. Feng,
Nohpill Park,
Yong-Bin Kim,
Vincenzo Piuri:
Yield Modeling and Analysis of a Clockless Asynchronous Wave Pipeline with Pulse Faults.
DFT 2003: 34- |
31 | EE | Noh-Jin Park,
Byoungjae Jin,
K. M. George,
Nohpill Park,
Minsu Choi:
Regressive Testing for System-on-Chip with Unknown-Good-Yield.
DFT 2003: 393-400 |
30 | | Noh-Jin Park,
Byoungjae Jin,
K. M. George,
Nohpill Park:
Performance Modeling and Analysis of Distributed Web Server (DWS) System with Access Frequency Distribution (AFD).
ISCA PDCS 2003: 224-229 |
29 | | Wirachai Yanphanich,
K. M. George,
Nohpill Park:
Multi-node Failure Detection and Recovery in a Pipeline Cluster.
ISCA PDCS 2003: 244-249 |
28 | EE | Minsu Choi,
Hardy J. Pottinger,
Nohpill Park,
Yong-Bin Kim:
Need For Undergraduate And Graduate-Level Education In Testing Of Microelectronic Circuits And Systems.
MSE 2003: 121-122 |
27 | EE | Minsu Choi,
Nohpill Park,
Fabrizio Lombardi,
Yong-Bin Kim,
Vincenzo Piuri:
Optimal Spare Utilization in Repairable and Reliable Memory Cores.
MTDT 2003: 64-71 |
26 | | B. Jang,
Nohpill Park,
K. M. George,
G. E. Hedrick:
Modeling and Evaluation of the Interconnection-driven Repairability for Distributed Embedded Memory Cores on Chip.
Modelling, Identification and Control 2003: 403-408 |
25 | EE | Minsu Choi,
Noh-Jin Park,
K. M. George,
Byoungjae Jin,
Nohpill Park,
Yong-Bin Kim,
Fabrizio Lombardi:
Fault Tolerant Memory Design for HW/SW Co-Reliability in Massively Parallel Computing Systems.
NCA 2003: 341- |
24 | | T. Feng,
Nohpill Park,
K. M. George:
Hardware/Software Co-Reliability of Field Reconfigurable Multi-Processor-Memory Systems with Redundant Bus.
PDPTA 2003: 1886-1890 |
23 | EE | Fred J. Meyer,
Nohpill Park:
Predicting Defect-Tolerant Yield in the Embedded Core Context.
IEEE Trans. Computers 52(11): 1470-1479 (2003) |
22 | EE | Jun Zhao,
Fred J. Meyer,
Fabrizio Lombardi,
Nohpill Park:
Maximal diagnosis of interconnects of random access memories.
IEEE Transactions on Reliability 52(4): 423-434 (2003) |
21 | EE | Farzin Karimi,
V. Swamy Irrinki,
T. Crosby,
Nohpill Park,
Fabrizio Lombardi:
Parallel testing of multi-port static random access memories.
Microelectronics Journal 34(1): 3-21 (2003) |
2002 |
20 | EE | Fabrizio Lombardi,
Nohpill Park:
Testing Layered Interconnection Networks.
DFT 2002: 293-304 |
19 | EE | Hamidreza Hashempour,
Yong-Bin Kim,
Nohpill Park:
A Test-Vector Generation Methodology for Crosstalk Noise Faults.
DFT 2002: 40-50 |
18 | EE | Minsu Choi,
Nohpill Park,
Fabrizio Lombardi,
Yong-Bin Kim,
Vincenzo Piuri:
Balanced Redundancy Utilization in Embedded Memory Cores for Dependable Systems.
DFT 2002: 419-427 |
17 | EE | Y. Chang,
Minsu Choi,
Nohpill Park,
Fabrizio Lombardi:
Repairability Evaluation of Embedded Multiple Region DRAMs.
DFT 2002: 428-436 |
16 | | Wirachai Yanphanich,
K. M. George,
Nohpill Park:
A Fault Tolerant Pipelined Cluster Model.
IASTED PDCS 2002: 508-514 |
15 | EE | Minsu Choi,
Nohpill Park,
Fabrizio Lombardi:
Hardware-Software Co-Reliability in Field Reconfigurable Multi-Processor-Memory Systems.
IPDPS 2002 |
14 | | Wirachai Yanphanich,
K. M. George,
Nohpill Park:
Clustering with Mobile Agents.
PDPTA 2002: 429-435 |
13 | EE | Minsu Choi,
Nohpill Park,
Yong-Bin Kim,
Fabrizio Lombardi:
Hardware/Software Co-Reliability of Configurable Digital Systems.
PRDC 2002: 67-74 |
2001 |
12 | EE | Xiao-Tao Chen,
Wei-Kang Huang,
Nohpill Park,
Fred J. Meyer,
Fabrizio Lombardi:
Novel Approaches for Fault Detection in Two-Dimensional Combinational Arrays.
DFT 2001: 161-169 |
11 | EE | Mohammad A. Al-Hashimi,
Huay-min H. Pu,
Nohpill Park,
Fabrizio Lombardi:
Dependability under Malicious Agreement in N-modular Redundancy-on-Demand Systems.
NCA 2001: 80-93 |
10 | EE | Minsu Choi,
Nohpill Park,
Fred J. Meyer,
Fabrizio Lombardi:
Connectivity-Based Multichip Module Repair.
PRDC 2001: 19-26 |
9 | EE | Fabrizio Lombardi,
Nohpill Park,
Mohammad A. Al-Hashimi,
Huay-min H. Pu:
Modeling the Dependability of N-Modular Redundancy on Demand under Malicious Agreement.
PRDC 2001: 68-75 |
2000 |
8 | EE | Nohpill Park,
S. J. Ruiwale,
Fabrizio Lombardi:
Testing the Configurability of Dynamic FPGAs.
DFT 2000: 311-319 |
7 | EE | Nohpill Park,
Fred J. Meyer,
Fabrizio Lombardi:
Quality-Effective Repair of Multichip Module Systems.
DFT 2000: 47-55 |
1999 |
6 | EE | Nohpill Park,
Fabrizio Lombardi:
Stratified Testing of Multichip Module Systems under Uneven Known-Good-Yield.
DFT 1999: 192-200 |
5 | EE | Xiao-Tao Chen,
Wei-Kang Huang,
Nohpill Park,
Fred J. Meyer,
Fabrizio Lombardi:
Design Verification of FPGA Implementations.
IEEE Design & Test of Computers 16(2): 66-73 (1999) |
1997 |
4 | EE | D. G. Ashen,
Fred J. Meyer,
Nohpill Park,
Fabrizio Lombardi:
Testing of programmable logic devices (PLD) with faulty resources.
DFT 1997: 76-84 |
3 | | X. Tan,
J. Tong,
P. Tan,
Nohpill Park,
Fabrizio Lombardi:
An Efficient Multi-Way Algorithm for Balanced Partitioning of VLSI Circuits.
ICCD 1997: 608-613 |
1996 |
2 | EE | Yinan N. Shen,
Nohpill Park,
Fabrizio Lombardi:
Space Cutting Approaches for Repairing Memories.
ICCD 1996: 106-111 |
1 | EE | José Salinas,
Nohpill Park,
U. Arunkumar,
Fabrizio Lombardi:
Conformance Testing of Time-Dependent Protocols.
ICECCS 1996: 257-264 |