2009 |
52 | EE | Syed Z. Shazli,
Mehdi Baradaran Tahoori:
Soft error rate computation in early design stages using boolean satisfiability.
ACM Great Lakes Symposium on VLSI 2009: 101-104 |
51 | EE | Mehdi Baradaran Tahoori:
BISM: built-in self map for hybrid crossbar nano-architectures.
ACM Great Lakes Symposium on VLSI 2009: 153-156 |
2008 |
50 | EE | Syed Z. Shazli,
Mehdi Baradaran Tahoori:
Obtaining Microprocessor Vulnerability Factor Using Formal Methods.
DFT 2008: 63-71 |
2007 |
49 | EE | Hossein Asadi,
Mehdi Baradaran Tahoori,
Chandra Tirumurti:
Estimating Error Propagation Probabilities with Bounded Variances.
DFT 2007: 41-49 |
48 | EE | Brian Mullins,
Hossein Asadi,
Mehdi Baradaran Tahoori,
David R. Kaeli,
Kevin Granlund,
Rudy Bauer,
Scott Romano:
Case Study: Soft Error Rate Analysis in Storage Systems.
VTS 2007: 256-264 |
47 | EE | Ghazanfar Asadi,
Mehdi Baradaran Tahoori:
An Accurate SER Estimation Method Based on Propagation Probability
CoRR abs/0710.4712: (2007) |
46 | EE | Hossein Asadi,
Mehdi Baradaran Tahoori:
Analytical Techniques for Soft Error Rate Modeling and Mitigation of FPGA-Based Designs.
IEEE Trans. VLSI Syst. 15(12): 1320-1331 (2007) |
45 | EE | Mehdi Baradaran Tahoori,
Subhasish Mitra:
Application-Dependent Delay Testing of FPGAs.
IEEE Trans. on CAD of Integrated Circuits and Systems 26(3): 553-563 (2007) |
2006 |
44 | EE | Hossein Asadi,
Vilas Sridharan,
Mehdi Baradaran Tahoori,
David R. Kaeli:
Vulnerability analysis of L2 cache elements to single event upsets.
DATE 2006: 1276-1281 |
43 | EE | Hossein Asadi,
Mehdi Baradaran Tahoori:
Soft error derating computation in sequential circuits.
ICCAD 2006: 497-501 |
42 | EE | Mehdi Baradaran Tahoori:
Application-independent defect-tolerant crossbar nano-architectures.
ICCAD 2006: 730-734 |
41 | EE | Hossein Asadi,
Mehdi Baradaran Tahoori:
Soft error hardening for logic-level designs.
ISCAS 2006 |
40 | EE | Vilas Sridharan,
Hossein Asadi,
Mehdi Baradaran Tahoori,
David R. Kaeli:
Reducing Data Cache Susceptibility to Soft Errors.
IEEE Trans. Dependable Sec. Comput. 3(4): 353-364 (2006) |
39 | EE | Mehdi Baradaran Tahoori:
Application-Dependent Testing of FPGAs.
IEEE Trans. VLSI Syst. 14(9): 1024-1033 (2006) |
38 | EE | Mehdi Baradaran Tahoori:
Application-independent defect tolerance of reconfigurable nanoarchitectures.
JETC 2(3): 197-218 (2006) |
2005 |
37 | EE | Ghazanfar Asadi,
Mehdi Baradaran Tahoori:
An Accurate SER Estimation Method Based on Propagation Probability.
DATE 2005: 306-307 |
36 | EE | Mehdi Baradaran Tahoori:
Defects, Yield, and Design in Sublithographic Nano-electronics.
DFT 2005: 3-11 |
35 | EE | Bhushan Vaidya,
Mehdi Baradaran Tahoori:
Delay Test Generation with All Reachable Output Propagation and Multiple Excitations.
DFT 2005: 380-388 |
34 | EE | Jeetendra Kumar,
Mehdi Baradaran Tahoori:
A Low Power Soft Error Suppression Technique for Dynamic Logic.
DFT 2005: 454-462 |
33 | EE | Hossein Asadi,
Mehdi Baradaran Tahoori:
Soft Error Modeling and Protection for Sequential Elements.
DFT 2005: 463-474 |
32 | EE | Ghazanfar Asadi,
Mehdi Baradaran Tahoori:
Soft error rate estimation and mitigation for SRAM-based FPGAs.
FPGA 2005: 149-160 |
31 | | Mehdi Baradaran Tahoori:
A mapping algorithm for defect-tolerance of reconfigurable nano-architectures.
ICCAD 2005: 668-672 |
30 | EE | Ghazanfar Asadi,
Mehdi Baradaran Tahoori:
An analytical approach for soft error rate estimation in digital circuits.
ISCAS (3) 2005: 2991-2994 |
29 | EE | Ghazanfar-Hossein Asadi,
Vilas Sridharan,
Mehdi Baradaran Tahoori,
David R. Kaeli:
Balancing Performance and Reliability in the Memory Hierarchy.
ISPASS 2005: 269-279 |
28 | EE | Ghazanfar Asadi,
Mehdi Baradaran Tahoori:
Soft Error Mitigation for SRAM-Based FPGAs.
VTS 2005: 207-212 |
27 | EE | R. Iris Bahar,
Mehdi Baradaran Tahoori,
Sandeep K. Shukla,
Fabrizio Lombardi:
Guest Editors' Introduction: Challenges for Reliable Design at the Nanoscale.
IEEE Design & Test of Computers 22(4): 295-297 (2005) |
26 | EE | Jing Huang,
Mehdi Baradaran Tahoori,
Fabrizio Lombardi:
Fault Tolerance of Switch Blocks and Switch Block Arrays in FPGA.
IEEE Trans. VLSI Syst. 13(7): 794-807 (2005) |
25 | EE | Mehdi Baradaran Tahoori,
Subhasish Mitra:
Application-independent testing of FPGA interconnects.
IEEE Trans. on CAD of Integrated Circuits and Systems 24(11): 1774-1783 (2005) |
24 | EE | Mariam Momenzadeh,
Jing Huang,
Mehdi Baradaran Tahoori,
Fabrizio Lombardi:
Characterization, test, and logic synthesis of and-or-inverter (AOI) gate design for QCA implementation.
IEEE Trans. on CAD of Integrated Circuits and Systems 24(12): 1881-1893 (2005) |
23 | EE | Jing Huang,
Mehdi Baradaran Tahoori,
Fabrizio Lombardi:
A probabilistic analysis of fault tolerance for switch block array in FPGAs.
IJES 1(3/4): 250-262 (2005) |
2004 |
22 | EE | Jing Huang,
Mariam Momenzadeh,
Mehdi Baradaran Tahoori,
Fabrizio Lombardi:
Design and characterization of an and-or-inverter (AOI) gate for QCA implementation.
ACM Great Lakes Symposium on VLSI 2004: 426-429 |
21 | EE | Jing Huang,
Mehdi Baradaran Tahoori,
Fabrizio Lombardi:
Fault Tolerance of Programmable Switch Blocks.
DATE 2004: 1358-1359 |
20 | EE | Mehdi Baradaran Tahoori,
Fabrizio Lombardi:
Testing of Quantum Dot Cellular Automata Based Designs.
DATE 2004: 1408-1409 |
19 | EE | Rajeev Murgai,
Subodh M. Reddy,
Takashi Miyoshi,
Takeshi Horie,
Mehdi Baradaran Tahoori:
Sensitivity-Based Modeling and Methodology for Full-Chip Substrate Noise Analysis.
DATE 2004: 610-615 |
18 | EE | Jing Huang,
Mariam Momenzadeh,
Mehdi Baradaran Tahoori,
Fabrizio Lombardi:
Defect Characterization for Scaling of QCA Devices.
DFT 2004: 30-38 |
17 | EE | Jing Huang,
Mehdi Baradaran Tahoori,
Fabrizio Lombardi:
On the Defect Tolerance of Nano-Scale Two-Dimensional Crossbars.
DFT 2004: 96-104 |
16 | EE | Mehdi Baradaran Tahoori,
Subhasish Mitra:
Defect and Fault Tolerance of Reconfigurable Molecular Computing.
FCCM 2004: 176-185 |
15 | EE | Jing Huang,
Mehdi Baradaran Tahoori,
Fabrizio Lombardi:
Probabilistic Analysis of Fault Tolerance of FPGA Switch Block Array.
IPDPS 2004 |
14 | EE | Mariam Momenzadeh,
Mehdi Baradaran Tahoori,
Jing Huang,
Fabrizio Lombardi:
Quantum Cellular Automata: New Defects and Faults for New Devices.
IPDPS 2004 |
13 | EE | Jing Huang,
Mehdi Baradaran Tahoori,
Fabrizio Lombardi:
Routability and Fault Tolerance of FPGA Interconnect Architectures.
ITC 2004: 479-488 |
12 | EE | Mehdi Baradaran Tahoori,
Subhasish Mitra:
Interconnect Delay Testing of Designs on Programmable Logic Devices.
ITC 2004: 635-644 |
11 | EE | Mehdi Baradaran Tahoori:
Application-Dependent Diagnosis of FPGAs.
ITC 2004: 645-654 |
10 | EE | Mehdi Baradaran Tahoori,
Edward J. McCluskey,
Michel Renovell,
Philippe Faure:
A Multi-Configuration Strategy for an Application Dependent Testing of FPGAs.
VTS 2004: 154-170 |
9 | EE | Mehdi Baradaran Tahoori,
Mariam Momenzadeh,
Jing Huang,
Fabrizio Lombardi:
Defects and Faults in Quantum Cellular Automata at Nano Scale.
VTS 2004: 291-296 |
8 | EE | Mehdi Baradaran Tahoori,
Subhasish Mitra:
Techniques and algorithms for fault grading of FPGA interconnect test configurations.
IEEE Trans. on CAD of Integrated Circuits and Systems 23(2): 261-272 (2004) |
7 | EE | Mehdi Baradaran Tahoori:
Application-Specific Bridging Fault Testing of FPGAs.
J. Electronic Testing 20(3): 279-289 (2004) |
2003 |
6 | EE | Mehdi Baradaran Tahoori:
Using satisfiability in application-dependent testing of FPGA interconnects.
DAC 2003: 678-681 |
5 | EE | Mehdi Baradaran Tahoori:
Application-Dependent Testing of FPGA Interconnects.
DFT 2003: 409-416 |
4 | EE | Mehdi Baradaran Tahoori:
A high resolution diagnosis technique for open and short defects in FPGA interconnects.
FPGA 2003: 248 |
3 | EE | Mehdi Baradaran Tahoori:
Application-dependent testing of FPGAs for bridging faults.
FPGA 2003: 248 |
2 | EE | Mehdi Baradaran Tahoori,
Subhasish Mitra:
Automatic Configuration Generation for FPGA Interconnect Testing.
VTS 2003: 134-144 |
2002 |
1 | EE | Mehdi Baradaran Tahoori,
Subhasish Mitra,
Shahin Toutounchi,
Edward J. McCluskey:
Fault Grading FPGA Interconnect Test Configurations.
ITC 2002: 608-617 |