| |
| 2000 | ||
|---|---|---|
| 3 | EE | Alvin Jee, Jonathon E. Colburn, V. Swamy Irrinki, Mukesh Puri: Optimizing Memory Tests by Analyzing Defect Coverage. MTDT 2000: 20-28 |
| 2 | EE | Jun Zhao, V. Swamy Irrinki, Mukesh Puri, Fabrizio Lombardi: Detection of Inter-Port Faults in Multi-Port Static RAMs. VTS 2000: 297-304 |
| 1 | EE | Jun Zhao, V. Swamy Irrinki, Mukesh Puri, Fabrizio Lombardi: Testing SRAM-Based Content Addressable Memories. IEEE Trans. Computers 49(10): 1054-1063 (2000) |
| 1 | Jonathon E. Colburn | [3] |
| 2 | V. Swamy Irrinki | [1] [2] [3] |
| 3 | Alvin Jee | [3] |
| 4 | Fabrizio Lombardi | [1] [2] |
| 5 | Jun Zhao | [1] [2] |