| 1997 |
|---|
| 14 | EE | Yinan N. Shen,
Xiao-Tao Chen,
Susumu Horiguchi,
Fabrizio Lombardi:
On the multiple fault diagnosis of multistage interconnection networks: the lower bound and the CMOS fault model.
ICPP 1997: 350- |
| 1996 |
|---|
| 13 | EE | Yinan N. Shen,
Nohpill Park,
Fabrizio Lombardi:
Space Cutting Approaches for Repairing Memories.
ICCD 1996: 106-111 |
| 12 | | José Salinas,
Yinan N. Shen,
Fabrizio Lombardi:
A Sweeping Line Approach to Interconnect Testing.
IEEE Trans. Computers 45(8): 917-929 (1996) |
| 11 | EE | Yinan N. Shen,
Fabrizio Lombardi:
Graph Algorithms for Conformance Testing Using the Rural ChinesePostman Tour.
SIAM J. Discrete Math. 9(4): 511-529 (1996) |
| 1994 |
|---|
| 10 | | Yinan N. Shen,
Hannu Kari,
S. S. Kim,
Fabrizio Lombardi:
Scheduling Policies for Fault Tolerance in a VLSI Processor.
DFT 1994: 1-9 |
| 9 | | D. Schin,
Yinan N. Shen,
Fabrizio Lombardi:
An Approach for UIO Generation for FSM Verification and Validation.
ISCAS 1994: 303-306 |
| 1992 |
|---|
| 8 | | X. Sun,
Yinan N. Shen,
Fabrizio Lombardi:
On the Verification and Validation of Protocols with High Fault Coverage Using UIO Sequences.
SRDS 1992: 196-203 |
| 1991 |
|---|
| 7 | | X. Sun,
Yinan N. Shen,
Fabrizio Lombardi,
Donatella Sciuto:
Protocol Conformance Testing by Discriminating UIO Sequences.
PSTV 1991: 349-364 |
| 1990 |
|---|
| 6 | EE | Yinan N. Shen,
Fabrizio Lombardi,
Donatella Sciuto:
Evaluation and improvement of fault coverage for verification and validation of protocols.
SPDP 1990: 200-207 |
| 5 | EE | Fabrizio Lombardi,
Yinan N. Shen,
Jon C. Muzio:
On the testability of array structures for FFT computation.
SPDP 1990: 519-522 |
| 4 | EE | Wei-Kang Huang,
Yinan N. Shen,
Fabrizio Lombardi:
New approaches for the repairs of memories with redundancy by row/column deletion for yield enhancement.
IEEE Trans. on CAD of Integrated Circuits and Systems 9(3): 323-328 (1990) |
| 3 | EE | Yinan N. Shen,
Fabrizio Lombardi:
Yield enhancement and manufacturing throughput of redundant memories by repairability/unrepairability detection.
J. Electronic Testing 1(1): 43-57 (1990) |
| 1989 |
|---|
| 2 | | Yinan N. Shen,
Fabrizio Lombardi:
Location and Identification for Single and Multiple Faults in Testable Redundant PLAs for Yield Enhancement.
ITC 1989: 670-678 |
| 1 | | Yinan N. Shen,
Fabrizio Lombardi,
Anton T. Dahbura:
Protocol Conformance Testing Using Multiple UIO Sequences.
PSTV 1989: 131-143 |
