1997 |
14 | EE | Yinan N. Shen,
Xiao-Tao Chen,
Susumu Horiguchi,
Fabrizio Lombardi:
On the multiple fault diagnosis of multistage interconnection networks: the lower bound and the CMOS fault model.
ICPP 1997: 350- |
1996 |
13 | EE | Yinan N. Shen,
Nohpill Park,
Fabrizio Lombardi:
Space Cutting Approaches for Repairing Memories.
ICCD 1996: 106-111 |
12 | | José Salinas,
Yinan N. Shen,
Fabrizio Lombardi:
A Sweeping Line Approach to Interconnect Testing.
IEEE Trans. Computers 45(8): 917-929 (1996) |
11 | EE | Yinan N. Shen,
Fabrizio Lombardi:
Graph Algorithms for Conformance Testing Using the Rural ChinesePostman Tour.
SIAM J. Discrete Math. 9(4): 511-529 (1996) |
1994 |
10 | | Yinan N. Shen,
Hannu Kari,
S. S. Kim,
Fabrizio Lombardi:
Scheduling Policies for Fault Tolerance in a VLSI Processor.
DFT 1994: 1-9 |
9 | | D. Schin,
Yinan N. Shen,
Fabrizio Lombardi:
An Approach for UIO Generation for FSM Verification and Validation.
ISCAS 1994: 303-306 |
1992 |
8 | | X. Sun,
Yinan N. Shen,
Fabrizio Lombardi:
On the Verification and Validation of Protocols with High Fault Coverage Using UIO Sequences.
SRDS 1992: 196-203 |
1991 |
7 | | X. Sun,
Yinan N. Shen,
Fabrizio Lombardi,
Donatella Sciuto:
Protocol Conformance Testing by Discriminating UIO Sequences.
PSTV 1991: 349-364 |
1990 |
6 | EE | Yinan N. Shen,
Fabrizio Lombardi,
Donatella Sciuto:
Evaluation and improvement of fault coverage for verification and validation of protocols.
SPDP 1990: 200-207 |
5 | EE | Fabrizio Lombardi,
Yinan N. Shen,
Jon C. Muzio:
On the testability of array structures for FFT computation.
SPDP 1990: 519-522 |
4 | EE | Wei-Kang Huang,
Yinan N. Shen,
Fabrizio Lombardi:
New approaches for the repairs of memories with redundancy by row/column deletion for yield enhancement.
IEEE Trans. on CAD of Integrated Circuits and Systems 9(3): 323-328 (1990) |
3 | EE | Yinan N. Shen,
Fabrizio Lombardi:
Yield enhancement and manufacturing throughput of redundant memories by repairability/unrepairability detection.
J. Electronic Testing 1(1): 43-57 (1990) |
1989 |
2 | | Yinan N. Shen,
Fabrizio Lombardi:
Location and Identification for Single and Multiple Faults in Testable Redundant PLAs for Yield Enhancement.
ITC 1989: 670-678 |
1 | | Yinan N. Shen,
Fabrizio Lombardi,
Anton T. Dahbura:
Protocol Conformance Testing Using Multiple UIO Sequences.
PSTV 1989: 131-143 |