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ITC 1991: Nashville, TN, USA

Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991. IEEE Computer Society 1991, ISBN 0-8186-9156-5 BibTeX
  title     = {Proceedings IEEE International Test Conference 1991, Test: Faster,
               Better, Sooner, Nashville, TN, USA, October 26-30, 1991},
  booktitle = {ITC},
  publisher = {IEEE Computer Society},
  year      = {1991},
  isbn      = {0-8186-9156-5},
  bibsource = {DBLP, http://dblp.uni-trier.de}

Session 1: Plenary

Keynote Address

Session 2: Practical BIST Implementation Case Studies

Session 3: Sequential ATPG

Session 4: Boundary Scan: Test and Diagnostics of the Infrastructure

Session 5: Case Studies in VLSI Chip Testing

Session 6: DFT: New Algorithms for Automation Tools

Session 7: Test Generation and Compaction

Session 8: Using Test Results for Process Improvement

Session 9: Contactless Probing

Session 10: DFT: Advanced Design and Analysis Techniques

Session 11: Physical Defects and Analysis 1

Session 12: Computer Assisted Diagnosis and Repair

Session 13: Specialized Quality Topics

Session 14: Scan Design: Innovations and Enhancements

Session 15: Delay Faults and Bridging Faults

Session 16: ATE Architecture and Methods

Session 17: Statistics and Test - Working Together

Session 18: BIST Issues in Logic Synthesis

Session 19: Physical Defects and Analysis 2

Session 20: Diagnosis and Repair of Complex Custom Circuits

Session 21: Test Techniques as Applied to Memory Devices

Session 22: Mixed Signal Test Generation Based on Fault Modeling

Session 23: CAE for IDDq Testing

Session 24: Board Test: The Future Is Arriving

Session 25: Algorithms and Fault Modeling for Testing Memory Devices

Session 26: Test Pattern Generation Issues in BIST

Session 27: Hierarchical Test Generation

Session 28: System Testing

Session 29: ATE Implementation and Application

Session 30: Response Compaction Issues in BIST

Session 31: Testing a Higher Level of Integration

Session 32: Boundary Scan - Dealing with Chip Implementation

Session 33: Synthesis for Test

Session 34: Concurrent BIST Design and Verification

Session 35: Fast Fault Simulation and Multiple Faults

Session 36: AC Test Calibration and Accuracy

Session 37: Software Techniques Improve Use of Test Resources 1

Session 38: DFT Applications and Experience

Session 39: Innovations in Mixed Signal Test Equipment

Session 40: A Potpourri of Test

Session 41: Software Techniques Improve Use of Test Resources 2

Panel 1: Open Meeting: Languages to Support Boundary-Scan Test

Panel 2: Software Testing - State of the Practice

Panel 4: Acceptance Barriers Confronting DFT and BIST

Panel 5: Is Burn-In Burned Out?

Panel 6: Quality in Test Education?

International Test Conference 1990 Best Paper

Copyright © Sat May 16 23:26:41 2009 by Michael Ley (ley@uni-trier.de)