| 2003 |
|---|
| 6 | EE | Kee Sup Kim,
Subhasish Mitra,
Paul G. Ryan:
Delay Defect Characteristics and Testing Strategies.
IEEE Design & Test of Computers 20(5): 8-16 (2003) |
| 1998 |
|---|
| 5 | EE | Paul G. Ryan,
W. Kent Fuchs:
Dynamic fault dictionaries and two-stage fault isolation.
IEEE Trans. VLSI Syst. 6(1): 176-180 (1998) |
| 1997 |
|---|
| 4 | | Paul G. Ryan:
Logical Diagnosis Solutions Must Drive Yield Improvement.
ITC 1997: 434 |
| 1993 |
|---|
| 3 | EE | Paul G. Ryan,
W. Kent Fuchs,
Irith Pomeranz:
Fault dictionary compression and equivalence class computation for sequential circuits.
ICCAD 1993: 508-511 |
| 1991 |
|---|
| 2 | | Paul G. Ryan,
Shishpal Rawat,
W. Kent Fuchs:
Two-Stage Fault Location.
ITC 1991: 963-968 |
| 1990 |
|---|
| 1 | | Paul G. Ryan,
W. Kent Fuchs:
Partial Detectability Profiles.
ICCAD 1990: 372-375 |
