| |
| 2003 | ||
|---|---|---|
| 6 | EE | Kee Sup Kim, Subhasish Mitra, Paul G. Ryan: Delay Defect Characteristics and Testing Strategies. IEEE Design & Test of Computers 20(5): 8-16 (2003) |
| 1998 | ||
| 5 | EE | Paul G. Ryan, W. Kent Fuchs: Dynamic fault dictionaries and two-stage fault isolation. IEEE Trans. VLSI Syst. 6(1): 176-180 (1998) |
| 1997 | ||
| 4 | Paul G. Ryan: Logical Diagnosis Solutions Must Drive Yield Improvement. ITC 1997: 434 | |
| 1993 | ||
| 3 | EE | Paul G. Ryan, W. Kent Fuchs, Irith Pomeranz: Fault dictionary compression and equivalence class computation for sequential circuits. ICCAD 1993: 508-511 |
| 1991 | ||
| 2 | Paul G. Ryan, Shishpal Rawat, W. Kent Fuchs: Two-Stage Fault Location. ITC 1991: 963-968 | |
| 1990 | ||
| 1 | Paul G. Ryan, W. Kent Fuchs: Partial Detectability Profiles. ICCAD 1990: 372-375 | |
| 1 | W. Kent Fuchs | [1] [2] [3] [5] |
| 2 | Kee Sup Kim | [6] |
| 3 | Subhasish Mitra | [6] |
| 4 | Irith Pomeranz | [3] |
| 5 | Shishpal Rawat | [2] |