| 2003 |
|---|
| 19 | EE | Lee Whetsel:
Adapting JTAG for AC Interconnect Testing.
ITC 2003: 641-650 |
| 18 | EE | Rakesh N. Joshi,
Kenneth L. Williams,
Lee Whetsel:
Evolution of IEEE 1149.1 Addressable Shadow Protocol Devices.
ITC 2003: 981-987 |
| 17 | EE | Francisco DaSilva,
Yervant Zorian,
Lee Whetsel,
Karim Arabi,
Rohit Kapur:
Overview of the IEEE P1500 Standard.
ITC 2003: 988-997 |
| 2002 |
|---|
| 16 | EE | Lee Whetsel:
Inevitable Use of TAP Domains in SOCs.
ITC 2002: 1191 |
| 2001 |
|---|
| 15 | | Jayashree Saxena,
Kenneth M. Butler,
Lee Whetsel:
An analysis of power reduction techniques in scan testing.
ITC 2001: 670-677 |
| 2000 |
|---|
| 14 | | Lee Whetsel:
Adapting scan architectures for low power operation.
ITC 2000: 863-872 |
| 1999 |
|---|
| 13 | | Lee Whetsel:
Addressable test ports an approach to testing embedded cores.
ITC 1999: 1055-1064 |
| 12 | | Yervant Zorian,
Erik Jan Marinissen,
Rohit Kapur,
Tony Taylor,
Lee Whetsel:
Towards a standard for embedded core test: an example.
ITC 1999: 616-627 |
| 1998 |
|---|
| 11 | EE | Lee Whetsel:
Core test connectivity, communication, and control.
ITC 1998: 303-312 |
| 1997 |
|---|
| 10 | | Lee Whetsel:
Test Access of TAP'ed & Non-TAP'ed Cores.
ITC 1997: 1041 |
| 9 | | Lee Whetsel:
An IEEE 1149.1-Based Test Access Architecture for ICs with Embedded Cores.
ITC 1997: 69-78 |
| 8 | | Lee Whetsel:
A silicon El Niño?
IEEE Design & Test of Computers 14(4): 112- (1997) |
| 1996 |
|---|
| 7 | | Lee Whetsel:
Proposal to Simplify Development of a Mixed-Signal Test Standard.
ITC 1996: 400-409 |
| 1995 |
|---|
| 6 | | Lee Whetsel:
Improved Boundary Scan Design.
ITC 1995: 851-860 |
| 1994 |
|---|
| 5 | | Lee Whetsel:
Navigating Test Access in Systems.
ITC 1994: 1018 |
| 4 | | Lee Whetsel:
An Approach to Accelerate Scan Testing in IEEE 1149.1 Architectures.
ITC 1994: 314-322 |
| 1993 |
|---|
| 3 | | Lee Whetsel:
Hierarchically Accessing 1149.1 Applications in a System Environment.
ITC 1993: 517-526 |
| 1992 |
|---|
| 2 | | Lee Whetsel:
A Proposed Method of Accessing 1149.1 in a Backplane Environment.
ITC 1992: 206-216 |
| 1991 |
|---|
| 1 | | Lee Whetsel:
An IEEE 1149.1 Based Logic/Signature Analyzer in a Chip.
ITC 1991: 869-878 |
