Myron Miske
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1991
1
Thomas M. Storey
,
Wojciech Maly
,
John Andrews
, Myron Miske: Stuck Fault and Current Testing Comparison Using CMOS Chip Test.
ITC 1991
: 311-318
Coauthor
Index
1
John Andrews
[
1
]
2
Wojciech Maly
[
1
]
3
Thomas M. Storey
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
